Semiconductor processing method of making electrical contact to a node

Claim 2

A semiconductor processing method of making electrical contact to a node comprising the following steps: forming an insulating layer relative to a substrate to which electrical connection is to be made; forming a contact opening in the insulating layer to the substrate; forming a layer of electrically conductive material to substantially fill the contact opening; the electrically conductive material being undesirably capable of absorbing oxygen, when exposed to an oxygen containing ambient, effective to render such material less electrically conductive; and providing the substrate with the provided layer of electrically conductive material within a reactor, injecting a gas into the reactor and generating a plasma from the gas against the material and exposing the material to the plasma to densify at least an outermost exposed portion of such material and render the layer of material less capable of absorbing oxygen when exposed to an oxygen containing ambient.

Claim 3

The semiconductor processing method of claim 1 wherein the electrically conductive material predominately comprises TiN.

Claim 4

The semiconductor processing method of claim 1 wherein the electrically conductive material comprises titanium, carbon, and nitrogen.

Claim 5

The semiconductor processing method of claim 1 wherein the electrically conductive material layer as-provided comprises carbon, the gas and plasma generated therefrom having a component which is effective when in an activated state to interact with a component of the conductive layer to remove carbon therefrom.

Claim 6

The semiconductor processing method of claim 1 wherein the electrically conductive material layer as-provided comprises hydrocarbon, the gas and plasma generated therefrom having a component which is effective when in an activated state to interact with a component of the conductive layer to remove hydrocarbon therefrom.

Claim 7

The semiconductor processing method of claim 1 wherein, the electrically conductive material predominately comprises TiN; and the electrically conductive material layer as-provided comprises carbon, the gas and plasma generated therefrom having a component which is effective when in an activated state to interact with a component of the conductive layer to remove carbon therefrom.

Claim 8

The semiconductor processing method of claim 1 wherein the plasma exposure densifies only an outer exposed 100 Angstroms to 500 Angstroms of the material.

Claim 9

The semiconductor processing method of claim 1 wherein the electrically conductive material comprises titanium and nitrogen, and wherein the gas comprises one or more gases selected from the group consisting of N 2 , Ar, H 2 , and NH 3 .

Claim 10

A semiconductor processing method of making electrical contact to a node comprising the following steps: forming an insulating layer relative to a substrate to which electrical connection is to be made; forming a contact opening in the insulating layer to the substrate; depositing a layer of electrically conductive material to a thickness effective for patterning of a conductive line over the insulating layer and within the contact opening to substantially fill the contact opening; the electrically conductive material being undesirably capable of absorbing oxygen, when exposed to an oxygen containing ambient; providing the substrate with the deposited layer of electrically conductive material within a reactor, injecting a gas into the reactor, generating a first plasma from the gas against the material, and exposing the material to the first plasma to densify at least an outermost exposed portion of such material and render the layer of material less capable of absorbing oxygen when exposed to an oxygen containing ambient; patterning the deposited layer into a conductive line which is in electrical connection with the material within the contact opening to expose sidewalls of the electrically conductive material above the insulating layer; and providing the substrate with the conductive line of the electrically conductive material within a reactor, injecting a gas into the reactor, generating a second plasma from the gas against the material of the line and exposing the line sidewall material to the second plasma to densify at least an outermost exposed portion of such sidewall material and render the sidewalls less capable of absorbing oxygen when exposed to an oxygen containing ambient.

Claim 11

A semiconductor processing method of making electrical contact to a node comprising the following steps: forming an insulating layer relative to a substrate to which electrical connection is to be made; forming a contact opening in the insulating layer to the substrate; depositing a layer of electrically conductive material to a thickness effective for patterning of a conductive line over the insulating layer and within the contact opening to substantially fill the contact opening; the electrically conductive material being undesirably capable of absorbing oxygen, when exposed to an oxygen containing ambient; providing the substrate with the deposited layer of electrically conductive material within a reactor, injecting a gas into the reactor, generating a first plasma from the gas against the material, and exposing the material to the first plasma to densify at least an outermost exposed portion of such material and render the layer of material less capable of absorbing oxygen when exposed to an oxygen containing ambient; patterning the deposited layer into a conductive line which is in electrical connection with the material within the contact opening to expose sidewalls of the electrically conductive material above the insulating layer; and providing the substrate with the conductive line of the electrically conductive material within a reactor, injecting a gas into the reactor, generating a second plasma from the gas against the material of the line and exposing the line sidewall material to the second plasma to densify at least an outermost exposed portion of such sidewall material and render the sidewalls less capable of absorbing oxygen when exposed to an oxygen containing ambient.

Claim 12

The semiconductor processing method of claim 9 wherein the electrically conductive material predominately comprises TiN.

Claim 13

The semiconductor processing method of claim 9 wherein the electrically conductive material comprises titanium, carbon, and nitrogen.

Claim 14

The semiconductor processing method of claim 9 wherein the electrically conductive material layer as-deposited comprises carbon, the gas and plasma generated therefrom in the first and second plasma exposures having a respective component which is effective when in an activated state to interact with a component of the deposited conductive layer to remove carbon therefrom.

Claim 15

The semiconductor processing method of claim 9 wherein the electrically conductive material layer as-provided comprises hydrocarbon, the gas and plasma generated therefrom having a component which is effective when in an activated state to interact with a component of the conductive layer to remove hydrocarbon therefrom.

Claim 16

The semiconductor processing method of claim 9 wherein, the electrically conductive material predominately comprises TiN; and the electrically conductive material layer as-deposited comprises carbon, the gas and plasma generated therefrom in the first an second plasma exposures having a respective component which is effective when in an activated state to interact with a component of the deposited conductive layer to remove carbon therefrom.

Claim 17

The semiconductor processing method of claim 9 wherein the first and second plasma exposures densifies only an outer exposed 100 Angstroms to 500 Angstroms of the material.

Claim 18

The semiconductor processing method of claim 9 wherein there is no intervening exposure of the conductive line to an oxygen containing ambient between the patterning step and the second plasma exposure.

Claim 19

The semiconductor processing method of claim 9 wherein the injected gases utilized in the first and the second plasma exposures constitute the same gas.

Claim 20

The semiconductor processing method of claim 9 wherein the electrically conductive material comprises titanium and nitrogen, and wherein the gas comprises one or more gases selected from the group consisting of N 2 , Ar, H 2 , and NH 3 .

Claim 21

A semiconductor processing method of making electrical contact to a node comprising the following steps: forming an insulating layer relative to a substrate to which electrical connection is to be made; forming a contact opening in the insulating layer to the substrate; depositing a layer of electrically conductive material over the insulating layer and within the contact opening to substantially fill the contact opening; the electrically conductive material being undesirably capable of absorbing oxygen when exposed to an oxygen containing ambient; providing the substrate with the deposited layer of electrically conductive material within a reactor, injecting a gas into the reactor and generating a first plasma from the gas against the material, and exposing the material to the first plasma to densify at least an outermost exposed portion of such material and render the layer of material less capable of absorbing oxygen when exposed to an oxygen containing ambient; after exposure to the first plasma, planarizing the conductive material layer to the insulating layer to define an isolated conductive plug of the conductive material within the contact opening; and providing the substrate with the isolated conductive plug within a reactor, injecting a gas into the reactor and generating a second plasma from the gas against an outermost exposed portion of the conductive plug, and exposing the outermost portion of the plug to the second plasma to densify at least said outermost exposed portion of the plug and render the plug material less capable of absorbing oxygen when exposed to an oxygen containing ambient.

Claim 22

A semiconductor processing method of making electrical contact to a node comprising the following steps: forming an insulating layer relative to a substrate to which electrical connection is to be made; forming a contact opening in the insulating layer to the substrate; depositing a layer of electrically conductive material over the insulating layer and within the contact opening to substantially fill the contact opening; the electrically conductive material being undesirably capable of absorbing oxygen when exposed to an oxygen containing ambient; providing the substrate with the deposited layer of electrically conductive material within a reactor, injecting a gas into the reactor and generating a first plasma from the gas against the material, and exposing the material to the first plasma to densify at least an outermost exposed portion of such material and render the layer of material less capable of absorbing oxygen when exposed to an oxygen containing ambient; after exposure to the first plasma, planarizing the conductive material layer to the insulating layer to define an isolated conductive plug of the conductive material within the contact opening; and providing the substrate with the isolated conductive plug within a reactor, injecting a gas into the reactor and generating a second plasma from the gas against an outermost exposed portion of the conductive plug, and exposing the outermost portion of the plug to the second plasma to densify at least said outermost exposed portion of the plug and render the plug material less capable of absorbing oxygen when exposed to an oxygen containing ambient.

Claim 23

The semiconductor processing method of claim 19 wherein the electrically conductive material predominately comprises TiN.

Claim 24

The semiconductor processing method of claim 19 wherein the electrically conductive material comprises titanium, carbon, and nitrogen.

Claim 25

The semiconductor processing method of claim 19 wherein the electrically conductive material layer as-deposited comprises carbon, the gas and plasma generated therefrom in the first and second plasma exposures having a respective component which is effective when in an activated state to interact with a component of the deposited conductive layer to remove carbon therefrom.

Claim 26

The semiconductor processing method of claim 19 wherein the electrically conductive material layer as-provided comprises hydrocarbon, the gas and plasma generated therefrom having a component which is effective when in an activated state to interact with a component of the conductive layer to remove hydrocarbon therefrom.

Claim 27

The semiconductor processing method of claim 19 wherein, the electrically conductive material predominately comprises TiN; and the electrically conductive material layer as-deposited comprises carbon, the gas and plasma generated therefrom in the first an second plasma exposures having a respective component which is effective when in an activated state to interact with a component of the deposited conductive layer to remove carbon therefrom.

Claim 28

The semiconductor processing method of claim 19 wherein the first and second plasma exposures densifies only an outer exposed 100 Angstroms to 500 Angstroms of the material.

Claim 29

The semiconductor processing method of claim 19 wherein the injected gases utilized in the first and the second plasma exposures constitute the same gas.

Claim 30

The semiconductor processing method of claim 19 comprising exposing the electrically conductive material to an oxygen containing ambient between the first and second plasma exposures.

Claim 31

The semiconductor processing method of claim 19 wherein there is no intervening exposure of the electrically conductive material to an oxygen containing ambient between the planarize etching step and the second plasma exposure.

Claim 32

The semiconductor processing method of claim 19 comprising exposing the electrically conductive material to an oxygen containing ambient between the first and second plasma exposures, and wherein there is no intervening exposure of the electrically conductive material to an oxygen containing ambient between the planarize etching step and the second plasma exposure.

Claim 33

The semiconductor processing method of claim 19 wherein the electrically conductive material comprises titanium and nitrogen, and wherein the gas comprises one or more gases selected from the group consisting of N 2 , Ar, H 2 , and NH 3 .

Claim 34

A semiconductor processing method of making electrical contact to a node comprising the following steps: forming an insulating layer relative to a substrate to which electrical connection is to be made; forming a contact opening in the insulating layer to substrate; depositing a layer of electrically conductive material over the insulating layer and within the contact opening to substantially fill the contact opening; the electrically conductive material being undesirably capable of absorbing oxygen when exposed to an oxygen containing ambient; planarizing the conductive material layer to the insulating layer to define an isolated conductive plug of the conductive material within the contact opening; and providing the substrate with the isolated conductive plug within a reactor, injecting a gas into the reactor and generating a plasma from the gas against an outermost exposed portion of the conductive plug, and exposing the outermost portion of the plug to the plasma to densify at least said outermost exposed portion of the plug and render the plug material less capable of absorbing oxygen when exposed to an oxygen containing ambient.

Claim 35

A semiconductor processing method of making electrical contact to a node comprising the following steps: forming an insulating layer relative to a substrate to which electrical connection is to be made; forming a contact opening in the insulating layer to substrate; depositing a layer of electrically conductive material over the insulating layer and within the contact opening to substantially fill the contact opening; the electrically conductive material being undesirably capable of absorbing oxygen when exposed to an oxygen containing ambient; planarizing the conductive material layer to the insulating layer to define an isolated conductive plug of the conductive material within the contact opening; and providing the substrate with the isolated conductive plug within a reactor, injecting a gas into the reactor and generating a plasma from the gas against an outermost exposed portion of the conductive plug, and exposing the outermost portion of the plug to the plasma to densify at least said outermost exposed portion of the plug and render the plug material less capable of absorbing oxygen when exposed to an oxygen containing ambient.

Claim 36

The semiconductor processing method of claim 31 wherein the electrically conductive material predominately comprises TiN.

Claim 37

The semiconductor processing method of claim 31 wherein the electrically conductive material comprises titanium, carbon, and nitrogen.

Claim 38

The semiconductor processing method of claim 31 wherein the electrically conductive material layer as-deposited comprises carbon, the gas and plasma generated therefrom having a component which is effective when in an activated state to interact with a component of the deposited conductive layer to remove carbon therefrom.

Claim 39

The semiconductor processing method of claim 31 wherein the electrically conductive material layer as-provided comprises hydrocarbon, the gas and plasma generated therefrom having a component which is effective when in an activated state to interact with a component of the conductive layer to remove hydrocarbon therefrom.

Claim 40

The semiconductor processing method of claim 31 wherein, the electrically conductive material predominately comprises TiN; and the electrically conductive material layer as-deposited comprises carbon, the gas and plasma generated therefrom having a component which is effective when in an activated state to interact with a component of the deposited conductive layer to remove carbon therefrom.

Claim 41

The semiconductor processing method of claim 31 wherein the plasma exposure densities only an outer exposed 100 Angstroms to 500 Angstroms of the material.

Claim 42

The semiconductor processing method of claim 31 wherein there is no exposure of the electrically conductive material to a plasma environment prior to provision of the isolated electrically conductive plug.

Claim 43

The semiconductor processing method of claim 31 wherein the electrically conductive material comprises titanium and nitrogen, and wherein the gas comprises one or more gases selected from the group consisting of N 2 , Ar, H 2 , and NH 3 .