US5849637A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Integration of spin-on gap filling dielectric with W-plug without outgassing
Assignee: Winbond Electronics Corp
•
Filing: 1996-06-10
•
Granted: 1998-12-15
•
Expires: 2016-06-10
Abstract
Abstract A via hole for a metal contact is formed by depositing a metal layer on the surface of a semiconductor device structure; depositing a thick PECVD oxide on the metal layer; patterning the metal layer using photolithography and etching so that what remains after this step is patterned metal regions such as lines or pads, each of which metal regions is covered by a thick PECVD oxide; creating islands of PECVD oxide using a photolithography process on the patterned metal regions at locations where it is desired to form via holes, the remainder of the patterned metal regions being covered with a thin PECVD oxide under layer; depositing a spin-on planarization material, such as SOG or low K polymer resulting in only a thin layer of spin-on material on top of the islands; using a partial etchback, removing the SOG from the top of the islands; depositing a PECVD oxide capping layer and polishing the capping layer using CMP; and then forming the via holes in the PECVD islands. The result is a via hole whose side walls are covered with a high quality PECVD oxide. Thereafter, the via hole can be filled with a W-plug without a problem of outgassing from a spin-on material such as SOG or low K polymer.
Inventors
- 👤 Chin-Kun Wang
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 22:24
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/63; H10P14/6326; H10P14/6328; H10P14/6334; H10P14/6336; H10P14/68; H10P14/683; H10P95/00; H10P95/06; H10P95/062; H10P95/064; H10W; H10W20/00; H10W20/01; H10W20/071; H10W20/092; H10P14/6342
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
190 words
A method for forming a via hole in an integrated circuit structure comprising the steps of (a) forming a metal layer on a surface of said structure, (b) forming a first oxide layer on said metal layer, (c) patterning said first oxide layer and said metal layer, so as to form patterned metal regions covered by said first oxide, (d) etching said first oxide covering said metal regions, creating one or more islands of said first oxide, (e) forming a second oxide layer, wherein said second oxide layer is thinner than said first oxide layer, and wherein the portions of said structure not covered by said one or more islands is covered by said second oxide layer, (f) spinning onto said structure a gap filling planarization spun-on material, (g) partially etching back said spun-on material removing said spun-on material on top of said one or more islands, (h) forming an oxide capping layer on said structure, and (i) forming a via hole in each of said one or more islands, each of said one or more via holes having sidewalls formed by the first oxide of one of said islands.
Claim 2
Independent Claim
190 words
A method for forming a via hole in an integrated circuit structure comprising the steps of (a) forming a metal layer on a surface of said structure, (b) forming a first oxide layer on said metal layer, (c) patterning said first oxide layer and said metal layer, so as to form patterned metal regions covered by said first oxide, (d) etching said first oxide covering said metal regions, creating one or more islands of said first oxide, (e) forming a second oxide layer, wherein said second oxide layer is thinner than said first oxide layer, and wherein the portions of said structure not covered by said one or more islands is covered by said second oxide layer, (f) spinning onto said structure a gap filling planarization spun-on material, (g) partially etching back said spun-on material removing said spun-on material on top of said one or more islands, (h) forming an oxide capping layer on said structure, and (i) forming a via hole in each of said one or more islands, each of said one or more via holes having sidewalls formed by the first oxide of one of said islands.
Claim 3
Dependent Claim
12 words
The method of claim 1 wherein said spun-on material is spun-on-glass (SOG).
Claim 4
Dependent Claim
14 words
The method of claim 1 wherein said spun-on material is a low K polymer.
Claim 5
Dependent Claim
16 words
The method of claim 1 wherein said first oxide layer is formed using a PECVD process.
Claim 6
Dependent Claim
19 words
The method of claim 1 wherein said first oxide layer has a thickness in the range of 3000-5000 Angstroms.
Claim 7
Dependent Claim
22 words
The method of claim 1 wherein said capping layer is chemical-mechanical polished (CMP) prior to forming said one or more via holes.
Claim 8
Independent Claim
106 words
A method for forming a metal contact in an integrated circuit structure comprising the steps of (a) depositing a metal layer on the surface of the structures (b) forming an oxide layer on said metal layer, (c) patterning said oxide and metal layers such that oxide islands are formed on said metal layer, (d) spinning on a gap filling planarization spun-on material and partially etching back said spun-on material removing said spun-on material over said oxide islands, (e) forming an oxide capping layer on said structure, (f) forming via holes through said oxide islands, and (g) filling each of said via holes with a tungsten plug.
Claim 9
Independent Claim
106 words
A method for forming a metal contact in an integrated circuit structure comprising the steps of (a) depositing a metal layer on the surface of the structures (b) forming an oxide layer on said metal layer, (c) patterning said oxide and metal layers such that oxide islands are formed on said metal layer, (d) spinning on a gap filling planarization spun-on material and partially etching back said spun-on material removing said spun-on material over said oxide islands, (e) forming an oxide capping layer on said structure, (f) forming via holes through said oxide islands, and (g) filling each of said via holes with a tungsten plug.
Claim 10
Dependent Claim
28 words
The method of claim 7 wherein said filling step further comprises diffusing tungsten source gas into each of said via holes to form each of said tungsten plugs.
References Cited (Backward Citations)
US4095330A
Cited
US4708767A
Cited
US4705596A
Cited
US4676867A
Cited
US5084407A
Cited
US5298463A
Cited
US5437763A
Cited
US5302551A
Cited
US5378318A
Cited
US5312512A
Cited
US5496774A
Cited
US5399533A
Cited
US5449644A
Cited
US5449314A
Cited
US5459096A
Cited
US5663107A
Cited
US5496776A
Cited
US5654238A
Cited
US5631197A
Cited
US5665657A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2001-12-14 | 2002-06-15 | 2002-12-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2005-12-14 | 2006-06-15 | 2006-12-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2009-12-14 | 2010-06-15 | 2010-12-15 | $7700.00 | Window Closed / Lapsed |