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Chemical vapor deposition of W-Si-N and W-B-N

Assignee: California Institute of Technology
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Filing: 1996-10-01
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Granted: 1999-06-29
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Expires: 2016-10-01
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Abstract

Abstract A method of depositing a ternary, refractory based thin film on a substrate by chemical vapor deposition employing precursor sources of tungsten comprising WF6, either silicon or boron, and nitrogen. The result is a W-Si-N or W-B-N thin film useful for diffusion barrier and micromachining applications.

Inventors

  • 👤 James G. Fleming
  • 👤 Elizabeth Lynn Roherty-Osmun
  • 👤 Paul M. Smith
  • 👤 Jonathan S. Custer
  • 👤 Ronald V. Jones
  • 👤 Marc-A. Nicolet
  • 👤 Roland Madar
  • 👤 Claude Bernard

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 13:03
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/032; H10W20/033; C; C23; C23C; C23C16/00; C23C16/22; C23C16/30; C23C16/34

Claims Analysis

Total Claims: 13
Claim 1
Independent Claim 77 words
A method of depositing a ternary, refractory based thin film on a substrate, the method comprising the steps of: a) providing a precursor source of tungsten comprising WF 6 ; b) providing a precursor source of an element selected from the group consisting of silicon and boron; c) providing a precursor source of nitrogen; and d) depositing, by chemical vapor deposition employing the three precursors, a thin film selected from the group consisting of W--Si--N and W--B--N.
Claim 2
Independent Claim 77 words
A method of depositing a ternary, refractory based thin film on a substrate, the method comprising the steps of: a) providing a precursor source of tungsten comprising WF 6 ; b) providing a precursor source of an element selected from the group consisting of silicon and boron; c) providing a precursor source of nitrogen; and d) depositing, by chemical vapor deposition employing the three precursors, a thin film selected from the group consisting of W--Si--N and W--B--N.
Claim 3
Dependent Claim 16 words
The method of claim 1 additionally comprising the step of providing a substantially inert carrier gas.
Claim 4
Dependent Claim 16 words
The method of claim 2 wherein the step of providing a carrier gas comprises providing argon.
Claim 5
Dependent Claim 49 words
The method of claim 1 wherein the step of providing a precursor source of an element selected from the group consisting of silicon and boron comprises providing a compound selected from the group consisting of SiH 4 , Si 2 H 6 , and B 2 H 6 .
Claim 6
Dependent Claim 20 words
The method of claim 1 wherein the step of providing a precursor source of nitrogen comprises providing NH 3 .
Claim 7
Dependent Claim 28 words
The method of claim 1 wherein the depositing step comprises conducting the chemical vapor deposition at a temperature between approximately 200 degrees C. and approximately 400 degrees C.
Claim 8
Dependent Claim 20 words
The method of claim 6 wherein the depositing step comprises conducting the chemical vapor deposition at approximately 350 degrees C.
Claim 9
Dependent Claim 26 words
The method of claim 1 wherein the depositing step results in a film having a step coverage of the substrate of greater than approximately 80 percent.
Claim 10
Dependent Claim 24 words
The method of claim 8 wherein the depositing step results in a film having a step coverage of the substrate of approximately 100 percent.
Claim 11
Dependent Claim 23 words
The method of claim 1 wherein the depositing step results in a film having a resistivity of between approximately 200 and 20,000 μΩ-cm.
Claim 12
Dependent Claim 20 words
The method of claim 1 wherein the depositing step results in a film which is substantially uniform through its bulk.
Claim 13
Dependent Claim 23 words
The method of claim 1 wherein the depositing step results in a film which comprises between approximately 20 percent and 60 percent tungsten.

References Cited (Backward Citations)

US4640004A Cited
US5276405A Cited
US5278100A Cited
US5254499A Cited
US5416045A Cited
US5344792A Cited
US5369300A Cited
US5378501A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2002-06-28 2002-12-28 2003-06-29 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2006-06-28 2006-12-28 2007-06-29 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2010-06-28 2010-12-28 2011-06-29 $7700.00 Window Closed / Lapsed

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