Patent US6133582A successfully refreshed from Google Patents.
US6133582A
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Methods and apparatuses for binning partially completed integrated circuits based upon test results
Assignee: Hanger Solutions LLC
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Filing: 1998-05-14
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Granted: 2000-10-17
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Expires: 2018-05-14
Abstract
Abstract A gate array integrated circuit wafer is formed having M-N generic metal interconnection layers and having performance and/or electrical testing circuits which are operative using only the M-N generic metal interconnection layers. The performance and electrical testing circuits are located in the active chip area and/or in the scribe line area between dies on the wafer. Performance and/or electrical tests are performed after generic fabrication is completed, but before the final customization of the wafers. Wafers are sorted and assigned to performance and/or yield bins based upon the results of the performance and/or electrical tests. The contents of different bins are provided to different customers for addition of the final N application specific metal interconnection layers based upon the customer's performance and/or yield requirements. In another embodiment, all M layers are deposited prior to performance and/or electrical testing; however, the Mth layer is not etched within the active die area prior to performance and/or electrical testing. Subsequent to binning based upon the test results, the final customization is performed by etching the Mth metal layer. Further, a programmable gate array integrated circuit which has features for testing and binning for speed and performance grading prior to final personalization or programming on the top layer or layers of interconnecting material is provided.
Inventors
- 👤 Robert Osann, Jr.
- 👤 Shafy Eltoukhy
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 02:25
CPC Classifications
H; H10; H10P; H10P74/00; H10P74/23; H10D; H10D84/00; H10D84/90; H10D84/903; H10P74/27; H10P74/277
Claims Analysis
Total Claims: 21
Claim 1
Independent Claim
81 words
An integrated circuit wafer, comprising: a plurality of generic gate array dies, each die including an untestable generic gate array circuit, each circuit including M-N generically-patterned metal interconnection layers, wherein the generic gate array circuits are not yet electrically operative and are capable of receiving N application-specific custom metal interconnection layers; and a self-contained performance testing circuit having probe pads on the (M-N)th metal interconnection layer, wherein the performance testing circuit is accessible through the probe pads and is electrically functional.
Claim 2
Dependent Claim
81 words
An integrated circuit wafer, comprising: a plurality of generic gate array dies, each die including an untestable generic gate array circuit, each circuit including M-N generically-patterned metal interconnection layers, wherein the generic gate array circuits are not yet electrically operative and are capable of receiving N application-specific custom metal interconnection layers; and a self-contained performance testing circuit having probe pads on the (M-N)th metal interconnection layer, wherein the performance testing circuit is accessible through the probe pads and is electrically functional.
Claim 3
Dependent Claim
25 words
An integrated circuit wafer as in claim 1, wherein the self-contained performance testing circuit comprises a series of buffers having an input and an output.
Claim 4
Dependent Claim
21 words
An integrated circuit wafer as in claim 1, wherein the self-contained performance testing circuit comprises a ring oscillator having an output.
Claim 5
Dependent Claim
29 words
An integrated circuit wafer as in claim 1, wherein the self-contained performance testing circuit is located in a scribe line area between the plurality of generic gate array dies.
Claim 6
Dependent Claim
26 words
An integrated circuit wafer as in claim 1, wherein the self-contained performance testing circuit is located within an active area of the generic gate array dies.
Claim 7
Dependent Claim
16 words
An integrated circuit wafer as in claim 1, wherein M is four, and N is one.
Claim 8
Dependent Claim
78 words
An integrated circuit wafer, comprising: a plurality of generic gate array dies, each die including an untestable generic gate array circuit, each circuit including M-1 generically-patterned metal interconnection layers and an Mth unpatterned metal interconnection layer, wherein each generic gate array circuit is not yet electrically operative; and a self-contained performance testing circuit having probe pads on the Mth metal interconnection layer, wherein the self-contained performance testing circuit is accessible through the probe pads and is electrically functional.
Claim 9
Dependent Claim
78 words
An integrated circuit wafer, comprising: a plurality of generic gate array dies, each die including an untestable generic gate array circuit, each circuit including M-1 generically-patterned metal interconnection layers and an Mth unpatterned metal interconnection layer, wherein each generic gate array circuit is not yet electrically operative; and a self-contained performance testing circuit having probe pads on the Mth metal interconnection layer, wherein the self-contained performance testing circuit is accessible through the probe pads and is electrically functional.
Claim 10
Dependent Claim
25 words
An integrated circuit wafer as in claim 7, wherein the self-contained performance testing circuit comprises a series of buffers having an input and an output.
Claim 11
Dependent Claim
21 words
An integrated circuit wafer as in claim 7, wherein the self-contained performance testing circuit comprises a ring oscillator having an output.
Claim 12
Dependent Claim
29 words
An integrated circuit wafer as in claim 7, wherein the self-contained performance testing circuit is located in a scribe line area between the plurality of generic gate array dies.
Claim 13
Dependent Claim
26 words
An integrated circuit wafer as in claim 7, wherein the self-contained performance testing circuit is located within an active area of the generic gate array dies.
Claim 14
Dependent Claim
12 words
An integrated circuit wafer as in claim 7, wherein M is four.
Claim 15
Dependent Claim
78 words
An integrated circuit wafer, comprising: a plurality of generic gate array dies, each die including an untestable generic gate array circuit, each circuit including M-1 generically-patterned metal interconnection layers and an Mth unpatterned metal interconnection layer, wherein each generic gate array circuit is not yet electrically operative; and a self-contained electrical testing circuit having probe pads on the Mth metal interconnection layer, wherein the self-contained electrical testing circuit is accessible through the probe pads and is electrically functional.
Claim 16
Dependent Claim
78 words
An integrated circuit wafer, comprising: a plurality of generic gate array dies, each die including an untestable generic gate array circuit, each circuit including M-1 generically-patterned metal interconnection layers and an Mth unpatterned metal interconnection layer, wherein each generic gate array circuit is not yet electrically operative; and a self-contained electrical testing circuit having probe pads on the Mth metal interconnection layer, wherein the self-contained electrical testing circuit is accessible through the probe pads and is electrically functional.
Claim 17
Dependent Claim
24 words
An integrated circuit wafer as in claim 13, wherein the self-contained electrical testing circuit is operative to test metal resistance on each metal layer.
Claim 18
Dependent Claim
24 words
An integrated circuit wafer as in claim 13, wherein the self-contained electrical testing circuit is operative to test etch quality on each metal layer.
Claim 19
Dependent Claim
29 words
An integrated circuit wafer as in claim 13, wherein the self-contained electrical testing circuit is located in a scribe line area between the plurality of generic gate array dies.
Claim 20
Dependent Claim
26 words
An integrated circuit wafer as in claim 13, wherein the self-contained electrical testing circuit is located within an active area of the generic gate array dies.
Claim 21
Dependent Claim
12 words
An integrated circuit wafer as in claim 13, wherein M is four.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-10-17 | 2004-04-17 | 2004-10-17 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-10-17 | 2008-04-17 | 2008-10-17 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-10-17 | 2012-04-17 | 2012-10-17 | $7700.00 | Window Closed / Lapsed |