Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
83 words
A method for planarizing both an active area and a dielectric area on a semiconductor wafer comprising: providing the semiconductor wafer with both a patterned dielectric that is on the semiconductor wafer with a patterned polysilicon layer that is on the patterned dielectric, thereby exposing portions of the semiconductor wafer; depositing a blanket layer of silicon over the patterned polysilicon layer and on the exposed semiconductor wafer; and planarizing the blanket layer of silicon by a chemical-mechanical means, thereby making a planarized surface.
Claim 2
Independent Claim
83 words
A method for planarizing both an active area and a dielectric area on a semiconductor wafer comprising: providing the semiconductor wafer with both a patterned dielectric that is on the semiconductor wafer with a patterned polysilicon layer that is on the patterned dielectric, thereby exposing portions of the semiconductor wafer; depositing a blanket layer of silicon over the patterned polysilicon layer and on the exposed semiconductor wafer; and planarizing the blanket layer of silicon by a chemical-mechanical means, thereby making a planarized surface.
Claim 3
Dependent Claim
43 words
The method of claim 1 further comprising stopping the chemical-mechanical means at a predetermined point above the dielectric and oxidizing a remaining amount of residual patterned polysilicon layer that is over the patterned dielectric and further removing the oxidized polysilicon by hydrofluoric acid.
Claim 4
Dependent Claim
14 words
The method of claim 1 further comprising making the patterned dielectric of silicon dioxide.
Claim 5
Dependent Claim
14 words
The method of claim 2 further comprising making the patterned dielectric of silicon nitride.
Claim 6
Dependent Claim
13 words
The method of claim 1 further comprising making the semiconductor wafer of silicon.
Claim 7
Dependent Claim
14 words
The method of claim 5 further comprising making the semiconductor wafer of gallium arsenide.
Claim 8
Dependent Claim
17 words
The method of claim 1 further comprising having the chemical-mechanical means be a semiconductor wafer polishing system.
Claim 9
Dependent Claim
17 words
The method of claim 1 further including making the patterned dielectric with sidewalls having a predetermined slope.
Claim 10
Independent Claim
128 words
A method for making both an active silicon region and a dielectric region self-aligned to a doped region comprising: providing a semiconductor substrate; providing a channel stop region on the semiconductor substrate; depositing a dielectric layer on the silicon substrate; depositing a polysilicon layer on the dielectric layer; patterning the polysilicon layer and the oxide layer, thereby exposing portions of the semiconductor substrate and creating islands of dielectric with polysilicon on top of the dielectric islands; depositing a blanket layer of epitaxial silicon on the patterned semiconductor substrate, wherein the epitaxial silicon is deposited and fills between the dielectric islands and also is deposited on the polysilicon layer; and removing the epitaxial silicon by a chemical-mechanical means that is on the polysilicon layer, thereby producing a planar surface.
Claim 11
Independent Claim
128 words
A method for making both an active silicon region and a dielectric region self-aligned to a doped region comprising: providing a semiconductor substrate; providing a channel stop region on the semiconductor substrate; depositing a dielectric layer on the silicon substrate; depositing a polysilicon layer on the dielectric layer; patterning the polysilicon layer and the oxide layer, thereby exposing portions of the semiconductor substrate and creating islands of dielectric with polysilicon on top of the dielectric islands; depositing a blanket layer of epitaxial silicon on the patterned semiconductor substrate, wherein the epitaxial silicon is deposited and fills between the dielectric islands and also is deposited on the polysilicon layer; and removing the epitaxial silicon by a chemical-mechanical means that is on the polysilicon layer, thereby producing a planar surface.