Patent US5529513A successfully refreshed from Google Patents.
Patent US4839312A successfully refreshed from Google Patents.
← Back to Patent Explorer
US4839312A Expired / Lapsed US ⏱️ 0.0 years remaining

Fluorinated precursors from which to fabricate amorphous semiconductor material

Assignee: Energy Conversion Devices Inc
•
Filing: 1987-03-09
•
Granted: 1989-06-13
•
Expires: 2007-03-09
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A method producing a solid semiconductor film characterized by a low density of defect states in the energy gap thereof by the glow discharge deposition of a precursor gaseous mixture which includes a gas chosen from the group consisting essentially of hydrogen, fluorine, or combinations thereof and a compound chosen from the group consisting essentially of SiH 3 F, SiH 2 F 2 , SiHF 3 , SiHCl 3 , SiH 2 Cl 2 , SiH 3 Cl, SiCl 3 F, SiCl 2 F 2 , SiClF 3 , or combinations thereof.

Inventors

  • 👤 Stanford R. Ovshinsky
  • 👤 Arun Madan

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 21:36
CPC Classifications
H; H10; H10F; H10F71/00; H10F71/10; H10F71/103; H10D; H10D62/00; H10D62/40; H10P; H10P14/00; H10P14/20; H10P14/24; H10P14/29; H10P14/2901; H10P14/2923; H10P14/32; H10P14/3202; H10P14/3204; H10P14/3211; H10P14/3242; H10P14/3244; H10P14/3251; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/3438; H10P14/3441; H10P14/3442; H10P14/3444; Y; Y02; Y02E; Y02E10/00; Y02E10/50; Y02P; Y02P70/00; Y02P70/50

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 158 words
A method of producing a semiconductor film comprising a solid amorphous semiconductor host matrix with electronic configurations which have an energy gap and a low density of localized states therein; said method comprising the steps of providing a substrate; providing a precursor gaseous mixture including at least one set of compounds chosen from the group consisting essentially of: SiH.sub.4 +F.sub.2 ; SiH.sub.4 +SiF.sub.4 ; SiF.sub.4 +H.sub.2 ; SiH.sub.3 F+H.sub.2 ; SiH.sub.3 F; SiH.sub.2 F.sub.2 +H.sub.2 ; SiH.sub.2 F.sub.2 ; SiHF.sub.3 +H.sub.2 ; SiHF.sub.3 ; SiHCl.sub.3 +F.sub.2 ; SiH.sub.2 Cl.sub.2 +F.sub.2 ; SiH.sub.3 Cl+F.sub.2 ; SiCl.sub.3 F+H.sub.2 ; SiCl.sub.2 F.sub.2 +H.sub.2 ; SiClF.sub.3 +H.sub.2, or combinations thereof with or without n- or p-dopants or band gap modifiers; and depositing on said substrate a solid semiconductor host matrix by the glow discharge decomposition of said precursor gaseous mixtures; whereby there is incorporated in said semiconductor host matrix during the glow discharge deposition thereof a plurality of different, complementary alterant elements.
Claim 2
Independent Claim 158 words
A method of producing a semiconductor film comprising a solid amorphous semiconductor host matrix with electronic configurations which have an energy gap and a low density of localized states therein; said method comprising the steps of providing a substrate; providing a precursor gaseous mixture including at least one set of compounds chosen from the group consisting essentially of: SiH.sub.4 +F.sub.2 ; SiH.sub.4 +SiF.sub.4 ; SiF.sub.4 +H.sub.2 ; SiH.sub.3 F+H.sub.2 ; SiH.sub.3 F; SiH.sub.2 F.sub.2 +H.sub.2 ; SiH.sub.2 F.sub.2 ; SiHF.sub.3 +H.sub.2 ; SiHF.sub.3 ; SiHCl.sub.3 +F.sub.2 ; SiH.sub.2 Cl.sub.2 +F.sub.2 ; SiH.sub.3 Cl+F.sub.2 ; SiCl.sub.3 F+H.sub.2 ; SiCl.sub.2 F.sub.2 +H.sub.2 ; SiClF.sub.3 +H.sub.2, or combinations thereof with or without n- or p-dopants or band gap modifiers; and depositing on said substrate a solid semiconductor host matrix by the glow discharge decomposition of said precursor gaseous mixtures; whereby there is incorporated in said semiconductor host matrix during the glow discharge deposition thereof a plurality of different, complementary alterant elements.
Claim 3
Dependent Claim 14 words
A method as in claim 1, discharge is affected at a temperature 400° C.

References Cited (Backward Citations)

US3745043A Cited
US3969163A Cited
US4084024A Cited
US4196438A Cited
US4361638A Cited
US4292342A Cited
US4359512A Cited
US4441973A Cited
US4522663A Cited
US4485121A Cited
US4637938A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-06-12 1992-12-12 1993-06-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-06-12 1996-12-12 1997-06-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-06-12 2000-12-12 2001-06-13 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag