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US6048647A Expired / Lapsed US ⏱️ 0.0 years remaining

Phase shift mask of attenuation type and manufacturing method thereof

Assignee: Renesas Electronics Corp
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Filing: 1997-11-07
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Granted: 2000-04-11
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Expires: 2017-11-07
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Abstract

Abstract In accordance with a phase shift mask of attenuation type and a manufacturing method thereof, at a prescribed region of a phase shifter portion near and around a light transmitting portion, an auxiliary pattern is provided for controlling an amount of exposure light onto a portion of an exposed material corresponding to this region. Auxiliary pattern enables to cancel light intensity of a side lobe, thereby preventing generation of a region having a high light intensity (a side lobe) at the periphery of the light transmitting portion of the phase shift mask of attenuation type.

Inventors

  • 👤 Junji Miyazaki
  • 👤 Akihiro Nakae
  • 👤 Nobuyuki Yoshioka
  • 👤 Hidehiko Kozawa

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-08 11:24
CPC Classifications
G; G03; G03F; G03F1/00; G03F1/26; G03F1/32; G03F1/36

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 121 words
A phase shift mask of the attenuation type, comprising: a first light transmitting portion formed of a semi-transparent film at a prescribed location on a photomask substrate, for controlling transmittance and phase of exposure light passing therethrough; a second light transmitting portion comprising openings formed in said semi-transparent film and surrounded by said first light transmitting portion for exposing a surface of said photomask substrate; and an auxiliary pattern formed within said first light transmitting portion and comprising a light shielding pattern having an area smaller than the area of said second light transmitting portion, said auxiliary pattern provided at a portion where a side lobe image generated by the exposure light transmitted through the first light transmitting portion is cancelled.
Claim 2
Dependent Claim 121 words
A phase shift mask of the attenuation type, comprising: a first light transmitting portion formed of a semi-transparent film at a prescribed location on a photomask substrate, for controlling transmittance and phase of exposure light passing therethrough; a second light transmitting portion comprising openings formed in said semi-transparent film and surrounded by said first light transmitting portion for exposing a surface of said photomask substrate; and an auxiliary pattern formed within said first light transmitting portion and comprising a light shielding pattern having an area smaller than the area of said second light transmitting portion, said auxiliary pattern provided at a portion where a side lobe image generated by the exposure light transmitted through the first light transmitting portion is cancelled.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2003-04-11 2003-10-11 2004-04-11 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2007-04-11 2007-10-11 2008-04-11 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2011-04-11 2011-10-11 2012-04-11 $7700.00 Window Closed / Lapsed

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