Electrically programmable integrated memory with only one transistor

Claim 2

An integrated circuit memory comprising: one or more floating gate transistors, each having a source, a drain, a floating gate and a control gate, wherein said control gate only partly covers an upper surface of said floating gate, and wherein that part of said upper surface of said floating gate which is not covered by said control gate is covered by a semiconductor layer electrically connected to said drain in order to establish a high capacitive coupling between said drain and said floating gate.

Claim 3

The memory of claim 1, wherein said floating gate transistor has a capacitive coupling between said drain and said floating gate, which is approximately twice as high as the capacitive coupling between said source and said floating gate.

Claim 4

The memory of claim 1, wherein said floating gate transistor has means for establishing a capacitive coupling between said drain and said floating gate which is at least equal to the capacitive coupling between said control gate and said floating gate.

Claim 5

The memory of claim 1, wherein said floating gate is produced in a first polycrystalline silicon level and said control gate in a second polycrystalline silicon level, at least part of said semiconductor layer connected to said drain also constituting part of said second polycrystalline silicon level.

Claim 6

The memory of claim 1, wherein said floating gate transistors are organized in a matrix network form having rows and columns, said drains of all said floating gate transistors of each of said columns being joined and said gates of all said floating gate transistors of each of said rows being joined.

Claim 7

Memory according to claim 5, further comprising a means for programming said floating gate transistors by applying potentials to said floating gate and said drain, said means having a high impedance.

Claim 8

Memory according to claim 1, wherein said semiconductor layer electrically connected to said drain is shaped like a U having a base and a first and second branch, said first branch of said U being superimposed on said floating gate, said base of said U extending beyond said drain and beyond said floating gate, said second branch of said U being connected to said drain.

Claim 9

An integrated circuit memory, comprising: a body of monocrystalline semiconductor material, having a surface partly covered by a patterned field insulation layer in predetermined locations to provide active areas of a first conductivity type where said field isolation layer is absent; and first and second patterned thin film conductor layers, said first conductor layer being separated from said monocrystalline body, in said active areas, by a gate insulation layer, and said second conductor layer being separated from said first conductor layer by an interlevel insulation layer; said memory comprising a plurality of memory cells, each including, in a respective one of said active areas: a portion of said first conductor layer which is capacitively coupled to a channel region of said active area, and which is laterally isolated to define a floating gate; a source extension diffusion of a second conductivity type at the surface of said active region laterally adjacent to said channel region; a second-conductivity-type drain extension diffusion at the surface of said active region laterally adjacent to said channel region, and opposite to said source extension; and a second-conductivity-type drain diffusion which is continuous with and deeper and more heavily doped than said drain extension; a portion of said second conductor layer which overlies and is capacitively coupled to said floating gate, and which is laterally extended to define a control gate; and another portion of said second conductor layer which overlies and is capacitively coupled to said floating gate, and which is electrically connected to said drain to define a drain coupling element, and is otherwise isolated.

Claim 10

An integrated circuit memory, comprising: a body of monocrystalline semiconductor material, having a surface partly covered by a patterned field insulation layer in predetermined locations to provide active areas of a first conductivity type where said field isolation layer is absent; and first and second patterned thin film conductor layers, said first conductor layer being separated from said monocrystalline body, in said active areas, by a gate insulation layer, and said second conductor layer being separated from said first conductor layer by an interlevel insulation layer; said memory comprising a plurality of memory cells, each including, in a respective one of said active areas: a portion of said first conductor layer which is capacitively coupled to a channel region of said active area, and which is laterally isolated to define a floating gate; a source extension diffusion of a second conductivity type at the surface of said active region laterally adjacent to said channel region; a second-conductivity-type drain extension diffusion at the surface of said active region laterally adjacent to said channel region, and opposite to said source extension; and a second-conductivity-type drain diffusion which is continuous with and deeper and more heavily doped than said drain extension; a portion of said second conductor layer which overlies and is capacitively coupled to said floating gate, and which is laterally extended to define a control gate; and another portion of said second conductor layer which overlies and is capacitively coupled to said floating gate, and which is electrically connected to said drain to define a drain coupling element, and is otherwise isolated.

Claim 11

The integrated circuit of claim 8, further comprising an extended diffusion of said second conductivity type which makes contact to said source regions of a plurality of said cells in one row of an array of said cells.

Claim 12

The integrated circuit of claim 8, further comprising a third thin film conductor layer, overlying and insulated from said second conductor layer; said third conductor layer being connected to said drain regions of a plurality of said cells in one column of an array of said cells.

Claim 13

The integrated circuit of claim 8, wherein said first conductivity type is P-type, and said second conductivity type is N-type.

Claim 14

The integrated circuit of claim 8, wherein said semiconductor material consists essentially of silicon.

Claim 15

The integrated circuit of claim 8, wherein said first thin film conductor layer consists essentially of polycrystalline silicon.

Claim 16

The integrated circuit of claim 8, wherein said first and second thin film conductor layers consist essentially of polycrystalline silicon.

Claim 17

The integrated circuit of claim 8, wherein said gate insulator layer consists essentially of silicon dioxide.

Claim 18

An integrated circuit memory, comprising: a body of monocrystalline semiconductor material having exposed active areas of a first conductivity type at a surface thereof; and a plurality of memory cells, each including, in a respective one of said active areas: a portion of a first patterned thin film conductor layer which is capacitively coupled to a channel region of said active area through a respective portion of a gate insulation layer, and is laterally isolated to define a floating gate; a source diffusion of a second conductivity type in said active region laterally adjacent to said channel region; a second-conductivity-type drain extension diffusion in said active region laterally adjacent to said channel, and opposite to said source; and a second-conductivity-type drain diffusion which is continuous with and deeper and more heavily doped than said drain extension; a portion of a second thin film conductor layer which overlies and is capacitively coupled to said floating gate through an interlevel insulation layer, and which is laterally extended to define a control gate; and another portion of said second conductor layer which overlies and is capacitively coupled to said floating gate, and is laterally isolated from said control gate, and which is electrically connected to said drain to define a drain coupling element.

Claim 19

An integrated circuit memory, comprising: a body of monocrystalline semiconductor material having exposed active areas of a first conductivity type at a surface thereof; and a plurality of memory cells, each including, in a respective one of said active areas: a portion of a first patterned thin film conductor layer which is capacitively coupled to a channel region of said active area through a respective portion of a gate insulation layer, and is laterally isolated to define a floating gate; a source diffusion of a second conductivity type in said active region laterally adjacent to said channel region; a second-conductivity-type drain extension diffusion in said active region laterally adjacent to said channel, and opposite to said source; and a second-conductivity-type drain diffusion which is continuous with and deeper and more heavily doped than said drain extension; a portion of a second thin film conductor layer which overlies and is capacitively coupled to said floating gate through an interlevel insulation layer, and which is laterally extended to define a control gate; and another portion of said second conductor layer which overlies and is capacitively coupled to said floating gate, and is laterally isolated from said control gate, and which is electrically connected to said drain to define a drain coupling element.

Claim 20

The integrated circuit of claim 16, further comprising an extended diffusion of said second conductivity type which makes contact to said source regions of a plurality of said cells in one row of an array of said cells.

Claim 21

The integrated circuit of claim 16, further comprising a third thin film conductor layer, overlying and insulated from said second conductor layer; said third conductor layer being connected to said drain regions of a plurality of said cells in one column of an array of said cells.

Claim 22

The integrated circuit of claim 16, wherein said first conductivity type is P-type, and said second conductivity type is N-type.

Claim 23

The integrated circuit of claim 16, wherein said first and second thin film conductor layers consist essentially of polycrystalline silicon.

Claim 24

The integrated circuit of claim 16, wherein said gate insulator layer consists essentially of silicon dioxide.

Claim 25

An integrated circuit memory, comprising: a body of monocrystalline semiconductor material having exposed active areas of a first conductivity type at a surface thereof; and a plurality of rows and columns of memory cells, each said cell including, in a respective portion of said active areas: a portion of a first patterned thin film conductor layer which is capacitively coupled to a respective channel region of said active area, and is isolated to define a floating gate; a source extension diffusion of a second conductivity type in said active region laterally adjacent to said channel region, and a second-type source diffusion which is continuous with and deeper and more heavily doped than said source extension; a second-conductivity-type drain extension diffusion in said active region laterally adjacent to said channel region, and opposite to said source extension; and a second-conductivity-type drain diffusion which is continuous with and deeper and more heavily doped than said drain extension; a portion of a second thin film conductor layer which overlies and is insulated from and capacitively coupled to said floating gate, and which is laterally extended to define a control gate; another portion of said second conductor layer which overlies and is capacitively coupled to said floating gate, and is laterally isolated from said control gate, and which is electrically connected to said drain to define a drain coupling element; an extended diffusion of said second conductivity type which makes contact to said source regions of a plurality of said cells in one row of an array of said cells; and a third thin film conductor layer, overlying and insulated from said second conductor layer, and being connected to said drain regions of a plurality of said cells in one column of an array of said cells.

Claim 26

An integrated circuit memory, comprising: a body of monocrystalline semiconductor material having exposed active areas of a first conductivity type at a surface thereof; and a plurality of rows and columns of memory cells, each said cell including, in a respective portion of said active areas: a portion of a first patterned thin film conductor layer which is capacitively coupled to a respective channel region of said active area, and is isolated to define a floating gate; a source extension diffusion of a second conductivity type in said active region laterally adjacent to said channel region, and a second-type source diffusion which is continuous with and deeper and more heavily doped than said source extension; a second-conductivity-type drain extension diffusion in said active region laterally adjacent to said channel region, and opposite to said source extension; and a second-conductivity-type drain diffusion which is continuous with and deeper and more heavily doped than said drain extension; a portion of a second thin film conductor layer which overlies and is insulated from and capacitively coupled to said floating gate, and which is laterally extended to define a control gate; another portion of said second conductor layer which overlies and is capacitively coupled to said floating gate, and is laterally isolated from said control gate, and which is electrically connected to said drain to define a drain coupling element; an extended diffusion of said second conductivity type which makes contact to said source regions of a plurality of said cells in one row of an array of said cells; and a third thin film conductor layer, overlying and insulated from said second conductor layer, and being connected to said drain regions of a plurality of said cells in one column of an array of said cells.

Claim 27

The integrated circuit of claim 22, wherein said first conductivity type is P-type, and said second conductivity type is N-type.