Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
174 words
A process for developing conductive interconnects between integrated circuit semiconductor devices formed on an insulating substrate comprising: forming a patterned layer of semiconductor material directly on the surface of said insulating substrate, said semiconductor material having a surface and also having an interface with said insulating substrate, said patterned layer comprising a first set of regions where at least one semiconductor device will be formed and a second set of regions where electrical interconnects to said at least one semiconductor device will be formed, said second set of regions extending through the entire region between said surface and said interface; forming said at least one semiconductor device; converting said second set of regions to a metallic compound of said semiconductor material; and further wherein: said at least one semiconductor device has at least two terminals comprised of said semiconductor material; and where at least a portion of at least one of said terminals is converted to said metallic compound of said semiconductor material substantially simultaneously with said conversion of said second set of regions.
Claim 2
Dependent Claim
174 words
A process for developing conductive interconnects between integrated circuit semiconductor devices formed on an insulating substrate comprising: forming a patterned layer of semiconductor material directly on the surface of said insulating substrate, said semiconductor material having a surface and also having an interface with said insulating substrate, said patterned layer comprising a first set of regions where at least one semiconductor device will be formed and a second set of regions where electrical interconnects to said at least one semiconductor device will be formed, said second set of regions extending through the entire region between said surface and said interface; forming said at least one semiconductor device; converting said second set of regions to a metallic compound of said semiconductor material; and further wherein: said at least one semiconductor device has at least two terminals comprised of said semiconductor material; and where at least a portion of at least one of said terminals is converted to said metallic compound of said semiconductor material substantially simultaneously with said conversion of said second set of regions.
Claim 3
Dependent Claim
13 words
The process of claim 1 wherein: said semiconductor material is single crystal silicon.
Claim 4
Dependent Claim
14 words
The process of claim 2 wherein: said step of converting comprises siliciding said silicon.
Claim 5
Dependent Claim
16 words
The process of claim 2 wherein: said step of converting comprises siliciding said single crystal silicon.
Claim 6
Dependent Claim
18 words
The process of claim 1 wherein said at least one semiconductor device comprises a plurality of semiconductor devices.
Claim 7
Dependent Claim
24 words
The process of claim 5 wherein said plurality of semiconductor devices are planar devices, all formed in substantially the same plane on said substrate.
Claim 8
Dependent Claim
26 words
The process of claim 1 wherein: each of said at least one semiconductor devices is selected from the group consisting of diodes, transistors, resistors and capacitors.
Claim 9
Dependent Claim
18 words
The process of claim 7 wherein each of said at least one semiconductor devices is a planar device.
Claim 10
Dependent Claim
36 words
The process of claim 1 wherein: said step of forming a patterned layer of semiconductor material comprises forming an improved layer of single crystal silicon on a sapphire insulating substrate using double solid phase epitaxy (DSPE).
Claim 11
Dependent Claim
16 words
The process of claim 1 wherein said at least one semiconductor device is a planar device.
Claim 12
Dependent Claim
32 words
The process of claim 1 wherein said step of forming said at least one semiconductor device includes the step of forming a sidewall spacer adjacent at least one of said two terminals.
Claim 13
Dependent Claim
49 words
The process of claim 11 wherein said two terminals comprise the source and drain terminals of a transistor and wherein said semiconductor device further comprises a gate terminal, and further wherein said sidewall spacer is formed so as to isolate said gate terminal from said source and drain terminals.