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US5146307A Expired / Lapsed US ⏱️ 0.0 years remaining

Fuse having a dielectric layer between sloped insulator sidewalls

Assignee: Texas Instruments Inc
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Filing: 1991-05-15
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Granted: 1992-09-08
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Expires: 2011-05-15
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Abstract

Abstract A method for forming a fuse for integrated circuits and a fuse produced therefrom is disclosed. The fuse (10) includes a substrate (12) having thick oxide layers (14) with a gap (16) formed therebetween. A second oxide layer (20) is grown onto an N+ region (18). At the intersection between oxide layers (20, 14), a sublithographic area is exposed and a dielectric layer (24) is formed therein. This structure is capable of reducing the capacitance between a polysilicon layer (26) formed thereon and the N+ diffusion region (18).

Inventors

  • 👤 Cetin Kaya

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 23:38
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/63; H10P14/6302; H10P14/6322; H10P14/6304; H10P14/6306; H10P14/6308; H10P14/6309; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/064; H10W20/065; H10W20/40; H10W20/49; H10W20/493; H10W20/495

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 152 words
A fuse formed on a face of a semiconductor layer of a first conductivity type, comprising: a first insulator layer extending over said face, said first insulator layer having a first sloped sidewall; a region of a second conductivity type opposite said first conductivity type formed in said face adjacent said first sloped sidewall, said region having a dopant concentration which decreases as the thickness of said first insulator layer over said region increases; a second insulator layer extending over a portion of said region, said second insulator layer having a second sloped sidewall, said first and second sloped sidewalls spaced apart by a gap on said region, said second insulator layer having a thickness which increases as the dopant concentration of said region under said second insulator layer increases; a dielectric layer formed between said first and second sloped sidewalls and over said gap; and a conductor adjacent said dielectric layer.
Claim 2
Dependent Claim 152 words
A fuse formed on a face of a semiconductor layer of a first conductivity type, comprising: a first insulator layer extending over said face, said first insulator layer having a first sloped sidewall; a region of a second conductivity type opposite said first conductivity type formed in said face adjacent said first sloped sidewall, said region having a dopant concentration which decreases as the thickness of said first insulator layer over said region increases; a second insulator layer extending over a portion of said region, said second insulator layer having a second sloped sidewall, said first and second sloped sidewalls spaced apart by a gap on said region, said second insulator layer having a thickness which increases as the dopant concentration of said region under said second insulator layer increases; a dielectric layer formed between said first and second sloped sidewalls and over said gap; and a conductor adjacent said dielectric layer.
Claim 3
Dependent Claim 38 words
The fuse of claim 1 in which said dielectric layer includes: a first oxide layer formed on said gap; a nitride layer formed on said first oxide layer; and a second oxide layer formed on said nitride layer.
Claim 4
Dependent Claim 19 words
The fuse as recited in claim 1, wherein said first insulator layer has a thickness of approximately 8,000 angstroms.
Claim 5
Dependent Claim 16 words
The fuse of claim 1 in which said first and second insulator layers are oxide layers.
Claim 6
Dependent Claim 18 words
The fuse as recited in claim 1, wherein said dielectric layer has a thickness of approximately 125 angstroms.
Claim 7
Dependent Claim 17 words
The fuse of claim 1 in which said first and second insulator layers intersect adjacent said gap.

References Cited (Backward Citations)

US4502208A Cited
US4543594A Cited
US4598462A Cited
US4847732A Cited
US4635345A Cited
US4823181A Cited
US4876220A Cited
US5008721A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-09-08 1996-03-09 1996-09-08 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-09-08 2000-03-09 2000-09-08 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-09-08 2004-03-09 2004-09-08 $7700.00 Window Closed / Lapsed

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