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US4855160A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for passivating wafer

Assignee: Texas Instruments Inc
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Filing: 1988-05-26
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Granted: 1989-08-08
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Expires: 2008-05-26
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Abstract

Abstract A high pressure processing apparatus and method which is compatible with a system wherein wafers are largely transported and processed under vacuum. The pressure vessel can be extremely small, i.e. has a total pressurized volume of which almost all interior points are within one or two centimeters of one of the workpiece or wafers which may be loaded into the chamber. HgCdTe is passivated by utilizing oxygen and water vapor for oxidation or a source of sulfur for sulfidization. The wafers and the gases are heated by a heater located on the vertical walls of the process chamber.

Inventors

  • 👤 Joseph D. Luttmer
  • 👤 Cecil J. Davis
  • 👤 Patricia B. Smith
  • 👤 Rudy L. York

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 18:16
CPC Classifications
H; H10; H10P; H10P72/00; H10P72/30; H10P72/36; H10P72/3604; H10P14/00; H10P14/60; H10P14/69; H10P14/692

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 49 words
A method for depositing a passivating layer on a mercury-cadmium-telluride wafer comprising: (a) disposing said wafer into a high pressure process chamber under low pressure; (b) heating said chamber; and (c) introducing a source of sulfur into said chamber at high pressure and to a face of said wafer.
Claim 2
Independent Claim 49 words
A method for depositing a passivating layer on a mercury-cadmium-telluride wafer comprising: (a) disposing said wafer into a high pressure process chamber under low pressure; (b) heating said chamber; and (c) introducing a source of sulfur into said chamber at high pressure and to a face of said wafer.
Claim 3
Independent Claim 52 words
A method for depositing a passivating layer on a mercury-cadmium-telluride wafer comprising: (a) disposing said wafer in a high pressure process chamber under low pressure; (b) heating said chamber; and (c) introducing an oxygen and water vapor containing mixture into said chamber at high pressure and to a face of said wafer.
Claim 4
Independent Claim 52 words
A method for depositing a passivating layer on a mercury-cadmium-telluride wafer comprising: (a) disposing said wafer in a high pressure process chamber under low pressure; (b) heating said chamber; and (c) introducing an oxygen and water vapor containing mixture into said chamber at high pressure and to a face of said wafer.
Claim 5
Dependent Claim 23 words
The method for depositing a passivating layer on a mercury-cadmium-telluride wafer of claim 1 wherein the source of sulfur is H 2 S.
Claim 6
Dependent Claim 25 words
The method for depositing a passivating layer on a mercury-cadmium-telluride wafer of claim 1 wherein the chamber is heated to between 50° and 100° C.
Claim 7
Dependent Claim 25 words
The method for depositing a passivating layer on a mercury-cadmium-telluride wafer of claim 1 wherein the chamber is pressurized to between 50 and 100 atmospheres.
Claim 8
Dependent Claim 25 words
A method for depositing a passivating layer on a mercury-cadmium-telluride wafer of claim 2 wherein the chamber is heated to between 50° and 100° C.
Claim 9
Dependent Claim 25 words
The method for depositing a passivating layer on a mercury-cadmium-telluride wafer of claim 2 wherein the chamber is pressurized to between 10 and 100 atmospheres.
Claim 10
Dependent Claim 28 words
The method for depositing a passivating layer on a mercury-cadmium-telluride wafer of claim 2 wherein oxygen and hydrogen are introduced to form an oxygen and water vapor mixture.
Claim 11
Dependent Claim 32 words
The method for depositing a passivating layer on a mercury-cadmium-telluride wafer of claim 8 wherein 100 sccm oxygen and 40 sccm hydrogen are introduced to form an oxygen and water vapor mixture.
Claim 12
Dependent Claim 41 words
The method for depositing a passivating layer on a mercury-cadmium-telluride wafer of claim 9 wherein 100 sccm oxygen and 40 sccm hydrogen are introduced to form an oxygen and water vapor mixture at a pressure of between 10 and 100 atmospheres.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-08-07 1993-02-06 1993-08-08 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-08-07 1997-02-06 1997-08-08 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-08-07 2001-02-06 2001-08-08 $7700.00 Window Closed / Lapsed

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