US5416045A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for chemical vapor depositing a titanium nitride layer on a semiconductor wafer and method of annealing tin films
Assignee: Micron Technology Inc
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Filing: 1993-02-18
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Granted: 1995-05-16
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Expires: 2013-02-18
Abstract
Abstract A method of chemical vapor depositing a titanium nitride layer on a semiconductor wafer within a chemical vapor deposition reactor includes: a) positioning a wafer within a chemical vapor deposition reactor; b) injecting gaseous TiCl 4 , NH 3 and N 2 to within the reactor; and c) maintaining the reactor at a selected pressure and a selected temperature which are effective for reacting the TiCl 4 and NH 3 to deposit a uniform film comprising titanium nitride on the wafer, the selected temperature being less than or equal to about 500° C. With a TiN film outwardly exposed, a wafer is annealed by the sequential steps of, a) rapid thermal processing the wafer having the outwardly exposed TiN film to a temperature from about 580° C. to about 700° C.; b) exposing the wafer to NH 3 gas at a temperature from about 580° C. to about 700° C. for at least about 5 seconds to drive chlorine from the TiN film; c) rapid thermal processing the wafer to a temperature of at least about 780° C.; and d) exposing the wafer to N 2 gas at a temperature of at least about 780° C. for at least about 10 seconds.
Inventors
- 👤 Ralph E. Kauffman
- 👤 Michael J. Prucha
- 👤 James Beck
- 👤 Randhir P. S. Thakur
- 👤 Annette L. Martin
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 15:47
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/032; H10W20/047; H10W20/048; C; C30; C30B; C30B29/00; C30B29/10; C30B29/38; C30B33/00; H10W20/033; Y; Y10; Y10S; Y10S438/00; Y10S438/909
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
133 words
A method of annealing a wafer having an outwardly exposed TiN film containing undesired chlorine atoms to drive chlorine atoms from the film and reduce electrical resistance of the film, the method comprising the following sequential steps: a) rapid thermal processing the wafer having the outwardly exposed TiN film to a temperature from 580° C. to 700° C.; b) exposing the wafer to NH 3 gas at a temperature from 580° C. to 700° C. for at least 5 seconds; c) rapid thermal processing the wafer to a temperature of at least 780° C. effective to drive chlorine from the film; and d) exposing the wafer to N 2 gas at a temperature of at least 780° C. for at least 10 seconds effective to replace chlorine driven from the film with nitrogen.
Claim 2
Independent Claim
133 words
A method of annealing a wafer having an outwardly exposed TiN film containing undesired chlorine atoms to drive chlorine atoms from the film and reduce electrical resistance of the film, the method comprising the following sequential steps: a) rapid thermal processing the wafer having the outwardly exposed TiN film to a temperature from 580° C. to 700° C.; b) exposing the wafer to NH 3 gas at a temperature from 580° C. to 700° C. for at least 5 seconds; c) rapid thermal processing the wafer to a temperature of at least 780° C. effective to drive chlorine from the film; and d) exposing the wafer to N 2 gas at a temperature of at least 780° C. for at least 10 seconds effective to replace chlorine driven from the film with nitrogen.
Claim 3
Dependent Claim
22 words
The method of annealing a wafer of claim 1 wherein the step "b" exposure time is from 5 seconds to 20 seconds.
Claim 4
Dependent Claim
22 words
The method of annealing a wafer of claim 1 wherein the step "d" exposure time is from 10 seconds to 30 seconds.
Claim 5
Dependent Claim
35 words
The method of annealing a wafer of claim 1 wherein the step "b" exposure time is from 5 seconds to 20 seconds, and the step "d" exposure time is from 10 seconds to 30 seconds.
Claim 6
Dependent Claim
25 words
The method of annealing a wafer of claim 1 wherein the step "b" exposing is conducted in an atmosphere consisting essentially of NH 3 .
Claim 7
Dependent Claim
25 words
The method of annealing a wafer of claim 1 wherein the step "d" exposing is conducted in an atmosphere consisting essentially of N 2 .
Claim 8
Dependent Claim
41 words
The method of annealing a wafer of claim 1 wherein the step "b" exposing is conducted in an atmosphere consisting essentially of NH 3 , and the step "d" exposing is conducted in an atmosphere consisting essentially of N 2 .
Claim 9
Dependent Claim
25 words
The method of annealing a wafer of claim 1 wherein the wafer is exposed to N 2 starting immediately at the conclusion of step "b".
Claim 10
Dependent Claim
22 words
The method of annealing a wafer of claim 1 wherein the step "d" temperature is less than or equal to 850° C.
Claim 11
Dependent Claim
26 words
The method of annealing a wafer of claim 1 wherein steps "a" and "c" are conducted at a rate of at least 60° C. per second.
Claim 12
Independent Claim
151 words
A method of annealing a wafer having an outwardly exposed TiN film containing undesired chlorine atoms to drive chlorine atoms from the film and reduce electrical resistance of the film, the method comprising the following sequential steps: a) rapid thermal processing the wafer having the outwardly exposed TiN film to a temperature from 580° C. to 700° C.; b) exposing the wafer to a gas consisting essentially of NH 3 and to a temperature from 580° C. to 700° C. for from 5 seconds to 20 seconds; c) immediately at the conclusion of step "b", exposing the wafer to a gas consisting essentially of N 2 and rapid thermal processing the wafer to a temperature of from 780° C. to 850° C.; and d) exposing the wafer to gas consisting essentially of N 2 and to a temperature of from 780° C. to 850° C. for 10 seconds to 30 seconds.
Claim 13
Independent Claim
151 words
A method of annealing a wafer having an outwardly exposed TiN film containing undesired chlorine atoms to drive chlorine atoms from the film and reduce electrical resistance of the film, the method comprising the following sequential steps: a) rapid thermal processing the wafer having the outwardly exposed TiN film to a temperature from 580° C. to 700° C.; b) exposing the wafer to a gas consisting essentially of NH 3 and to a temperature from 580° C. to 700° C. for from 5 seconds to 20 seconds; c) immediately at the conclusion of step "b", exposing the wafer to a gas consisting essentially of N 2 and rapid thermal processing the wafer to a temperature of from 780° C. to 850° C.; and d) exposing the wafer to gas consisting essentially of N 2 and to a temperature of from 780° C. to 850° C. for 10 seconds to 30 seconds.
References Cited (Backward Citations)
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