Self-aligned isolation trench

Claim 2

An isolation trench structure comprising: a semiconductor substrate having a top surface with an oxide layer thereon; a polysilicon layer upon said oxide layer; a first layer upon said polysilicon layer; a plurality of isolation trenches having electrically insulative material extending continuously between and within said plurality of isolation trenches, each said isolation trench: having a spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer and said polysilicon layer; extending from an opening thereto at the top surface of said semiconductor substrate and below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said spacer; having a second layer filling said isolation trench and extending above said oxide layer in contact with said spacer; and having an upper surface formed from said second layer and said spacer and being situated above said oxide layer.

Claim 3

An isolation trench structure as defined in claim 1, wherein: said first layer is substantially composed of a dielectric material; and said second layer is substantially composed of a dielectric material.

Claim 4

An isolation trench structure as defined in claim 1, further comprising: a liner upon a sidewall of said isolation trench that extends from an interface thereof with said oxide layer to the termination of said isolation trench within said semiconductor substrate.

Claim 5

An isolation trench structure as defined in claim 3, wherein: said liner is substantially composed of a dielectric material; and said second layer is substantially composed of an electrically conductive material.

Claim 6

An isolation trench structure as defined in claim 1, further comprising: a doped region below the termination of said isolation trench within said semiconductor substrate.

Claim 7

An isolation trench structure comprising: a semiconductor substrate having a top surface with an oxide layer thereon; a first layer upon said oxide layer; a plurality of isolation trenches having electrically insulative material extending continuously between and within said plurality of isolation trenches, each said isolation trench: having a spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer; extending from an opening thereto at the top surface of said semiconductor substrate and below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said spacer; having a second layer filling said isolation trench and extending above said oxide layer in contact with said spacer; and having an upper surface formed from said second layer and said spacer and being situated above said oxide layer.

Claim 8

An isolation trench structure comprising: a semiconductor substrate having a top surface with an oxide layer thereon; a first layer upon said oxide layer; a plurality of isolation trenches having electrically insulative material extending continuously between and within said plurality of isolation trenches, each said isolation trench: having a spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer; extending from an opening thereto at the top surface of said semiconductor substrate and below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said spacer; having a second layer filling said isolation trench and extending above said oxide layer in contact with said spacer; and having an upper surface formed from said second layer and said spacer and being situated above said oxide layer.

Claim 9

An isolation trench structure as defined in claim 6, wherein: said first layer is substantially composed of a dielectric material; and said second layer is substantially composed of a dielectric material.

Claim 10

An isolation trench structure as defined in claim 6, further comprising: a liner upon a sidewall of said isolation trench that extends from an interface thereof with said oxide layer to the termination of said isolation trench within said semiconductor substrate.

Claim 11

An isolation trench structure as defined in claim 8, wherein: said liner is substantially composed of a dielectric material; and said second layer is substantially composed of an electrically conductive material.

Claim 12

An isolation trench structure as defined in claim 6, further comprising: an electrically active region below the termination of said isolation trench within said semiconductor substrate.

Claim 13

An isolation trench structure as defined in claim 1, wherein the semiconductor substrate is doped with a dopant having a first conductivity type, the isolation trench structure further comprising a doped trench bottom within the semiconductor substrate below and in contact with a respective one of each said isolation trench, the doped trench bottom being doped with a dopant having a second conductivity type opposite the first conductivity type.

Claim 14

An isolation trench structure as defined in claim 11, wherein the doped trench bottom has a width, each said isolation trench has a width, and the width of each said doped trench bottom is greater than the width of the respective isolation trench.

Claim 15

An isolation trench structure as defined in claim 6, wherein the semiconductor substrate is doped with a dopant having a first conductivity type, the isolation trench structure further comprising a doped trench bottom within the semiconductor substrate below and in contact with each said isolation trench, the doped trench bottom being doped with a dopant having a second conductivity type opposite the first conductivity type.

Claim 16

An isolation trench structure as defined in claim 13, wherein each said doped trench bottom has a width, each said isolation trench as a width, and the width of each said doped trench bottom is greater than the respective width of the isolation trench.

Claim 17

An isolation trench structure as defined in claim 3, wherein the liner terminates at a rounded edge at the interface thereof with said oxide layer.

Claim 18

An isolation trench structure comprising: a semiconductor substrate having a top surface with an oxide layer thereon; a polysilicon layer upon said oxide layer; a first layer upon said polysilicon layer; a plurality of isolation trenches having electrically insulative material extending continuously between and within said plurality of isolation trenches, each said isolation trench: having a side wall and extending from an opening thereto at the top surface of said semiconductor substrate and below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said first layer; a second layer of dielectric material filling said isolation trench, extending above said oxide layer in contact with said first layer, and extending above and perpendicular to the side wall of said isolation trench, wherein said isolation trench is filled with electrically insulative material to the exclusion of electrically conductive material; and a planarized upper surface formed from said second layer and said first layer and being situated above said oxide layer.

Claim 19

An isolation trench structure comprising: a semiconductor substrate having a top surface with an oxide layer thereon; a polysilicon layer upon said oxide layer; a first layer upon said polysilicon layer; a plurality of isolation trenches having electrically insulative material extending continuously between and within said plurality of isolation trenches, each said isolation trench: having a side wall and extending from an opening thereto at the top surface of said semiconductor substrate and below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said first layer; a second layer of dielectric material filling said isolation trench, extending above said oxide layer in contact with said first layer, and extending above and perpendicular to the side wall of said isolation trench, wherein said isolation trench is filled with electrically insulative material to the exclusion of electrically conductive material; and a planarized upper surface formed from said second layer and said first layer and being situated above said oxide layer.

Claim 20

An isolation trench structure comprising: a semiconductor substrate having a top surface with an oxide layer thereon; a first layer upon said oxide layer; a plurality of isolation trenches having electrically insulative material extending continuously between and within said plurality of isolation trenches, each said isolation trench: having a side wall and extending from an opening thereto at the top surface of said semiconductor substrate and below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said first layer; a second layer filling said isolation trench and extending above said oxide layer in contact with said first layer, and extending above and perpendicular to the side wall of said isolation trench, wherein said isolation trench is filled with electrically insulative material to the exclusion of electrically conductive material; and a planarized upper surface formed from said second layer and said first layer and being situated above said oxide layer.

Claim 21

An isolation trench structure comprising: a semiconductor substrate having a top surface with an oxide layer thereon; a first layer upon said oxide layer; a plurality of isolation trenches having electrically insulative material extending continuously between and within said plurality of isolation trenches, each said isolation trench: having a side wall and extending from an opening thereto at the top surface of said semiconductor substrate and below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said first layer; a second layer filling said isolation trench and extending above said oxide layer in contact with said first layer, and extending above and perpendicular to the side wall of said isolation trench, wherein said isolation trench is filled with electrically insulative material to the exclusion of electrically conductive material; and a planarized upper surface formed from said second layer and said first layer and being situated above said oxide layer.

Claim 22

An electrical structure comprising: a semiconductor substrate having a top surface with an oxide layer thereon; a polysilicon layer upon said oxide layer; a first layer upon said polysilicon layer; a first isolation area including: a first spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer and said polysilicon layer; a first isolation trench extending from an opening thereto at the top surface of said semiconductor substrate and below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said first spacer, wherein said first spacer is situated on a side of said first isolation trench; a second spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer and said polysilicon layer, said second spacer being situated on a side of said first isolation trench opposite the side of said first spacer; a second isolation area including: a first spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer and said polysilicon layer; a first isolation trench extending below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said first spacer of said second isolation area, wherein said first spacer of said second isolation area is situated on a side of said first isolation trench; a second spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer and said polysilicon layer, said second spacer of said second isolation area being situated on a side of said first isolation trench opposite the side of said first spacer of said second isolation area; an active area located within said semiconductor substrate between said first and second isolation areas; a second layer, composed of an electrically insulative material, filling said first and second isolation trenches and extending continuously therebetween and above said oxide layer in contact with said first and second spacers of said respective first and second isolation areas; and an upper surface formed from said second layer and said first and second spacers of said respective first and second isolation areas, and being situated above said oxide layer.

Claim 23

An electrical structure comprising: a semiconductor substrate having a top surface with an oxide layer thereon; a polysilicon layer upon said oxide layer; a first layer upon said polysilicon layer; a first isolation area including: a first spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer and said polysilicon layer; a first isolation trench extending from an opening thereto at the top surface of said semiconductor substrate and below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said first spacer, wherein said first spacer is situated on a side of said first isolation trench; a second spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer and said polysilicon layer, said second spacer being situated on a side of said first isolation trench opposite the side of said first spacer; a second isolation area including: a first spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer and said polysilicon layer; a first isolation trench extending below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said first spacer of said second isolation area, wherein said first spacer of said second isolation area is situated on a side of said first isolation trench; a second spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer and said polysilicon layer, said second spacer of said second isolation area being situated on a side of said first isolation trench opposite the side of said first spacer of said second isolation area; an active area located within said semiconductor substrate between said first and second isolation areas; a second layer, composed of an electrically insulative material, filling said first and second isolation trenches and extending continuously therebetween and above said oxide layer in contact with said first and second spacers of said respective first and second isolation areas; and an upper surface formed from said second layer and said first and second spacers of said respective first and second isolation areas, and being situated above said oxide layer.

Claim 24

An isolation trench structure comprising: a semiconductor substrate having a top surface with an oxide layer thereon; a first layer upon said oxide layer; a first isolation area including: a first spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer; a first isolation trench extending from an opening thereto at the top surface of said semiconductor substrate and below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said first spacer, wherein said first spacer is situated on a side of said first isolation trench; a second spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer, said second spacer being situated on a side of said first isolation trench opposite the side of said first spacer; a second isolation area including: a first spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer; a first isolation trench extending below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said first spacer of said second isolation area, wherein said first spacer of said second isolation area is situated on a side of said first isolation trench; a second spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer, said second spacer of said second isolation area being situated on a side of said first isolation trench opposite the side of said first spacer of said second isolation area; an active area located within said semiconductor substrate between said first and second isolation areas; a second layer, composed of an electrically insulative material, filling said first and second isolation trenches and extending continuously therebetween and above said oxide layer in contact with said first and second spacers of said respective first and second isolation areas; and an upper surface formed from said second layer and said first and second spacers of said respective first and second isolation areas, and being situated above said oxide layer.

Claim 25

An isolation trench structure comprising: a semiconductor substrate having a top surface with an oxide layer thereon; a first layer upon said oxide layer; a first isolation area including: a first spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer; a first isolation trench extending from an opening thereto at the top surface of said semiconductor substrate and below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said first spacer, wherein said first spacer is situated on a side of said first isolation trench; a second spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer, said second spacer being situated on a side of said first isolation trench opposite the side of said first spacer; a second isolation area including: a first spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer; a first isolation trench extending below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said first spacer of said second isolation area, wherein said first spacer of said second isolation area is situated on a side of said first isolation trench; a second spacer substantially composed of a dielectric material upon said oxide layer in contact with said first layer, said second spacer of said second isolation area being situated on a side of said first isolation trench opposite the side of said first spacer of said second isolation area; an active area located within said semiconductor substrate between said first and second isolation areas; a second layer, composed of an electrically insulative material, filling said first and second isolation trenches and extending continuously therebetween and above said oxide layer in contact with said first and second spacers of said respective first and second isolation areas; and an upper surface formed from said second layer and said first and second spacers of said respective first and second isolation areas, and being situated above said oxide layer.

Claim 26

An electrical structure comprising: a semiconductor substrate having a top surface and being doped with a dopant having a first conductivity type; a plurality of isolation trenches having electrically insulative material extending continuously between and within said plurality of isolation trenches, each said isolation trench: extending from an opening thereto at the top surface of the semiconductor substrate and terminating within said semiconductor substrate; having a doped trench bottom within the semiconductor substrate below and in contact with the isolation trench, the doped trench bottom being doped with a dopant having a second conductivity type opposite the first conductivity type; having a dielectric material filling said isolation trench, having a planarized upper surface and extending above said top surface of said semiconductor substrate, and extending away from said isolation trench upon the top surface of said semiconductor substrate, wherein said isolation trench is filled with electrically insulative material to the exclusion of electrically conductive material.

Claim 27

An electrical structure comprising: a semiconductor substrate having a top surface and being doped with a dopant having a first conductivity type; a plurality of isolation trenches having electrically insulative material extending continuously between and within said plurality of isolation trenches, each said isolation trench: extending from an opening thereto at the top surface of the semiconductor substrate and terminating within said semiconductor substrate; having a doped trench bottom within the semiconductor substrate below and in contact with the isolation trench, the doped trench bottom being doped with a dopant having a second conductivity type opposite the first conductivity type; having a dielectric material filling said isolation trench, having a planarized upper surface and extending above said top surface of said semiconductor substrate, and extending away from said isolation trench upon the top surface of said semiconductor substrate, wherein said isolation trench is filled with electrically insulative material to the exclusion of electrically conductive material.

Claim 28

The electrical structure as defined in claim 20, wherein the dielectric material has a planar upper surface.

Claim 29

The electrical structure as defined in claim 20, further comprising an active area within the semiconductor substrate in contact with the isolation trench.

Claim 30

An electrical structure comprising: a semiconductor substrate having a top surface and being doped with a dopant having a first conductivity type; a first isolation area including: an isolation trench extending from an opening thereto at the top surface of the semiconductor substrate and terminating within said semiconductor substrate; a doped trench bottom within the semiconductor substrate below and in contact with the isolation trench of the first isolation area, the doped trench bottom being doped with a dopant having a second conductivity type opposite the first conductivity type; a dielectric material filling said isolation trench of the first isolation area to the exclusion of electrically conductive material, having a planarized upper surface and extending above said top surface of said semiconductor substrate, and extending away from said isolation trench of the first isolation area upon the top surface of said semiconductor substrate; a second isolation area including: an isolation trench extending below the top surface of the semiconductor substrate and terminating within said semiconductor substrate; a doped trench bottom within the semiconductor substrate below and in contact with the isolation trench of the second isolation area, the doped trench bottom being doped with a dopant having a second conductivity type opposite the first conductivity type; a dielectric material filling said isolation trench of the second isolation area to the exclusion of electrically conductive material, having a planarized upper surface and extending above said top surface of said semiconductor substrate, and extending away from said isolation trench upon the top surface of said semiconductor substrate; an active area located within said semiconductor substrate between said first and second isolation areas, and wherein electrically insulative material extends continuously between and within said first and second isolation trenches of said respective first and second isolation areas.

Claim 31

An electrical structure comprising: a semiconductor substrate having a top surface and being doped with a dopant having a first conductivity type; a first isolation area including: an isolation trench extending from an opening thereto at the top surface of the semiconductor substrate and terminating within said semiconductor substrate; a doped trench bottom within the semiconductor substrate below and in contact with the isolation trench of the first isolation area, the doped trench bottom being doped with a dopant having a second conductivity type opposite the first conductivity type; a dielectric material filling said isolation trench of the first isolation area to the exclusion of electrically conductive material, having a planarized upper surface and extending above said top surface of said semiconductor substrate, and extending away from said isolation trench of the first isolation area upon the top surface of said semiconductor substrate; a second isolation area including: an isolation trench extending below the top surface of the semiconductor substrate and terminating within said semiconductor substrate; a doped trench bottom within the semiconductor substrate below and in contact with the isolation trench of the second isolation area, the doped trench bottom being doped with a dopant having a second conductivity type opposite the first conductivity type; a dielectric material filling said isolation trench of the second isolation area to the exclusion of electrically conductive material, having a planarized upper surface and extending above said top surface of said semiconductor substrate, and extending away from said isolation trench upon the top surface of said semiconductor substrate; an active area located within said semiconductor substrate between said first and second isolation areas, and wherein electrically insulative material extends continuously between and within said first and second isolation trenches of said respective first and second isolation areas.

Claim 32

The electrical structure as defined in claim 23, wherein the active area is in contact with the respective isolation trenches of the first and second isolation areas.

Claim 33

An isolation trench structure comprising: a semiconductor substrate having an oxide layer thereon; an electrically conductive material upon said oxide layer; a first layer upon said electrically conductive material; a plurality of isolation trenches having electrically insulative material extending continuously between and within said plurality of isolation trenches, each said isolation trench: having a pair of spacers having a minimum width therebetween and being substantially composed of a dielectric material and situated upon said oxide layer in contact with said first layer and said electrically conductive material; extending below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said pair of spacers, said isolation trench having a width not greater than the minimum width between the pair of spacers; having a second layer filling said isolation trench and extending above said oxide layer in contact with said spacer; and having an upper surface formed from said second layer and said pair of spacers and being situated above said oxide layer.

Claim 34

An isolation trench structure comprising: a semiconductor substrate having an oxide layer thereon; an electrically conductive material upon said oxide layer; a first layer upon said electrically conductive material; a plurality of isolation trenches having electrically insulative material extending continuously between and within said plurality of isolation trenches, each said isolation trench: having a pair of spacers having a minimum width therebetween and being substantially composed of a dielectric material and situated upon said oxide layer in contact with said first layer and said electrically conductive material; extending below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said pair of spacers, said isolation trench having a width not greater than the minimum width between the pair of spacers; having a second layer filling said isolation trench and extending above said oxide layer in contact with said spacer; and having an upper surface formed from said second layer and said pair of spacers and being situated above said oxide layer.

Claim 35

The isolation trench structure as defined in claim 25, wherein the upper surface formed from said second layer and said pair of spacers is planarized.

Claim 36

An isolation trench structure comprising: a semiconductor substrate having an oxide layer thereon; a first layer upon said oxide layer; a plurality of isolation trenches having electrically insulative material extending continuously between and within said plurality of isolation trenches, each said isolation trench: having a pair of spacers having a minimum width therebetween and being composed of a dielectric material and situated upon said oxide layer in contact with said first layer; extending below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said pair of spacers, said isolation trench having a width not greater than the minimum width between the pair of spacers; a second layer filling said isolation trench and extending above said oxide layer in contact with said spacer; and an upper surface formed from said second layer and said pair of spacers and being situated above said oxide layer.

Claim 37

An isolation trench structure comprising: a semiconductor substrate having an oxide layer thereon; a first layer upon said oxide layer; a plurality of isolation trenches having electrically insulative material extending continuously between and within said plurality of isolation trenches, each said isolation trench: having a pair of spacers having a minimum width therebetween and being composed of a dielectric material and situated upon said oxide layer in contact with said first layer; extending below said oxide layer into and terminating within said semiconductor substrate adjacent to and below said pair of spacers, said isolation trench having a width not greater than the minimum width between the pair of spacers; a second layer filling said isolation trench and extending above said oxide layer in contact with said spacer; and an upper surface formed from said second layer and said pair of spacers and being situated above said oxide layer.

Claim 38

The isolation trench structure as defined in claim 27, wherein the upper surface formed from said second layer and said pair of spacers is planarized.

Claim 39

An isolation trench structure comprising: a semiconductor substrate having a top surface with an oxide layer thereon; a polysilicon layer upon said oxide layer; a first layer upon said polysilicon layer; a plurality of isolation trenches having electrically insulative material extending continuously between and within said plurality of isolation trenches, each said isolation trench: having side walls and a width therebetween, the isolation trench extending between a pair of spacers at an opening thereto at the top surface of said semiconductor substrate and below said oxide layer, the isolation trench further extending into and terminating within said semiconductor substrate adjacent to and below said first layer, said pair of spacers having a minimum width therebetween that is not less than the width between said side walls; having a second layer of dielectric material filling said isolation trench, extending above said oxide layer in contact with said first layer, and extending above and perpendicular to the side walls of said isolation trench; and having a upper surface formed from said second layer and said first layer and being situated above said oxide layer.

Claim 40

An isolation trench structure comprising: a semiconductor substrate having a top surface with an oxide layer thereon; a polysilicon layer upon said oxide layer; a first layer upon said polysilicon layer; a plurality of isolation trenches having electrically insulative material extending continuously between and within said plurality of isolation trenches, each said isolation trench: having side walls and a width therebetween, the isolation trench extending between a pair of spacers at an opening thereto at the top surface of said semiconductor substrate and below said oxide layer, the isolation trench further extending into and terminating within said semiconductor substrate adjacent to and below said first layer, said pair of spacers having a minimum width therebetween that is not less than the width between said side walls; having a second layer of dielectric material filling said isolation trench, extending above said oxide layer in contact with said first layer, and extending above and perpendicular to the side walls of said isolation trench; and having a upper surface formed from said second layer and said first layer and being situated above said oxide layer.

Claim 41

The isolation trench structure as defined in claim 29, wherein the upper surface formed from said second layer and said spacer is planarized.

Claim 42

An isolation trench structure comprising: a semiconductor substrate having a top surface with an oxide layer thereon; a first layer upon said oxide layer; a plurality of isolation trenches, wherein electrically insulative material extends continuously between and within each said isolation trench, each said isolation trench having: a pair of side walls with a width therebetween, the isolation trench extending between a pair of spacers and having from an opening thereto at the top surface of said semiconductor substrate and below said oxide layer, the isolation trench further extending into and terminating within said semiconductor substrate adjacent to and below said first layer, said pair of spacers having a minimum width therebetween that is not less than the width between said side walls; a second layer filling said isolation trench and extending above said oxide layer in contact with said first layer, and extending above and perpendicular to the side wall of said isolation trench; and an upper surface formed from said second layer and said first layer and being situated above said oxide layer.

Claim 43

An isolation trench structure comprising: a semiconductor substrate having a top surface with an oxide layer thereon; a first layer upon said oxide layer; a plurality of isolation trenches, wherein electrically insulative material extends continuously between and within each said isolation trench, each said isolation trench having: a pair of side walls with a width therebetween, the isolation trench extending between a pair of spacers and having from an opening thereto at the top surface of said semiconductor substrate and below said oxide layer, the isolation trench further extending into and terminating within said semiconductor substrate adjacent to and below said first layer, said pair of spacers having a minimum width therebetween that is not less than the width between said side walls; a second layer filling said isolation trench and extending above said oxide layer in contact with said first layer, and extending above and perpendicular to the side wall of said isolation trench; and an upper surface formed from said second layer and said first layer and being situated above said oxide layer.

Claim 44

The isolation trench structure as defined in claim 31, wherein the upper surface formed from said second layer and said spacer is planarized.

Claim 45

An electrical structure comprising: a semiconductor substrate having a top surface and being doped with a dopant having a first conductivity type; a plurality of isolation trenches, wherein electrically insulative material extends continuously between and within each said isolation trench, each said isolation trench having: a width and extending between a pair of spacers, an opening thereto at the top surface of the semiconductor substrate and terminating within said semiconductor substrate, the pair of spacers having a minimum width therebetween, the width of said isolation trench being not greater than the minimum width between said pair of spacers; a doped trench bottom within the semiconductor substrate below and in contact with the isolation trench, the doped trench bottom being doped with a dopant having a second conductivity type opposite the first conductivity type; a dielectric material filling said isolation trench, having an upper surface and extending above said top surface of said semiconductor substrate, and extending away from said isolation trench upon the top surface of said semiconductor substrate.

Claim 46

An electrical structure comprising: a semiconductor substrate having a top surface and being doped with a dopant having a first conductivity type; a plurality of isolation trenches, wherein electrically insulative material extends continuously between and within each said isolation trench, each said isolation trench having: a width and extending between a pair of spacers, an opening thereto at the top surface of the semiconductor substrate and terminating within said semiconductor substrate, the pair of spacers having a minimum width therebetween, the width of said isolation trench being not greater than the minimum width between said pair of spacers; a doped trench bottom within the semiconductor substrate below and in contact with the isolation trench, the doped trench bottom being doped with a dopant having a second conductivity type opposite the first conductivity type; a dielectric material filling said isolation trench, having an upper surface and extending above said top surface of said semiconductor substrate, and extending away from said isolation trench upon the top surface of said semiconductor substrate.

Claim 47

The isolation trench structure as defined in claim 33, wherein the upper surface formed from said second layer and said spacer is planarized.

Claim 48

The isolation trench structure as defined in claim 1, wherein the upper surface formed from said second layer and said spacer is planarized.

Claim 49

The isolation trench structure as defined in claim 6, wherein the upper surface formed from said second layer and said spacer is planarized.

Claim 50

The isolation trench structure as defined in claim 18, wherein the upper surface formed from said second layer and said first and second spacers of said respective first and second isolation areas is planarized.

Claim 51

The isolation trench structure as defined in claim 19, wherein the upper surface formed from said second layer and said first and second spacers of said respective first and second isolation areas is planarized.

Claim 52

The isolation trench structure as defined in claim 23, wherein the dielectric material filling said first isolation trench and the dielectric material filling the said second isolation trench are co-planar.

Claim 53

An electrical structure comprising: a semiconductor substrate having a top surface; first and second isolation trenches each: extending into and being defined by the semiconductor substrate; having an opening thereto at the top surface of the semiconductor substrate; and extending below and being centered between a pair of spacers situated above the top surface of the semiconductor substrate; and wherein: an electrically insulative material extends continuously between and within the first and second isolation trenches; and a planar surface begins at the first isolation trench and extends continuously to the second isolation trench.

Claim 54

An electrical structure comprising: a semiconductor substrate having a top surface; first and second isolation trenches each: extending into and being defined by the semiconductor substrate; having an opening thereto at the top surface of the semiconductor substrate; and extending below and being centered between a pair of spacers situated above the top surface of the semiconductor substrate; and wherein: an electrically insulative material extends continuously between and within the first and second isolation trenches; and a planar surface begins at the first isolation trench and extends continuously to the second isolation trench.