Patent US5936976A successfully refreshed from Google Patents.
US5936976A
Expired / Lapsed
US
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Selecting a test data input bus to supply test data to logical blocks within an integrated circuit
Assignee: NXP BV
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Filing: 1997-07-25
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Granted: 1999-08-10
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Expires: 2017-07-25
Abstract
Abstract A testing apparatus and method are for testing a plurality of logic blocks within an integrated circuit. The integrated circuit includes a test data input bus, a test data output bus coupled to the output of each logic block, and test enable means which includes selection means coupled between the plurality of logic blocks and the test data input bus. The test enable means selects a first logic block from the plurality of logic blocks, and the selection means selectively inputs to each logic block either normal operating input or the test data. The test results are received from the first logic block through the test data output bus.
Inventors
- 👤 Franklyn H. Story
- 👤 Koichi Eugene Nomura
- 👤 Michael James Fickes
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-07 20:12
CPC Classifications
G; G11; G11C; G11C29/00; G11C29/04; G11C29/08; G11C29/12; G11C29/18
Claims Analysis
Total Claims: 21
Claim 1
Independent Claim
167 words
Testing apparatus for testing a plurality of logic blocks within an integrated circuit, the testing apparatus comprising the following elements contained within the integrated circuit: a test data input bus; a test data output bus coupled to output of each logic block from the plurality of logic blocks for receiving test results therefrom; test data input register means holding test data, coupled to the test data input bus, for supplying test data thereto; and, test enable means, coupled between each logic block from the plurality of logic blocks and said test data input bus, for selecting a first logic block from the plurality of logic blocks and inputting to the first logic block the test data held in the test data input register means from the test data input bus, the test enable means including; selection means, coupled to the plurality of logic blocks for selectively inputting to each logic block either normal operating input or the test data held in the test data input register means.
Claim 2
Dependent Claim
167 words
Testing apparatus for testing a plurality of logic blocks within an integrated circuit, the testing apparatus comprising the following elements contained within the integrated circuit: a test data input bus; a test data output bus coupled to output of each logic block from the plurality of logic blocks for receiving test results therefrom; test data input register means holding test data, coupled to the test data input bus, for supplying test data thereto; and, test enable means, coupled between each logic block from the plurality of logic blocks and said test data input bus, for selecting a first logic block from the plurality of logic blocks and inputting to the first logic block the test data held in the test data input register means from the test data input bus, the test enable means including; selection means, coupled to the plurality of logic blocks for selectively inputting to each logic block either normal operating input or the test data held in the test data input register means.
Claim 3
Dependent Claim
69 words
Testing apparatus as in claim 1 additionally comprising: a test data output register, coupled to the test data output bus, for receiving test results; wherein the test enable means additionally selects the first logic block from the plurality of logic blocks to supply the test results received by the test data output register, the test data being transferred from the first logic block through the test data output bus.
Claim 4
Dependent Claim
91 words
Testing apparatus as in claim 2 additionally comprising selection means, coupled to the plurality of logic blocks for selectively inputting to each logic block either normal operating input or the test data held in the test data input register means, wherein the selection means includes: a plurality of multiplexers, each multiplexer being coupled to input of a logic block from the plurality of logic blocks, each multiplexer selecting for input to the logic block either the normal operating input or the test data held in the test data input register means.
Claim 5
Dependent Claim
57 words
Testing apparatus as in claim 3 wherein the test enable means additionally comprises: a plurality of tri-state means, each tri-state means being coupled to output of an associated logic block from the plurality of logic blocks, each tri-state selecting whether output from the associated logic block supplies the test results received by the test data output register.
Claim 6
Dependent Claim
51 words
Testing apparatus as in claim 4 wherein the testing apparatus additionally comprises: a test mode register which contains a plurality of control bits, each control bit being coupled through a line to control both a multiplexer from the plurality of multiplexers and a tri-state means from the plurality of tri-state means.
Claim 7
Dependent Claim
35 words
Testing apparatus as in claim 5 wherein the test mode register, the test data input register means and the test data output register are each coupled to an internal data bus for the integrated circuit.
Claim 8
Dependent Claim
57 words
Testing apparatus as in claim 1 wherein the selection means includes: a plurality of multiplexers, each multiplexer being coupled to input of a logic block from the plurality of logic blocks, each multiplexer selecting for input to the logic block either the normal operating input or the test data held in the test data input register means.
Claim 9
Dependent Claim
40 words
Testing apparatus as in claim 7 wherein the testing apparatus additionally comprises: a test mode register which contains a plurality of control bits, each control bit being coupled through a line to control a multiplexer from the plurality of multiplexer.
Claim 10
Dependent Claim
40 words
Testing apparatus as in claim 1 additionally comprising selection means, coupled to the plurality of logic blocks for selectively inputting to each logic block either normal operating input or the test data held in the test data input register means.
Claim 11
Dependent Claim
29 words
Testing apparatus as in claim 1 wherein the test enable means is coupled between each logic block from the plurality of logic blocks and the test data input bus.
Claim 12
Independent Claim
109 words
A method for testing a plurality of logic blocks within an integrated circuit, the integrated circuit comprises a test data input bus, a test data output bus coupled to the output of each logic block, test enable means including selection means coupled between the plurality of logic blocks and the test data input bus, the method comprising the steps of: selecting, by the test enable means, a first logic block from the plurality of logic blocks and selectively inputting, by said selection means, to each logic block either normal operating input or test data; and receiving test results from the first logic block through the test data output bus.
Claim 13
Independent Claim
109 words
A method for testing a plurality of logic blocks within an integrated circuit, the integrated circuit comprises a test data input bus, a test data output bus coupled to the output of each logic block, test enable means including selection means coupled between the plurality of logic blocks and the test data input bus, the method comprising the steps of: selecting, by the test enable means, a first logic block from the plurality of logic blocks and selectively inputting, by said selection means, to each logic block either normal operating input or test data; and receiving test results from the first logic block through the test data output bus.
Claim 14
Dependent Claim
18 words
A method as in claim 11 wherein the test data is transferred from a test data input register.
Claim 15
Dependent Claim
24 words
A method as in claim 11 wherein the test results are received from a test data output bus into a test data output register.
Claim 16
Dependent Claim
13 words
A method as in claim 11 wherein the selection means is a multiplexer.
Claim 17
Dependent Claim
26 words
A method as in claim 11 further comprising the step of: providing a tri-state gate for connecting the test results to the test data output bus.
Claim 18
Dependent Claim
28 words
A method as in claim 14 further comprising the step of: using a control bit from a test mode register to control the multiplexer and the tri-state gate.
Claim 19
Dependent Claim
24 words
A method as in claim 14 further comprising the step of using a control bit from a test mode register to control the multiplexer.
Claim 20
Independent Claim
217 words
A method for testing a plurality of logic blocks within an integrated circuit, the method comprising the steps of: (a) selecting a first logic block from the plurality of logic blocks to receive test data; (b) selectively transferring normal operating input or the test data to the first logic block from a test data input bus to each of the logic blocks, the test data input bus being dedicated to transferring the normal operating input and the test data to the plurality of logic blocks; and, (c) receiving test results from the first logic block from a test data output bus, the test data output bus being dedicated to receiving test data from the plurality of logic blocks; wherein: in step (b) the test data is transferred from an internal data bus for the integrated circuit into a test data input register, and from the test data input register to the test data input bus; in step (c) the test results are received from the test data output bus into a test data output register, and from the test data output register onto the internal data bus for the integrated circuit; and, the integrated circuit comprises said test data input bus, said test data output bus, said test data input register, and said test data output register.
Claim 21
Independent Claim
217 words
A method for testing a plurality of logic blocks within an integrated circuit, the method comprising the steps of: (a) selecting a first logic block from the plurality of logic blocks to receive test data; (b) selectively transferring normal operating input or the test data to the first logic block from a test data input bus to each of the logic blocks, the test data input bus being dedicated to transferring the normal operating input and the test data to the plurality of logic blocks; and, (c) receiving test results from the first logic block from a test data output bus, the test data output bus being dedicated to receiving test data from the plurality of logic blocks; wherein: in step (b) the test data is transferred from an internal data bus for the integrated circuit into a test data input register, and from the test data input register to the test data input bus; in step (c) the test results are received from the test data output bus into a test data output register, and from the test data output register onto the internal data bus for the integrated circuit; and, the integrated circuit comprises said test data input bus, said test data output bus, said test data input register, and said test data output register.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2002-08-09 | 2003-02-08 | 2003-08-10 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2006-08-09 | 2007-02-08 | 2007-08-10 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2010-08-09 | 2011-02-08 | 2011-08-10 | $7700.00 | Window Closed / Lapsed |