Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
199 words
A processed semiconductor wafer, comprising: a semiconductor wafer having first and second integrated circuit devices formed on a first surface of the wafer; a first plurality of contact pads associated with the first integrated circuit device and a second plurality of contact pads associated with the second integrated circuit device; a plurality of wire leads coupled between the first and second pluralities of contact pads; a covering of encapsulating material substantially covering at least the first and second integrated circuit devices, covering the first and second pluralities of contact pads, and covering the wire leads coupled between the first and second integrated circuit devices; and a scribe line between the first plurality of contact pads and the second plurality of contact pads, the scribe line extending orthogonally to the wire leads and defining a boundary along which the first integrated circuit device and the second integrated circuit device are to be separated, whereby, upon separation of the first and second integrated circuit devices, each of the first and second integrated circuit devices includes a plurality of exposed ends of wire leads for electrical contact along only an edge surface, the exposed ends being substantially flush with the edge surface.
Claim 2
Dependent Claim
199 words
A processed semiconductor wafer, comprising: a semiconductor wafer having first and second integrated circuit devices formed on a first surface of the wafer; a first plurality of contact pads associated with the first integrated circuit device and a second plurality of contact pads associated with the second integrated circuit device; a plurality of wire leads coupled between the first and second pluralities of contact pads; a covering of encapsulating material substantially covering at least the first and second integrated circuit devices, covering the first and second pluralities of contact pads, and covering the wire leads coupled between the first and second integrated circuit devices; and a scribe line between the first plurality of contact pads and the second plurality of contact pads, the scribe line extending orthogonally to the wire leads and defining a boundary along which the first integrated circuit device and the second integrated circuit device are to be separated, whereby, upon separation of the first and second integrated circuit devices, each of the first and second integrated circuit devices includes a plurality of exposed ends of wire leads for electrical contact along only an edge surface, the exposed ends being substantially flush with the edge surface.
Claim 3
Dependent Claim
23 words
The wafer of claim 1 , wherein the covering of encapsulating material is deposited on at least two surfaces of the semiconductor wafer.
Claim 4
Dependent Claim
44 words
The wafer of claim 1 , further comprising: at least four integrated circuit devices formed on the first surface of the semiconductor wafer; and additional pluralities of wire leads, each additional plurality of wire leads being coupled between pairs of the integrated circuit devices.
Claim 5
Dependent Claim
26 words
The wafer of claim 3 , wherein the covering of encapsulating material substantially covers all pairs of the integrated circuit devices having wire leads coupled thereto.
Claim 6
Dependent Claim
67 words
The processed semiconductor wafer of claim 1 , wherein the first plurality of contact pads are located proximate a first edge of the first integrated circuit device, said first edge being proximate the second integrated circuit device, and wherein the second plurality of contacts pads are located proximate a second edge of the second integrated circuit device, said second edge being proximate the first integrated circuit device.