US5629231A
Expired / Lapsed
US
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Method of manufacturing a semiconductor device with metallic precipitate
Assignee: Fujitsu Ltd
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Filing: 1996-06-11
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Granted: 1997-05-13
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Expires: 2016-06-11
Abstract
Abstract A superlattice of LT-GaAs layers and another semiconductor layers such as LT-AlGaAs or HT-GaAs is grown on a substrate. Lattice imperfectness such as strain or crystal defects is selectively introduced. Then, the superlattice is annealed to produce As precipitates at selected locations of the LT-GaAs layers. When strain is given by metal electrodes, anisotropic etching and self-alined metal deposition can be done utilizing these electrodes. Various semiconductor devices, particularly SET device can be manufactured utilizing those metallic precipitates.
Inventors
- 👤 Richard A. Kiehl
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 12:20
CPC Classifications
B; B82; B82Y; B82Y10/00; H; H10; H10D; H10D30/00; H10D30/40; H10D30/402; H10D62/00; H10D62/10; H10D62/17; H10D62/351; H10D62/357; H10D62/80; H10D62/81; H10D62/812; H10D62/814; H10D62/815; H10D62/8161; H10D62/8162; H10D62/8164; H10F; H10F77/00; H10F77/10; H10F77/14; Y; Y10; Y10S; Y10S438/00; Y10S438/938
Claims Analysis
Total Claims: 21
Claim 1
Independent Claim
104 words
A method of manufacturing a semiconductor device comprising the steps of: growing a compound semiconductor laminate on a semiconductor substrate, the laminate including a layer of first kind having non-stoichiometric composition and a property of producing metallic precipitates upon annealing at a sufficiently high temperature, and a pair of layers of second kind sandwiching the first kind; selectively affording at least one region having imperfectness of crystallinity in said first kind layer; and annealing said laminate at a sufficiently high temperature to produce a metallic precipitate in said first kind layer at a position defined by said at least one region having said imperfectness.
Claim 2
Independent Claim
104 words
A method of manufacturing a semiconductor device comprising the steps of: growing a compound semiconductor laminate on a semiconductor substrate, the laminate including a layer of first kind having non-stoichiometric composition and a property of producing metallic precipitates upon annealing at a sufficiently high temperature, and a pair of layers of second kind sandwiching the first kind; selectively affording at least one region having imperfectness of crystallinity in said first kind layer; and annealing said laminate at a sufficiently high temperature to produce a metallic precipitate in said first kind layer at a position defined by said at least one region having said imperfectness.
Claim 3
Dependent Claim
21 words
A method according to claim 1, wherein said step of affording crystal imperfectness includes establishing a strain field in said laminate.
Claim 4
Dependent Claim
20 words
A method according to claim 1, wherein said step of affording crystal imperfectness includes producing lattice defects in said laminate.
Claim 5
Dependent Claim
21 words
A method according to claim 3, wherein said step of producing lattice defects includes implanting electrons or ions into the laminate.
Claim 6
Dependent Claim
44 words
A method according to claim 1, wherein said step of affording crystal imperfectness includes forming on a surface of the substrate, a substrate feature which gives influence to and produces lattice imperfectness in the laminate grown thereon, before the step of growing the laminate.
Claim 7
Dependent Claim
15 words
A method according to claim 5, wherein said substrate feature produces strain to the laminate.
Claim 8
Dependent Claim
16 words
A method according to claim 5, wherein said substrate feature produces lattice defects in the laminate.
Claim 9
Dependent Claim
33 words
A method according to claim 1, wherein said step of growing the laminate includes the step of growing said first kind layer at such a low substrate temperature which produces the non-stoichiometric composition.
Claim 10
Dependent Claim
21 words
A method according to claim 8, wherein said step of growing the first kind layer is performed by molecular beam epitaxy.
Claim 11
Dependent Claim
17 words
A method according to claim 1, wherein said laminate includes a plurality of said first kind layers.
Claim 12
Dependent Claim
21 words
A method according to claim 10, wherein said laminate includes an alternating superlattice of first kind layers and second kind layers.
Claim 13
Dependent Claim
17 words
A method according to claim 11, wherein said superlattice includes laminate of GaAs layers and AlGaAs layers.
Claim 14
Dependent Claim
27 words
A method according to claim 11, wherein said superlattice includes laminate of GaAs layers grown at a low temperature and GaAs layers grown at a high temperature.
Claim 15
Dependent Claim
36 words
A method according to claim 10, further comprising the steps of: patterning the laminate by etching to form a mesa structure having a side surface; and forming a first electrode electrically coupled to the metallic precipitate.
Claim 16
Dependent Claim
34 words
A method according to claim 14, wherein said step of affording imperfectness includes forming a second electrode including stress on said laminate, and said patterning step utilizes the second electrode as an etch mask.
Claim 17
Dependent Claim
41 words
A method according to claim 15, wherein said laminate includes a conductive base layer, said layers of first and second kind are formed on said base layer, and said first electrode is formed on said base layer outside the mesa structure.
Claim 18
Dependent Claim
20 words
A method according to claim 16, wherein said patterning step exposes the conductive base layer adjacent to the mesa structure.
Claim 19
Dependent Claim
19 words
A method according to claim 17, further comprising the step of forming a dielectric layer on the mesa structure.
Claim 20
Dependent Claim
57 words
A method according to claim 18, further comprising the steps of: exposing the second electrode by patterning the dielectric layer; anisotropically depositing a third electrode layer on the mesa structure; and patterning the third electrode layer to leave an auxiliary electrode on said second electrode and a control electrode on a side surface of the mesa structure.
Claim 21
Dependent Claim
17 words
A method according to claim 17, wherein said patterning step includes undercut etching below the second electrode.
References Cited (Backward Citations)
US4751194A
Cited
US5079186A
Cited
US5238869A
Cited
US5066355A
Cited
US4933301A
Cited
US5180681A
Cited
US5225368A
Cited
US5281543A
Cited
US5532184A
Cited
US5412232A
Cited
US5354707A
Cited
US5489539A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2000-05-12 | 2000-11-11 | 2001-05-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-05-12 | 2004-11-11 | 2005-05-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-05-12 | 2008-11-11 | 2009-05-13 | $7700.00 | Window Closed / Lapsed |