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Process for releasing a thin-film structure from a substrate

Assignee: International Business Machines Corp
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Filing: 1999-02-16
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Granted: 2000-03-14
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Expires: 2019-02-16
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Abstract

Abstract A process for fabricating and releasing a thin-film structure from a primary carrier for further processing. The thin-film structure is built on a metal interconnect disposed on a dielectric layer which, in turn, is deposited on a primary carrier. The thin-film structure and metal interconnect are released from the dielectric layer and primary carrier along a release interface defined between the metal interconnect and the dielectric film. Release is accomplished by disturbing the interface, either by laser ablation or dicing. The process of the present invention has at least three, specific applications: (1) the thin-film structure and metal interconnect can be released to yield a free-standing film; (2) the thin-film structure and metal interconnect can be laminated onto a permanent substrate (when building top-side down structures) and then released; and (3) the thin-film structure can be transferred to a secondary temporary carrier (when building top-side up structures) for further processing and testing, then transferred to a permanent substrate before releasing the thin-film structure and metal interconnect.

Inventors

  • 👤 Kimberley A. Kelly
  • 👤 Ashwani K. Malhotra
  • 👤 Eric D. Perfecto
  • 👤 Roy Yu

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 12:09
CPC Classifications
B; B32; B32B; B32B43/00; H; H05; H05K; H05K3/00; H05K3/02; H05K3/022; H05K3/025; H05K3/46; H05K3/4611; H05K3/4614; H10; H10P; H10P72/00; H10P72/70; H10P72/74; B32B2310/00; B32B2310/08; B32B2310/0806; B32B2310/0843; B32B2311/00; H05K2201/00; H05K2201/09; H05K2201/09209; H05K2201/095; H05K2201/09509; H05K2201/09527; H05K2201/10; H05K2201/10613; H05K2201/10621; H05K2201/10666; H05K2203/00; H05K2203/01; H05K2203/0147; H05K2203/016; H05K2203/10; H05K2203/107; H05K3/007; H05K3/22; H05K3/28; H05K3/4623; H05K3/4644; H05K3/467; H10P72/7424; H10P72/743; H10P72/7432; Y; Y10; Y10S; Y10S156/00; Y10S156/918; Y10S156/919; Y10S156/922; Y10S438/00; Y10S438/94; Y10S438/974; Y10S438/977; Y10T; Y10T156/00; Y10T156/11; Y10T156/1153; Y10T156/1158; Y10T428/00; Y10T428/12; Y10T428/12493; Y10T428/12528; Y10T428/12535; Y10T428/12583

Claims Analysis

Total Claims: 17
Claim 1
Independent Claim 78 words
A process for releasing a thin-film structure from a primary carrier comprising the steps of: a) providing a primary carrier; b) applying a dielectric film on the primary carrier; c) depositing a metal interconnect on the dielectric film; d) forming a thin-film structure on the metal interconnect; and e) releasing the thin-film structure and the metal interconnect from the primary carrier and the dielectric film along a release interface defined between the metal interconnect and the dielectric film.
Claim 2
Dependent Claim 78 words
A process for releasing a thin-film structure from a primary carrier comprising the steps of: a) providing a primary carrier; b) applying a dielectric film on the primary carrier; c) depositing a metal interconnect on the dielectric film; d) forming a thin-film structure on the metal interconnect; and e) releasing the thin-film structure and the metal interconnect from the primary carrier and the dielectric film along a release interface defined between the metal interconnect and the dielectric film.
Claim 3
Dependent Claim 30 words
The process of claim 1 wherein the step of forming the thin-film structure includes providing at least one dielectric layer and applying at least one wiring path of metallic material.
Claim 4
Dependent Claim 11 words
The process of claim 1 wherein the primary carrier is glass.
Claim 5
Dependent Claim 11 words
The process of claim 1 wherein the dielectric film is polyimide.
Claim 6
Dependent Claim 53 words
The process of claim 1 wherein the step of releasing the thin-film structure and the metal interconnect from the primary carrier and the dielectric film includes dicing the thin-film structure, metal interconnect, primary carrier, and dielectric film then separating the thin-film structure and metal interconnect from the primary carrier and the dielectric film.
Claim 7
Dependent Claim 43 words
The process of claim 1 wherein the step of releasing the thin-film structure and the metal interconnect from the primary carrier and the dielectric film includes ablating the dielectric film by directing coherent electromagnetic radiation onto the dielectric film through the thin-film structure.
Claim 8
Dependent Claim 16 words
The process of claim 6 wherein a laser is the source of the coherent electromagnetic radiation.
Claim 9
Dependent Claim 13 words
The process of claim 1 wherein the metal interconnect includes chromium and copper.
Claim 10
Dependent Claim 17 words
The process of claim 8 wherein the metal interconnect is a trilayer of chromium, copper, and chromium.
Claim 11
Dependent Claim 24 words
The process of claim 9 wherein the metal interconnect consists of 200-1,000 Å of chromium, 2 μm of copper, and 200-1,000 Å of chromium.
Claim 12
Dependent Claim 90 words
A process for releasing a thin-film structure from a primary carrier comprising the steps of: a) providing a glass plate primary carrier; b) applying and curing a polyimide dielectric film on the primary carrier; c) depositing a chromium, copper, chromium trilayer metal interconnect on the polyimide dielectric film; d) forming a multi-layer thin-film structure on the metal interconnect; and e) releasing the multi-layer thin-film structure and the metal interconnect from the primary carrier and the dielectric film along a release interface defined between the metal interconnect and the dielectric film.
Claim 13
Dependent Claim 90 words
A process for releasing a thin-film structure from a primary carrier comprising the steps of: a) providing a glass plate primary carrier; b) applying and curing a polyimide dielectric film on the primary carrier; c) depositing a chromium, copper, chromium trilayer metal interconnect on the polyimide dielectric film; d) forming a multi-layer thin-film structure on the metal interconnect; and e) releasing the multi-layer thin-film structure and the metal interconnect from the primary carrier and the dielectric film along a release interface defined between the metal interconnect and the dielectric film.
Claim 14
Dependent Claim 32 words
The process of claim 11 wherein the step of forming the multi-layer thin-film structure includes sequentially providing at least two dielectric layers and applying at least two wiring paths of metallic material.
Claim 15
Dependent Claim 56 words
The process of claim 11 wherein the step of releasing the multi-layer thin-film structure and the metal interconnect from the primary carrier and the dielectric film includes dicing the multi-layer thin-film structure, metal interconnect, primary carrier, and dielectric film then separating the multi-layer thin-film structure and metal interconnect from the primary carrier and the dielectric film.
Claim 16
Dependent Claim 45 words
The process of claim 11 wherein the step of releasing the multi-layer thin-film structure and the metal interconnect from the primary carrier and the dielectric film includes ablating the dielectric film by directing coherent electromagnetic radiation onto the dielectric film through the multi-layer thin-film structure.
Claim 17
Dependent Claim 24 words
The process of claim 11 wherein the metal interconnect consists of 200-1,000 Å of chromium, 2 μm of copper, and 200-1,000 Å of chromium.

References Cited (Backward Citations)

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EP0481736A2 Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2003-03-14 2003-09-13 2004-03-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2007-03-14 2007-09-13 2008-03-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2011-03-14 2011-09-13 2012-03-14 $7700.00 Window Closed / Lapsed

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