Patent US6207517B1 successfully refreshed from Google Patents.
US6207517B1
Expired / Lapsed
US
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Method of fabricating a semiconductor insulation layer and a semiconductor component containing the semiconductor insulation layer
Assignee: Siemens AG
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Filing: 1999-08-18
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Granted: 2001-03-27
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Expires: 2019-08-18
Abstract
Abstract The invention defines a method for fabricating a semiconductor insulation layer: A semiconductor substrate is first provided; an insulation layer is applied by way of region-by-region or whole-area application to the semiconductor substrate; impurity ions are selectively implanted into at least one predetermined zone of the insulation layer; then the insulation layer is selectively etched, and the insulation layer is thereby patterned in accordance with the zone or zones of the selectively implanted impurity ions. Likewise, the present invention provides a method for fabricating a semiconductor component containing this semiconductor insulation layer.
Inventors
- 👤 Karlheinz Müller
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 06:15
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10W; H10W20/00; H10W20/01; H10W20/071; H10W20/081; H10W20/082; H10D; H10D64/00; H10D64/01; H10D64/013; H10D64/01302; H10D64/01304; H10D64/01326; H10D84/00; H10D84/01; H10D84/0123; H10D84/0126; H10D84/0165; H10D84/0188; H10D84/02; H10D84/03; H10D84/038; H10P30/00; H10P30/20; H10P30/22; H10W20/084; Y; Y10; Y10S; Y10S438/00; Y10S438/978
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
204 words
A method of fabricating a semiconductor component with a semiconductor insulation layer, which comprises the following steps: providing a semiconductor substrate; forming a whole-area insulation layer on the semiconductor substrate with a predetermined thickness; forming a first mask on the insulation layer and defining a first predetermined zone; selectively implanting impurity ions into the first predetermined zone of the insulation layer defined by the first mask, and thereby selecting an implantation profile in accordance with an etching zone situated on the surface and having a smaller thickness than the predetermined thickness of the insulation layer; selectively etching the insulation layer in the first predetermined zone in accordance with the mask; forming a second mask on the semiconductor substrate and defining a second predetermined zone of the insulation layer; selectively implanting impurity ions into the second predetermined zone of the insulation layer, and selecting an implantation profile in accordance with an etching zone having the same thickness as the thickness of the insulation layer; selectively etching the insulation layer in the first predetermined zone and uncovering the semiconductor substrate; forming a whole-area conductive layer on the structure formed in the selectively etching; and polishing the conductive layer substantially to the thickness of the insulation layer.
Claim 2
Independent Claim
204 words
A method of fabricating a semiconductor component with a semiconductor insulation layer, which comprises the following steps: providing a semiconductor substrate; forming a whole-area insulation layer on the semiconductor substrate with a predetermined thickness; forming a first mask on the insulation layer and defining a first predetermined zone; selectively implanting impurity ions into the first predetermined zone of the insulation layer defined by the first mask, and thereby selecting an implantation profile in accordance with an etching zone situated on the surface and having a smaller thickness than the predetermined thickness of the insulation layer; selectively etching the insulation layer in the first predetermined zone in accordance with the mask; forming a second mask on the semiconductor substrate and defining a second predetermined zone of the insulation layer; selectively implanting impurity ions into the second predetermined zone of the insulation layer, and selecting an implantation profile in accordance with an etching zone having the same thickness as the thickness of the insulation layer; selectively etching the insulation layer in the first predetermined zone and uncovering the semiconductor substrate; forming a whole-area conductive layer on the structure formed in the selectively etching; and polishing the conductive layer substantially to the thickness of the insulation layer.
Claim 3
Dependent Claim
15 words
The method according to claim 1 , wherein the polishing step comprises chemical mechanical polishing.
Claim 4
Dependent Claim
14 words
The method according to claim 1 , which further comprises patterning the conductive layer.
Claim 5
Dependent Claim
48 words
The method according to claim 1 , which further comprises forming a field-effect transistor with a channel well zone in the second predetermined zone defined by the second mask, with a superior gate insulator layer and source and drain zones in an adjoining region of the semiconductor substrate.
Claim 6
Dependent Claim
108 words
The method according to claim 1 , which further comprises the following steps: forming the first mask in accordance with a dumbbell-shaped zone; forming the second mask on the semiconductor substrate in accordance with a respective zone in the dumbbell plates of the dumbbell-shaped zone according to the first mask; and forming a respective field-effect transistor with a channel well zone in the respective zone in accordance with the second mask, a superior gate insulator layer and source and drain zones in the adjoining region of the semiconductor substrate; and connecting the two gate terminals of the field-effect transistors with the conductive layer running across the dumbbell web.
Claim 7
Dependent Claim
31 words
The method according to claim 5 , which further comprises patterning the conductive layer with a further mask and thereby forming openings for contact terminals to the source and drain zones.
Claim 8
Dependent Claim
42 words
The method according to claim 6 , which further comprises the following steps: forming contact terminals with doped polysilicon; planarizing the contact terminals with chemical mechanical polishing; and outdiffusing a doping of the contact terminals for completing the source and drain zones.
Claim 9
Dependent Claim
31 words
The method according to claim 4 , which further comprises patterning the conductive layer with a further mask and thereby forming openings for contact terminals to the source and drain zones.
Claim 10
Dependent Claim
42 words
The method according to claim 8 , which further comprises the following steps: forming contact terminals with doped polysilicon; planarizing the contact terminals with chemical mechanical polishing; and outdiffusing a doping of the contact terminals for completing the source and drain zones.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2004-03-26 | 2004-09-25 | 2005-03-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2008-03-26 | 2008-09-25 | 2009-03-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2012-03-26 | 2012-09-25 | 2013-03-27 | $7700.00 | Window Closed / Lapsed |