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US6190237B1 Expired / Lapsed US ⏱️ 0.0 years remaining

pH-buffered slurry and use thereof for polishing

Assignee: International Business Machines Corp
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Filing: 1997-11-06
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Granted: 2001-02-20
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Expires: 2017-11-06
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Abstract

Abstract A slurry containing abrasive particles and a pH buffering component comprising at least one acid or salt thereof and at least one base is especially useful for polishing surfaces, including those used in microelectronics.

Inventors

  • 👤 Cuc Kim Huynh
  • 👤 Mahadevaiyer Krishnan
  • 👤 Michael Joseph MacDonald
  • 👤 Mark Peter Murray

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 21:27
CPC Classifications
C; C09; C09K; C09K3/00; C09K3/14; C09K3/1454; C09K3/1463; H; H10; H10P; H10P52/00; H10P52/40; H10P52/403; B; B24; B24B; B24B37/00; B24B37/04; B24B37/042; C09G; C09G1/00; C09G1/02

Claims Analysis

Total Claims: 20
Claim 1
Independent Claim 167 words
A multistep method for polishing a surface which comprises polishing said surface by first contacting it with a first slurry comprising abrasive particles and having a pH of about 1 to about 6 and contacting and polishing the surface having the slurry thereon with a polishing pad; followed by providing on said surface a second and different slurry comprising abrasive particles, a pH of about 3 to about 11 and a pH buffering component comprising at least one acid or salt thereof or mixture thereof in a concentration of about 10 −5 M to about 10 2 M and at least one base or salt thereof or mixture thereof in a concentration of about 10 −5 M to about 10 2 M and wherein the buffering component of the second slurry is free of metal cations, and polishing said surface having said second slurry thereon by contacting it with a polishing pad, wherein said acid and/or said base also acts as a complexing agent for metal cations.
Claim 2
Dependent Claim 167 words
A multistep method for polishing a surface which comprises polishing said surface by first contacting it with a first slurry comprising abrasive particles and having a pH of about 1 to about 6 and contacting and polishing the surface having the slurry thereon with a polishing pad; followed by providing on said surface a second and different slurry comprising abrasive particles, a pH of about 3 to about 11 and a pH buffering component comprising at least one acid or salt thereof or mixture thereof in a concentration of about 10 −5 M to about 10 2 M and at least one base or salt thereof or mixture thereof in a concentration of about 10 −5 M to about 10 2 M and wherein the buffering component of the second slurry is free of metal cations, and polishing said surface having said second slurry thereon by contacting it with a polishing pad, wherein said acid and/or said base also acts as a complexing agent for metal cations.
Claim 3
Dependent Claim 69 words
The method of claim 1 wherein said acid or salt thereof is selected from the group consisting of acetic acid, citric acid, boric acid, oxalic acid, hydrochloric acid, sulfuric acid, tartaric acid, nitric acid, malic acid, formic acid, lactic acid, benzoic acid, and mixtures thereof and wherein said base or salt thereof is selected from the group consisting of ammonium hydroxide, tris(hydroxymethyl) amino methane, triethanol amine and mixtures thereof.
Claim 4
Dependent Claim 25 words
The method of claim 2 wherein the pH of the first polish slurry is about 2 and the pH of the second slurry is 5.
Claim 5
Dependent Claim 27 words
The method of claim 1 wherein said abrasive particles are selected from the group consisting of alumina, silica, zirconia, ceria, titanium dioxide, ferric oxide and mixtures thereof.
Claim 6
Dependent Claim 20 words
The method of claim 1 wherein said abrasive particles have a particle size of about 10 to about 1000 nanometers.
Claim 7
Dependent Claim 12 words
The method of claim 1 wherein said slurry is an aqueous slurry.
Claim 8
Dependent Claim 13 words
The method of claim 6 wherein said slurry further contains an organic diluent.
Claim 9
Dependent Claim 26 words
The method of claim 7 wherein said organic diluent is selected from the group consisting of propylene carbonate, methanol, ethanol, ethylene glycol, glycerol, and mixtures thereof.
Claim 10
Dependent Claim 12 words
The method of claim 1 wherein said slurry contains an organic diluent.
Claim 11
Dependent Claim 26 words
The method of claim 9 wherein said organic diluent is selected from the group consisting of propylene carbonate, methanol, ethanol, ethylene glycol, glycerol, and mixtures thereof.
Claim 12
Dependent Claim 21 words
The method of claim 1 wherein said surface is selected from the group consisting of alumina, copper, tungsten and silicon dioxide.
Claim 13
Dependent Claim 17 words
The method of claim 1 wherein beneath said surface to be polished is a refractory metal liner.
Claim 14
Dependent Claim 25 words
The method of claim 1 wherein said refractory metal liner is selected from the group consisting of niobium, tantalum, titanium, nitrides thereof and mixtures thereof.
Claim 15
Dependent Claim 35 words
The method of claim 1 wherein the speed of said pad during said polishing is about 10 to about 150 rpm, and the speed of the wafer carrier is about 10 to about 150 rpm.
Claim 16
Dependent Claim 20 words
The method of claim 1 wherein the polishing with the second slurry removes scratches caused by the first polish slurry.
Claim 17
Dependent Claim 26 words
The method of claim 1 wherein the polishing with the second slurry removes an underlying material that differs from that removed by the first polish slurry.
Claim 18
Dependent Claim 25 words
The method of claim 1 wherein the pH of the first polish slurry is about 2 and the pH of the second slurry is 5.
Claim 19
Dependent Claim 50 words
The method of claim 1 which consists essentially of polishing said surface by first contacting it with said first slurry and contacting said surface with a polishing pad, followed by providing on said surface said second and different slurry and polishing said surface by contacting it with a polishing pad.
Claim 20
Dependent Claim 43 words
The method of claim 1 wherein said buffering component provides for a buffered slurry which resists pH change due to differences in pH between said first slurry and said second slurry, and does not significantly change the polishing rate of said second slurry.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2004-02-20 2004-08-21 2005-02-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2008-02-20 2008-08-21 2009-02-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2012-02-20 2012-08-21 2013-02-20 $7700.00 Window Closed / Lapsed

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