Stacked mass storage flash memory package

Claim 2

A stacked multiple-semiconductor die device, comprising: a substrate having a surface; at least one conductive bond area on the surface of the substrate; a plurality of semiconductor dice having similar dimensions, each semiconductor die having an active surface including at least four edges, and a back side; a field of conductive bond pads disposed on the active surface of each semiconductor die, the field of conductive bond pads positioned along less than three edges of the active surface of a semiconductor die, the back side of a first semiconductor die being attached to the surface of the substrate adjacent the at least one conductive bond area of the surface of the substrate and the back side of a second semiconductor die is attached to the active surface of the first semiconductor die in an offset position having the field of conductive bond pads of the first semiconductor die exposed; conductors connecting bond pads of the first semiconductor die to the at least one conductive bond area of the substrate; and conductors connecting bond pads of the second semiconductor die to the at least one conductive bond area of the substrate.

Claim 3

The stacked multiple-semiconductor die device of claim 1 , wherein the plurality of semiconductor dice comprise a stack of semiconductor dice having one of substantially same dimensions and different dimensions.

Claim 4

The stacked multiple-semiconductor die device of claim 1 , wherein the first semiconductor die is attached to the substrate by a thin adhesive layer and the second semiconductor die is attached to the first semiconductor die by a thin adhesive layer.

Claim 5

The stacked multiple-semiconductor die device of claim 1 , wherein each semiconductor die has a field of conductive bond pads along one edge thereof, and the second semiconductor die being offset from the first semiconductor die in one direction to expose the field of conductive bond pads of the first semiconductor die for establishing connections from the field of conductive bond pads to the substrate.

Claim 6

The stacked multiple-semiconductor die device of claims 4 , wherein each semiconductor die has a length greater than a width whereby rotation of one semiconductor die relative to an underlying adjacent semiconductor die offsets the first semiconductor die to expose the field of conductive bond pads on at least one field of bond pads for attaching conductors thereto.

Claim 7

The stacked multiple-semiconductor die device according to claim 1 , in which the substrate comprises one of a circuit board, circuit card, lead frame and tape automated bonding (TAB) tape.

Claim 8

A high density stacked multiple-die device, comprising: a substrate having a surface; conductive bond areas on the surface of the substrate; a plurality of semiconductor dice having substantially same dimensions, each semiconductor die having a rectangular active surface having at least four edges, and a back side; a field of conductive bond pads disposed on the active surface of each semiconductor die, the field positioned along less than three edges thereof, the back side of a first semiconductor die being attached to the surface of the substrate adjacent the conductive bond areas of the surface of the substrate, the back side of a second semiconductor die being attached to the active surface of the first semiconductor die in an offset position having the field of conductive bond pads of the first semiconductor die exposed; conductors connecting bond pads of the first semiconductor die to the conductive bond areas of the substrate; and conductors connecting bond pads of the second semiconductor die to the conductive bond areas of the substrate.

Claim 9

A high density stacked multiple-die device, comprising: a substrate having a surface; conductive bond areas on the surface of the substrate; a plurality of semiconductor dice having substantially same dimensions, each semiconductor die having a rectangular active surface having at least four edges, and a back side; a field of conductive bond pads disposed on the active surface of each semiconductor die, the field positioned along less than three edges thereof, the back side of a first semiconductor die being attached to the surface of the substrate adjacent the conductive bond areas of the surface of the substrate, the back side of a second semiconductor die being attached to the active surface of the first semiconductor die in an offset position having the field of conductive bond pads of the first semiconductor die exposed; conductors connecting bond pads of the first semiconductor die to the conductive bond areas of the substrate; and conductors connecting bond pads of the second semiconductor die to the conductive bond areas of the substrate.

Claim 10

The high density stacked multiple-die device of claim 7 , wherein the plurality of semiconductor dice comprise a stack of semiconductor dice, each semiconductor die being one of substantially a same size and of a different size.

Claim 11

The high density stacked multiple-die stacked device of claim 7 , wherein the first semiconductor die is attached to the substrate by a thin adhesive layer and the second semiconductor die is attached to the first semiconductor die by a thin adhesive layer.

Claim 12

The high density stacked multiple-die device of claim 7 , wherein each semiconductor die has a field of bond pads along one edge thereof, and the second semiconductor die is offset from the first semiconductor die in one direction to expose the bond pads of the first semiconductor die for establishing connections from the bond pads to the substrate.

Claim 13

The high density stacked multiple-die device of claim 10 , wherein each semiconductor die has a field of bond pads along two adjacent edges thereof, and each of the second and subsequent semiconductor dice are offset from their underlying semiconductor dice in two directions exposing the bond pads thereof for conductive bonding and; each semiconductor dice is offset in the same two directions relative to its underlying semiconductor die.

Claim 14

The high density stacked multiple-die device of claim 10 , wherein each semiconductor die has a length greater than a width whereby rotation of one semiconductor die relative to an underlying adjacent semiconductor die offsets the first semiconductor die to expose the field of bond pads on at least one of the field of bond pads for attaching the conductors thereto.

Claim 15

The high density stacked multiple-die device according to claim 7 , in which the substrate comprises one of a circuit board, circuit card, lead frame and tape automated bonding (TAB) tape.

Claim 16

A stacked multiple-semiconductor die device, comprising: a substrate having a surface; at least one conductive bond area on the surface of the substrate; a plurality of semiconductor dice, each semiconductor die having one of similar dimensions and different dimensions, each semiconductor die having an active surface including at least four edges, and a back side; a field of conductive bond pads disposed on the active surface of each semiconductor die, the field of conductive bond pads positioned along less than three edges of the active surface of at least one semiconductor die, the back side of a first semiconductor die being attached to the surface of the substrate adjacent the at least one conductive bond areas of the surface of the substrate and the back side of a second semiconductor die is attached to the active surface of the first semiconductor die in an offset position having the field of conductive bond pads of the first semiconductor die exposed; conductors connecting bond pads of the first semiconductor die to the at least one conductive bond area of the substrate; and conductors connecting bond pads of the second semiconductor die to the at least one conductive bond area of the substrate.

Claim 17

A stacked multiple-semiconductor die device, comprising: a substrate having a surface; at least one conductive bond area on the surface of the substrate; a plurality of semiconductor dice, each semiconductor die having one of similar dimensions and different dimensions, each semiconductor die having an active surface including at least four edges, and a back side; a field of conductive bond pads disposed on the active surface of each semiconductor die, the field of conductive bond pads positioned along less than three edges of the active surface of at least one semiconductor die, the back side of a first semiconductor die being attached to the surface of the substrate adjacent the at least one conductive bond areas of the surface of the substrate and the back side of a second semiconductor die is attached to the active surface of the first semiconductor die in an offset position having the field of conductive bond pads of the first semiconductor die exposed; conductors connecting bond pads of the first semiconductor die to the at least one conductive bond area of the substrate; and conductors connecting bond pads of the second semiconductor die to the at least one conductive bond area of the substrate.

Claim 18

The stacked multiple-semiconductor die device of claim 14 , wherein the plurality of semiconductor dice comprise a stack of semiconductor dice having one of substantially different dimensions.

Claim 19

The stacked multiple-semiconductor die device of claim 14 , wherein each semiconductor die has a field of bond pads along one edge thereof, and the second semiconductor die being offset from the first semiconductor die in one direction to expose the field of conductive bond pads of the first semiconductor die for establishing connections from the field of conductive bond pads to the substrate.

Claim 20

A high density stacked multiple-die device, comprising: a substrate having a surface; conductive bond areas on the surface of the substrate; a plurality of semiconductor dice having substantially different dimensions, each semiconductor die having a rectangular active surface having at least four edges, and a back side; a field of conductive bond pads disposed on the active surface of each semiconductor die, the field of conductive bond pads positioned along less than three edges thereof, the back side of a first semiconductor die being attached to the surface of the substrate adjacent the conductive bond areas of the surface of the substrate, the back side of a second semiconductor die being attached to the active surface of the first semiconductor die in an offset position having the field of conductive bond pads of the first semiconductor die exposed; conductors connecting bond pads of the first semiconductor die to the conductive bond areas of the substrate; and conductors connecting bond pads of the second semiconductor die to the conductive bond areas of the substrate.

Claim 21

A high density stacked multiple-die device, comprising: a substrate having a surface; conductive bond areas on the surface of the substrate; a plurality of semiconductor dice having substantially different dimensions, each semiconductor die having a rectangular active surface having at least four edges, and a back side; a field of conductive bond pads disposed on the active surface of each semiconductor die, the field of conductive bond pads positioned along less than three edges thereof, the back side of a first semiconductor die being attached to the surface of the substrate adjacent the conductive bond areas of the surface of the substrate, the back side of a second semiconductor die being attached to the active surface of the first semiconductor die in an offset position having the field of conductive bond pads of the first semiconductor die exposed; conductors connecting bond pads of the first semiconductor die to the conductive bond areas of the substrate; and conductors connecting bond pads of the second semiconductor die to the conductive bond areas of the substrate.

Claim 22

The high density stacked multiple-die device of claim 17 , wherein the plurality of semiconductor dice comprise a stack of semiconductor dice, each semiconductor die being one of substantially a same size and of a different size.

Claim 23

The high density stacked multiple-die device of claim 17 , comprising at least one additional semiconductor die having the back side attached to the active surface of the next lower semiconductor die in an offset position, the field of conductive bond pads of each semiconductor die exposed for attachment of the conductors thereto.

Claim 24

The high density stacked multiple-die device of claim 17 , wherein each semiconductor die has a field of bond pads along one edge thereof, and the second semiconductor die is offset from the first semiconductor die in one direction to expose the field of conductive bond pads of the first semiconductor die for establishing connections from the field of conductive bond pads to the substrate.

Claim 25

The high density stacked multiple-die device according to claim 17 , in which the substrate comprises one of a circuit board, circuit card, lead frame and tape automated bonding (TAB) tape.