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US5554567A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for improving adhesion to a spin-on-glass

Assignee: Taiwan Semiconductor Manufacturing Co TSMC Ltd
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Filing: 1994-09-01
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Granted: 1996-09-10
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Expires: 2014-09-01
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Abstract

Abstract A method is described for eliminating problems of adhesion, including peeling and blistering, between the surface of a cured spin- on-glass layer and a second deposited layer of a different material. After curing, and prior to the deposition of the second layer, the layer of spin-on-glass is subjected to a short heat treatment in vacuum. The second layer is then deposited without breaking the vacuum.

Inventors

  • 👤 Shih-Ming Wang

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 12:29
CPC Classifications
H; H10; H10P; H10P95/00

Claims Analysis

Total Claims: 14
Claim 1
Independent Claim 278 words
A method for planarizing the surface of an integrated circuit comprising: providing a layer of silicon dioxide on the surface of a silicon body; depositing a layer of a first conductive material onto said silicon dioxide surface; etching said layer of a first conductive material into a pattern; depositing a layer of a first insulating material onto said etched layer of conductive material; applying a siloxane solution to the surface of said integrated circuit such that all points on said surface lie below the surface of said siloxane solution; heating said integrated circuit so as to drive out all solvent from said siloxane solution; optionally applying a second layer of siloxane solution and then heating it to drive out the solvent; heating said integrated circuit in an oxygen atmosphere so as to cure said layer or layers of siloxane thereby converting them to a layer of cured spin-on-glass; providing a vacuum chamber and then baking said integrated circuit inside said vacuum chamber at a pressure less than about 3 torr for between 0.5 and 3 minutes; without allowing any increase in the pressure within said vacuum chamber, depositing a layer of a second insulating material onto the surface of said layer of cured spin-on-glass; etching via holes from the surface of said layer of a second insulating material down to the level of said first layer of conductive material; depositing a second layer of a conductive material onto the surface of said layer of a second insulating material so as to make contact with said first layer of conductive material wherever said via holes have been etched and; etching said second layer of conductive material into a pattern.
Claim 2
Independent Claim 278 words
A method for planarizing the surface of an integrated circuit comprising: providing a layer of silicon dioxide on the surface of a silicon body; depositing a layer of a first conductive material onto said silicon dioxide surface; etching said layer of a first conductive material into a pattern; depositing a layer of a first insulating material onto said etched layer of conductive material; applying a siloxane solution to the surface of said integrated circuit such that all points on said surface lie below the surface of said siloxane solution; heating said integrated circuit so as to drive out all solvent from said siloxane solution; optionally applying a second layer of siloxane solution and then heating it to drive out the solvent; heating said integrated circuit in an oxygen atmosphere so as to cure said layer or layers of siloxane thereby converting them to a layer of cured spin-on-glass; providing a vacuum chamber and then baking said integrated circuit inside said vacuum chamber at a pressure less than about 3 torr for between 0.5 and 3 minutes; without allowing any increase in the pressure within said vacuum chamber, depositing a layer of a second insulating material onto the surface of said layer of cured spin-on-glass; etching via holes from the surface of said layer of a second insulating material down to the level of said first layer of conductive material; depositing a second layer of a conductive material onto the surface of said layer of a second insulating material so as to make contact with said first layer of conductive material wherever said via holes have been etched and; etching said second layer of conductive material into a pattern.
Claim 3
Dependent Claim 23 words
The method of claim 1 where the temperature at which said cured spin-on-glass layer is baked is between 350° C. and 450° C.
Claim 4
Dependent Claim 21 words
The method of claim 1 where said layer of a second insulating material is deposited by means of chemical vapor deposition.
Claim 5
Dependent Claim 20 words
The method of claim 1 where said layer of a second insulating material is deposited by means of vacuum evaporation.
Claim 6
Dependent Claim 19 words
The method of claim 1 where said layer of a second insulating material is deposited by means of sputtering.
Claim 7
Independent Claim 77 words
A method for preparing the surface of a layer of cured spin-on-glass prior to the deposition of a layer of a different material, comprising: heating said cure spin-on-glass layer inside a vacuum chamber, in which the pressure is less than about 3 torr, for between 0.5 and 3 minutes and; depositing said layer of a different material onto the surface of said cured spin-on-glass layer without prior readmission of the surrounding atmosphere back into said vacuum chamber.
Claim 8
Independent Claim 77 words
A method for preparing the surface of a layer of cured spin-on-glass prior to the deposition of a layer of a different material, comprising: heating said cure spin-on-glass layer inside a vacuum chamber, in which the pressure is less than about 3 torr, for between 0.5 and 3 minutes and; depositing said layer of a different material onto the surface of said cured spin-on-glass layer without prior readmission of the surrounding atmosphere back into said vacuum chamber.
Claim 9
Dependent Claim 23 words
The method of claim 1 where the temperature at which said cured spin-on-glass layer is heated is between 350° C. and 450° C.
Claim 10
Dependent Claim 19 words
The method of claim 1 where said layer of a different material is comprised of an electrically insulating material.
Claim 11
Dependent Claim 19 words
The method of claim 1 where said layer of a different material is comprised of an electrically conductive material.
Claim 12
Dependent Claim 20 words
The method of claim 1 where said layer of a different material is deposited by means of chemical vapor deposition.
Claim 13
Dependent Claim 19 words
The method of claim 1 where said layer of a different material is deposited by means of vacuum evaporation.
Claim 14
Dependent Claim 18 words
The method of claim 1 where said layer of a different material is deposited by means of sputtering.

References Cited (Backward Citations)

US4986878A Cited
US5003062A Cited
US5364818A Cited
US5457073A Cited
US5447613A Cited
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US5334554A Cited
US5254497A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1999-09-10 2000-03-11 2000-09-10 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2003-09-10 2004-03-11 2004-09-10 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2007-09-10 2008-03-11 2008-09-10 $7700.00 Window Closed / Lapsed

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