TW241376B
Expired / Lapsed
TW
⏱️ 0.0 years remaining
Planarization process with increasing etching ratio
Assignee: United Microelectronics Corp
•
Filing: 1993-12-09
•
Granted: 1995-02-21
•
Expires: 2013-12-09
Abstract
Abstract A planarization process with increasing etching ratio includes: 1. depositing oxide layer with high thickness on the uneven layer on the substrate; 2. overlaying one thin spin-on-glass on the oxide layer with high thickness; 3. implementing ion implantation, and doping the upper section of oxide layer; 4. wet selective etching back; By the above ion implantation the extruding parts of oxide layer upper section becomes with high etching rate features by doping in order to conduct wet selective etching back to constitue planarization by even etching sweepingly.
Inventors
- 👤 Ming-Tzong Yang
Bibliographic Details
Application Number
—
Jurisdiction
TW
Data Source
google_patents
Last Synchronized
2026-11-04 20:44
CPC Classifications
—
Claims Analysis
Total Claims: 0
No claims parsed yet. Click Sync Now above to re-index claims from Google Patents.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
Maintenance schedule is calculated for granted US utility patents.