US4635345A
Expired / Lapsed
US
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Method of making an intergrated vertical NPN and vertical oxide fuse programmable memory cell
Assignee: Harris Corp
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Filing: 1985-03-14
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Granted: 1987-01-13
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Expires: 2005-03-14
Abstract
Abstract A method of forming an aligned vertical oxide fuse and emitter using a single mask. The mask includes an opening through which impurities are introduced into the base region through a first layer of insulation and which is subsequently used to form the emitter aperture through the first insulative layer. The thin fuse oxide is formed by non-selective oxidation after removal of the mask. Alternatively, the impurities may also be introduced through the emitter aperture or from doped thin fuse oxide after removal of the mask. The resulting integrated circuit includes at least three regions of oxidation of three thicknesses, in descending order, field oxide, device opening or gate oxide and fuse oxide.
Inventors
- 👤 Kevin T. Hankins
- 👤 Mark W. Michael
- 👤 Brian K. Rosier
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 04:55
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/40; H10W20/49; H10W20/491; H10P; H10P76/00; H10P76/40; Y; Y10; Y10S; Y10S438/00; Y10S438/981
Claims Analysis
Total Claims: 25
Claim 1
Independent Claim
112 words
A method of forming a vertical fuse and PN junction comprising: forming a mask layer on a first insulative layer on a semiconductor substrate, said substrate having a first region of a first conductivity type; patterning said mask layer to form at least one opening above said first region; introducing impurities through said opening to form a second region of a second conductivity type in said first region; forming an aperture in said first insulative layer corresponding to said opening using said mask layer; removing said mask layer; oxidizing said substrate to form a thin oxide fuse region in said aperture; and forming a top electrode on said thin oxide fuse region.
Claim 2
Independent Claim
112 words
A method of forming a vertical fuse and PN junction comprising: forming a mask layer on a first insulative layer on a semiconductor substrate, said substrate having a first region of a first conductivity type; patterning said mask layer to form at least one opening above said first region; introducing impurities through said opening to form a second region of a second conductivity type in said first region; forming an aperture in said first insulative layer corresponding to said opening using said mask layer; removing said mask layer; oxidizing said substrate to form a thin oxide fuse region in said aperture; and forming a top electrode on said thin oxide fuse region.
Claim 3
Dependent Claim
15 words
A method according to claim 1, wherein said substrate is of said second conductivity type.
Claim 4
Dependent Claim
19 words
A method according to claim 1, wherein said impurities are introduced by ion implantation through said first insulative layer.
Claim 5
Dependent Claim
19 words
A method according to claim 1, wherein said substrate is oxidized by being exposed to a gaseous oxidizing atmosphere.
Claim 6
Independent Claim
163 words
A method of forming a vertical fuse and bipolar transistor comprising: forming a mask layer on a first insulative layer on a semiconductor substrate of a first conductivity type, said substrate having a first region of a second conductivity type; patterning said mask layer to form at least one opening above said first region; forming an aperture in said first insulative layer corresponding to said opening in said mask; removing said mask layer; oxidizing said substrate to form a thin oxide fuse region in said aperture; and forming a top electrode of polycrystalline material doped with impurities of said first conductivity type in said aperture; the thickness of the thin oxide fuse region and the doping level of said polycrystalline top contact are selected so as to rupture said thin oxide fuse region and diffuse impurities in said first region thereby forming a contact and second region in said first region upon application of a sufficient voltage across said thin oxide fuse region.
Claim 7
Independent Claim
163 words
A method of forming a vertical fuse and bipolar transistor comprising: forming a mask layer on a first insulative layer on a semiconductor substrate of a first conductivity type, said substrate having a first region of a second conductivity type; patterning said mask layer to form at least one opening above said first region; forming an aperture in said first insulative layer corresponding to said opening in said mask; removing said mask layer; oxidizing said substrate to form a thin oxide fuse region in said aperture; and forming a top electrode of polycrystalline material doped with impurities of said first conductivity type in said aperture; the thickness of the thin oxide fuse region and the doping level of said polycrystalline top contact are selected so as to rupture said thin oxide fuse region and diffuse impurities in said first region thereby forming a contact and second region in said first region upon application of a sufficient voltage across said thin oxide fuse region.
Claim 8
Dependent Claim
30 words
A method according to claim 5, wherein said first insulative layer is thick enough to form a mask so that impurities are introduced only throuqh said aperture during said diffusion.
Claim 9
Dependent Claim
19 words
A method according to claim 5, wherein said substrate is oxidized by being exposed to a gaseous oxidizing atmosphere.
Claim 10
Independent Claim
113 words
A method of forming a vertical fuse and PN junction comprising: forming a mask layer on a first insulative layer on a semiconductor substrate, said substrate having a first region of a first conductivity type; patterning said mask layer to form at least one opening above said first region; forming an aperture in said first insulative layer corresponding to said opening using said mask layer; removing said mask layer; oxidizing said substrate to form a thin oxide fuse region in said aperture; and forming a top electrode on said thin oxide fuse region of a metal which would form a rectifying contact with said first region after rupture of said thin oxide fuse.
Claim 11
Independent Claim
113 words
A method of forming a vertical fuse and PN junction comprising: forming a mask layer on a first insulative layer on a semiconductor substrate, said substrate having a first region of a first conductivity type; patterning said mask layer to form at least one opening above said first region; forming an aperture in said first insulative layer corresponding to said opening using said mask layer; removing said mask layer; oxidizing said substrate to form a thin oxide fuse region in said aperture; and forming a top electrode on said thin oxide fuse region of a metal which would form a rectifying contact with said first region after rupture of said thin oxide fuse.
Claim 12
Dependent Claim
18 words
A method according to claim 8, wherein said-substrate is oxidized by being exposed to a gaseous oxidizing atmosphere.
Claim 13
Independent Claim
137 words
A method of forming insulated gate field effect transistors, bipolar transistors and vertical fuses in an integrated circuit comprising: forming a plurality of device openings in a first insulative layer having a first thickness on a substrate in which insulated gate field effect transistors and bipolar transistors are to be formed; forming a second insulative layer in said device opening having a second thickness less than said first thickness; forming emitter apertures in said second insulative layer; forming a third insulative layer in said emitter apertures having a third thickness less than said second thickness; forming a top electrode on said third layer in said emitter aperture; said second layer being sufficiently thick compared to said third layer so that said third layer will rupture upon application of a sufficient voltage thereacross without effecting said second layer.
Claim 14
Independent Claim
137 words
A method of forming insulated gate field effect transistors, bipolar transistors and vertical fuses in an integrated circuit comprising: forming a plurality of device openings in a first insulative layer having a first thickness on a substrate in which insulated gate field effect transistors and bipolar transistors are to be formed; forming a second insulative layer in said device opening having a second thickness less than said first thickness; forming emitter apertures in said second insulative layer; forming a third insulative layer in said emitter apertures having a third thickness less than said second thickness; forming a top electrode on said third layer in said emitter aperture; said second layer being sufficiently thick compared to said third layer so that said third layer will rupture upon application of a sufficient voltage thereacross without effecting said second layer.
Claim 15
Dependent Claim
29 words
A method according to claim 10, wherein gates of said insulated gate field effect transistor are formed on said second layer simultaneously with the formation of said top electrode.
Claim 16
Dependent Claim
47 words
A method according to claim 10, including forming a mask on said second insulative layer having an emitter opening defining said emitter aperture, introducing impurities through said emitter opening to form an emitter region and using said mask to form said emitter apertures in said second layer.
Claim 17
Dependent Claim
41 words
A method according to claim 10, wherein said top contact is formed of a doped polycrystalline material having a doping level sufficient to form an emitter and contact by diffusing of impurities into said substrate after rupture of said third layer.
Claim 18
Dependent Claim
29 words
A method according to claim 10, wherein said top contact is formed of a metal which forms a rectifying contact with said substrate after rupture of said third layer.
Claim 19
Dependent Claim
29 words
A method according to claim 10, including forming a gate on said second layer in those device openings in which insulated gate field effect transistors are to be formed.
Claim 20
Independent Claim
121 words
A method of forming a vertical fuse and PN junction comprising: forming a mask layer on a first insulative layer on a semiconductor substrate, said substrate having a first region of a first conductivity type; patterning said mask layer to form at least one opening above said first region; forming an aperture in said first insulative layer corresponding to said opening using said mask layer; removing said mask layer; exposing said aperture to a gaseous atmosphere having an oxidizing agent and impurities of a second conductivity type to form a second region of a second conductivity type in said first region and a thin oxide fuse region in said aperture; and forming a top electrode on said thin oxide fuse region.
Claim 21
Independent Claim
121 words
A method of forming a vertical fuse and PN junction comprising: forming a mask layer on a first insulative layer on a semiconductor substrate, said substrate having a first region of a first conductivity type; patterning said mask layer to form at least one opening above said first region; forming an aperture in said first insulative layer corresponding to said opening using said mask layer; removing said mask layer; exposing said aperture to a gaseous atmosphere having an oxidizing agent and impurities of a second conductivity type to form a second region of a second conductivity type in said first region and a thin oxide fuse region in said aperture; and forming a top electrode on said thin oxide fuse region.
Claim 22
Dependent Claim
23 words
A method according to claim 16, wherein said thin oxide fuse is formed to have a depth smaller than said first insulative layer.
Claim 23
Independent Claim
125 words
A method of forming a vertical fuse and PN junction comprising: forming a mask layer on a first insulative layer on a semiconductor substrate, said substrate having a first region of a first conductivity type; patterning said mask layer to form at least one opening above said first region; forming an aperture in said first insulative layer corresponding to said opening using said mask layer; removing said mask layer; exposing said aperture to a gaseous atmosphere having impurities of a second conductivity type to form a second conductivity type region in said first region; non-selectively removing any material in said aperture; oxidizing said substrate to form a thin oxide fuse region in said aperture; and forming a top electrode on said thin oxide fuse region.
Claim 24
Independent Claim
125 words
A method of forming a vertical fuse and PN junction comprising: forming a mask layer on a first insulative layer on a semiconductor substrate, said substrate having a first region of a first conductivity type; patterning said mask layer to form at least one opening above said first region; forming an aperture in said first insulative layer corresponding to said opening using said mask layer; removing said mask layer; exposing said aperture to a gaseous atmosphere having impurities of a second conductivity type to form a second conductivity type region in said first region; non-selectively removing any material in said aperture; oxidizing said substrate to form a thin oxide fuse region in said aperture; and forming a top electrode on said thin oxide fuse region.
Claim 25
Dependent Claim
23 words
A method according to claim 18, wherein said thin oxide fuse is formed to have a depth smaller than said first insulative layer.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-01-12 | 1990-07-14 | 1991-01-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-01-12 | 1994-07-14 | 1995-01-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-01-12 | 1998-07-14 | 1999-01-13 | $7700.00 | Window Closed / Lapsed |