US6243134B1
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method to reduce reset noise in photodiode based CMOS image sensors
Assignee: Intel Corp
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Filing: 1998-02-27
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Granted: 2001-06-05
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Expires: 2018-02-27
Abstract
Abstract A method for controlling a sensor to reduce reset noise is disclosed. The method including the steps of providing a reset command including a RESET signal and a first SAMPLE signal. The method also includes the steps of providing a read command including a first ADDRESS signal, a second SAMPLE signal, and a second ADDRESS signal. An apparatus including a system controller and a sensor controlled by the system controller is also disclosed. In one embodiment, the method and apparatus is provided for a sensor in a sensor array that is read-out in a pipelined fashion.
Inventors
- 👤 Mark A. Beiley
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 12:46
CPC Classifications
H; H10; H10F; H10F39/00; H10F39/10; H10F39/12; H10F39/18; H04; H04N; H04N25/00; H04N25/50; H04N25/57; H04N25/571; H04N25/575; H04N25/60; H04N25/616; H04N25/65; H04N25/70; H04N25/76; H04N25/77; H04N25/771; H10F39/80; H10F39/803
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
106 words
A method comprising: asserting a sample signal and a reset signal to generate a reset voltage at a storage node of each photocell in a first group of photocells in an image sensor array; and then deasserting the reset signal prior to deasserting the sample signal so that the reset voltage is captured at the storage node; and then asserting a first address signal to read the captured reset voltage at the storage node; waiting an integration period after deasserting the reset signal and before reading an exposed voltage at the storage node; and generating a difference between the exposed voltage and the captured reset voltage.
Claim 2
Independent Claim
106 words
A method comprising: asserting a sample signal and a reset signal to generate a reset voltage at a storage node of each photocell in a first group of photocells in an image sensor array; and then deasserting the reset signal prior to deasserting the sample signal so that the reset voltage is captured at the storage node; and then asserting a first address signal to read the captured reset voltage at the storage node; waiting an integration period after deasserting the reset signal and before reading an exposed voltage at the storage node; and generating a difference between the exposed voltage and the captured reset voltage.
Claim 3
Dependent Claim
21 words
The method of claim 1 further comprising asserting and deasserting the sample signal a second time to capture the exposed voltage.
Claim 4
Dependent Claim
30 words
The method of claim 1 wherein the reading of the captured reset voltage at the storage node includes sampling a voltage on a bitline to which the photocell is coupled.
Claim 5
Dependent Claim
15 words
The method of claim 1 wherein the sample signal and reset signal are asserted simultaneously.
Claim 6
Dependent Claim
27 words
The method of claim 1 further comprising repeatedly performing the operations of claim 1 upon the image sensor array to read an image, in a pipelined manner.
Claim 7
Independent Claim
204 words
An apparatus comprising: a sensor array having a plurality of groups of photocells, each group of photocells being coupled to provide output voltages on a respective bitline, each photocell in a group having a reset device coupled to reset a photodetector in response to a reset signal being asserted, a sample device coupled to provide a low impedance path between the photodetector and a storage device, and a readout circuit coupled between the storage device and the respective bitline to provide an output voltage in response to an address signal being asserted; and a controller coupled to control the sensor array by asserting a sample signal and a reset signal to generate a reset voltage at a storage node of each photocell in a first group of photocells in the sensor array; and then deasserting the reset signal prior to deasserting the sample signal so that the reset voltage is captured at the storage node; and then asserting a first address signal to read the captured reset voltage at the storage node, waiting an integration period after deasserting the reset signal and before reading an exposed voltage at the storage node, and generating a difference between the exposed voltage and the captured reset voltage.
Claim 8
Independent Claim
204 words
An apparatus comprising: a sensor array having a plurality of groups of photocells, each group of photocells being coupled to provide output voltages on a respective bitline, each photocell in a group having a reset device coupled to reset a photodetector in response to a reset signal being asserted, a sample device coupled to provide a low impedance path between the photodetector and a storage device, and a readout circuit coupled between the storage device and the respective bitline to provide an output voltage in response to an address signal being asserted; and a controller coupled to control the sensor array by asserting a sample signal and a reset signal to generate a reset voltage at a storage node of each photocell in a first group of photocells in the sensor array; and then deasserting the reset signal prior to deasserting the sample signal so that the reset voltage is captured at the storage node; and then asserting a first address signal to read the captured reset voltage at the storage node, waiting an integration period after deasserting the reset signal and before reading an exposed voltage at the storage node, and generating a difference between the exposed voltage and the captured reset voltage.
Claim 9
Dependent Claim
20 words
The apparatus of claim 6 wherein each group of photocells forms a column and the first group forms a row.
Claim 10
Dependent Claim
20 words
The apparatus of claim 6 wherein the photodetector in each photocell includes a photodiode built using a MOS fabrication process.
Claim 11
Dependent Claim
12 words
The apparatus of claim 6 wherein each device is a single transistor.
Claim 12
Dependent Claim
30 words
The apparatus of claim 6 wherein the controller is to further control the sensor array by asserting and deasserting the sample signal a second time to capture the exposed voltage.
Claim 13
Dependent Claim
39 words
The apparatus of claim 6 wherein the controller is to further control the sensor array to repeatedly generate and read a reset voltage and an exposed voltage from the sensor array to read an image, in a pipelined manner.
Claim 14
Dependent Claim
36 words
The apparatus of claim 6 wherein the plurality of groups of photocells form substantially the entire sensor array, and the controller is further coupled to provide the same reset signal to each photocell in each group.
Claim 15
Dependent Claim
131 words
An article of manufacture comprising: a machine-readable medium having instructions stored therein which, when executed by a processor, cause an imaging system to electronically capture an image by asserting a sample signal and a reset signal to generate a reset voltage at a storage node of each photocell in a first group of photocells in an image sensor array, and then deasserting the reset signal prior to deasserting the sample signal so that the reset voltage is captured at the storage node, and then asserting a first address signal to read the captured reset voltage at the storage node, waiting an integration period after deasserting the reset signal and before reading an exposed voltage at the storage node, and generating a difference between the exposed voltage and the captured reset voltage.
Claim 16
Dependent Claim
131 words
An article of manufacture comprising: a machine-readable medium having instructions stored therein which, when executed by a processor, cause an imaging system to electronically capture an image by asserting a sample signal and a reset signal to generate a reset voltage at a storage node of each photocell in a first group of photocells in an image sensor array, and then deasserting the reset signal prior to deasserting the sample signal so that the reset voltage is captured at the storage node, and then asserting a first address signal to read the captured reset voltage at the storage node, waiting an integration period after deasserting the reset signal and before reading an exposed voltage at the storage node, and generating a difference between the exposed voltage and the captured reset voltage.
Claim 17
Dependent Claim
43 words
The article of manufacture of claim 13 wherein the machine readable medium includes further instructions which, when executed by the processor, cause the system to capture the image by asserting and deasserting the sample signal a second time to capture the exposed voltage.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2004-06-04 | 2004-12-04 | 2005-06-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2008-06-04 | 2008-12-04 | 2009-06-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2012-06-04 | 2012-12-04 | 2013-06-05 | $7700.00 | Window Closed / Lapsed |