US5651855A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of making self aligned contacts to silicon substrates during the manufacture of integrated circuits
Assignee: Round Rock Research LLC
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Filing: 1996-04-01
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Granted: 1997-07-29
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Expires: 2016-04-01
Abstract
Abstract A process for forming vertical contacts in the manufacture of integrated circuits, and devices so manufactured. The process eliminates the need for precise mask alignment and allows the etch of the contact hole to be controlled independent of the etch of the interconnect trough. The process includes the steps of: forming an insulating layer on the surface of a substrate; forming an etch stop layer on the surface of the insulating layer; forming an opening in the etch stop layer; etching to a first depth through the opening in the etch stop layer and into the insulating layer to form an interconnect trough; forming a photoresist mask on the surface of the etch stop layer and in the trough; and continuing to etch through the insulating layer until reaching the surface of the substrate to form a contact hole. The above process may be repeated one or more times during the formation of multi-level metal integrated circuits.
Inventors
- 👤 Charles H. Dennison
- 👤 Trung T. Doan
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 22:58
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/73; H10W; H10W20/00; H10W20/01; H10W20/071; H10W20/081; H10W20/084; H10W20/085; H10W20/074; Y; Y10; Y10S; Y10S438/00; Y10S438/942; Y10S438/948; Y10S438/95; Y10S438/97
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
184 words
A process for forming electrical contacts for integrated circuits, comprising the steps of: a. forming an insulating layer on a substrate; b. forming an etch stop layer on the insulating layer, the etch stop layer being selectively etchable with respect to the insulating layer; c. forming a first mask on the etch stop layer; d. selectively removing the first mask to expose portions of the etch stop layer at locations of desired trough patterns; e. etching the exposed portions of the etch stop layer to expose portions of the insulating layer; f. etching the exposed portions of the insulating layer to a first depth to form a trough; g. removing the first mask after the trough is etched and before the second mask is formed to pattern the contact hole; h. forming a second mask over the trough; i. selectively removing the second mask to re-expose portions of the insulating layer within the trough at locations of desired contact hole patterns; j. etching the re-exposed portions of the insulating layer to the substrate to form a contact hole; and k. removing the second mask.
Claim 2
Dependent Claim
184 words
A process for forming electrical contacts for integrated circuits, comprising the steps of: a. forming an insulating layer on a substrate; b. forming an etch stop layer on the insulating layer, the etch stop layer being selectively etchable with respect to the insulating layer; c. forming a first mask on the etch stop layer; d. selectively removing the first mask to expose portions of the etch stop layer at locations of desired trough patterns; e. etching the exposed portions of the etch stop layer to expose portions of the insulating layer; f. etching the exposed portions of the insulating layer to a first depth to form a trough; g. removing the first mask after the trough is etched and before the second mask is formed to pattern the contact hole; h. forming a second mask over the trough; i. selectively removing the second mask to re-expose portions of the insulating layer within the trough at locations of desired contact hole patterns; j. etching the re-exposed portions of the insulating layer to the substrate to form a contact hole; and k. removing the second mask.
Claim 3
Dependent Claim
28 words
A process according to claim 1, wherein the etch stop layer comprises an inorganic compound selected from the group consisting of silicon nitride, titanium oxide and aluminum oxide.
Claim 4
Dependent Claim
28 words
A process according to claim 1, wherein the process steps are repeated through a plurality of first layers to form multi-level metal vias in a multi-level integrated circuit.
Claim 5
Dependent Claim
23 words
A process according to claim 1, further comprising the step of forming an adhesion layer on the surfaces of each hole and trough.
Claim 6
Dependent Claim
25 words
A process according to claim 1, further comprising the step of filling the contact hole and the trough at least partially with electrically conductive material.
Claim 7
Dependent Claim
32 words
A process according to claim 5, further comprising the step of filling the contact hole and the trough at least partially with electrically conductive material after the adhesion layer has been formed.
Claim 8
Dependent Claim
29 words
A process according to claim 6, further comprising the step of making an upper surface of the conductive material coplanar with an upper surface of the etch stop layer.
Claim 9
Dependent Claim
16 words
A process according to claim 6, further comprising the step of removing the etch stop layer.
Claim 10
Dependent Claim
28 words
A process according to claim 8, further comprising the step of making an upper surface of the conductive material coplanar with an upper surface of the insulating layer.
Claim 11
Dependent Claim
183 words
A process for forming electrical contacts for integrated circuits, comprising the steps of: a. forming a first layer of etchable material; b. forming an etch stop layer; c. forming an etch stop mask over the etch stop layer; d. selectively removing the etch stop mask to expose portions of the etch stop layer at a desired location of a trough; e. etching the exposed portions of the etch stop layer to form an opening in the etch stop layer, wherein the opening defines a width dimension of the trough and a contact hole; f. etching the first layer through the opening to a first depth to form a trough; g. removing the etch stop mask after the trough is etched and before a mask is formed to pattern the contact hole; h. forming a mask over the trough and the etch stop layer; i. selectively removing the mask to expose a portion of the first layer at a desired location of a contact hole; and j. etching the exposed portion of the first layer to a second depth to form the contact hole.
Claim 12
Dependent Claim
183 words
A process for forming electrical contacts for integrated circuits, comprising the steps of: a. forming a first layer of etchable material; b. forming an etch stop layer; c. forming an etch stop mask over the etch stop layer; d. selectively removing the etch stop mask to expose portions of the etch stop layer at a desired location of a trough; e. etching the exposed portions of the etch stop layer to form an opening in the etch stop layer, wherein the opening defines a width dimension of the trough and a contact hole; f. etching the first layer through the opening to a first depth to form a trough; g. removing the etch stop mask after the trough is etched and before a mask is formed to pattern the contact hole; h. forming a mask over the trough and the etch stop layer; i. selectively removing the mask to expose a portion of the first layer at a desired location of a contact hole; and j. etching the exposed portion of the first layer to a second depth to form the contact hole.
Claim 13
Dependent Claim
22 words
A process according to claim 10, wherein step (i) further comprises exposing a portion of the etch stop layer adjacent the opening.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2000-07-28 | 2001-01-27 | 2001-07-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-07-28 | 2005-01-27 | 2005-07-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-07-28 | 2009-01-27 | 2009-07-29 | $7700.00 | Window Closed / Lapsed |