US4584207A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for nucleating and growing tungsten films
Assignee: Intersil Corp
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Filing: 1984-09-24
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Granted: 1986-04-22
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Expires: 2004-09-24
Abstract
Abstract Adherent deposits of tungsten are formed on receiving surfaces by preparing the receiving surface and thereafter forming a thin deposit of polycrystalline silicon on the surface. The surface and the deposited polycrystalline silicon is then exposed to a hydrogen containing tungsten fluoride gas at a suitable temperature to induce the adherent growth of tungsten film on the surface by reaction of the silicon with the tungsten fluoride gas. It is possible to form the polycrystalline silicon in a pattern on the surface and to form the tungsten deposit in the pattern in which the polycrystalline silicon had been deposited.
Inventors
- 👤 Ronald H. Wilson
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 22:28
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/40; H10P14/412
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
105 words
A method for forming an adherent patterned deposit of highly conductive tungsten metal on an insulating surface which comprises providing a receiving silicon dioxide surface, forming a very thin deposit of polycrystalline silicon in a pattern on that silicon dioxide receiving surface, exposing the surface with the deposited polycrystalline silicon to tungsten hexafluoride gas containing hydrogen gas to induce the removal of the polycrystalline silicon and the replacement of the polycrystalline silicon pattern with a deposit of tungsten in a pattern corresponding to that of the pattern of polycrystalline silicon which is replaced, and the strong adhesion of the deposit of tungsten to the surface.
Claim 2
Independent Claim
105 words
A method for forming an adherent patterned deposit of highly conductive tungsten metal on an insulating surface which comprises providing a receiving silicon dioxide surface, forming a very thin deposit of polycrystalline silicon in a pattern on that silicon dioxide receiving surface, exposing the surface with the deposited polycrystalline silicon to tungsten hexafluoride gas containing hydrogen gas to induce the removal of the polycrystalline silicon and the replacement of the polycrystalline silicon pattern with a deposit of tungsten in a pattern corresponding to that of the pattern of polycrystalline silicon which is replaced, and the strong adhesion of the deposit of tungsten to the surface.
Claim 3
Independent Claim
123 words
A method of forming a patterned adherent layer of highly conductive tungsten metal on a silicon oxide surface layer which comprises, providing a wafer of silicon, forming an insulating layer of silicon dioxide on a surface of said silicon wafer, depositing a very thin layer of polycrystalline silicon on said silicon dioxide surface, developing a configuration of very fine patterns in said polycrystalline silicon layer on said silicon dioxide surface, and forming a highly adherent layer of tungsten metal in the configuration of said very fine patterns by exposing the surface bearing the very thin layer of polysilicon to tungsten hexafluoride and hydrogen gas at a temperature between 225° C. and 325° C. to remove the polysilicon and replace it by tungsten metal.
Claim 4
Independent Claim
123 words
A method of forming a patterned adherent layer of highly conductive tungsten metal on a silicon oxide surface layer which comprises, providing a wafer of silicon, forming an insulating layer of silicon dioxide on a surface of said silicon wafer, depositing a very thin layer of polycrystalline silicon on said silicon dioxide surface, developing a configuration of very fine patterns in said polycrystalline silicon layer on said silicon dioxide surface, and forming a highly adherent layer of tungsten metal in the configuration of said very fine patterns by exposing the surface bearing the very thin layer of polysilicon to tungsten hexafluoride and hydrogen gas at a temperature between 225° C. and 325° C. to remove the polysilicon and replace it by tungsten metal.
Claim 5
Dependent Claim
19 words
The method of claim 2 wherein the very thin layer of polycrystalline silicon is between 100 and 400 Angstroms.
Claim 6
Dependent Claim
17 words
The method of claim 2 wherein the very thin layer of polycrystalline silicon is about 200 Angstroms.
Claim 7
Dependent Claim
18 words
The method of claim 2 wherein the very thin layer of silicon is formed by chemical vapor deposition.
Claim 8
Dependent Claim
17 words
The method of claim 2 wherein the very thin layer of polycrystalline silicon is formed by sputtering.
References Cited (Backward Citations)
US3519479A
Cited
US3785862A
Cited
US4404235A
Cited
US4349408A
Cited
JPS57166027A
Cited
US4383130A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-04-21 | 1989-10-21 | 1990-04-22 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-04-21 | 1993-10-21 | 1994-04-22 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-04-21 | 1997-10-21 | 1998-04-22 | $7700.00 | Window Closed / Lapsed |