US5874319A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Vacuum die bond for known good die assembly
Assignee: Honeywell Inc
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Filing: 1996-05-21
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Granted: 1999-02-23
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Expires: 2016-05-21
Abstract
Abstract Method for testing bare semiconductor die which includes providing a test substrate with a die receiving surface and bond pads with conductive traces which extend away from the surface and are connected to leads that may be contacted with test probes. A vacuum source is applied to an aperture in the die receiving surface. Atmospheric pressure holds the die in place during the connection of thin wires. After connection, the die is held in place during testing by the thin wires.
Inventors
- 👤 Thomas J. Dunaway
- 👤 Deborah A. Cullinan
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 23:46
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/04; G01R1/0408; G01R1/0433; G01R1/0483
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
209 words
Method for testing bare semiconductor die comprising the following steps: providing a first semiconductor die; providing a reusable test substrate having a surface for receiving said semiconductor die, said substrate having a plurality of bond pads having conductive traces extending away from said surface and terminating in test connections said surface having an aperture extending to an exterior; applying a vacuum force to said aperture at said exterior; placing said first die on said surface with said die being held at said surface by said vacuum force; connecting thin wires from said first die to a first location on selected ones of said plurality of bond pads; with said first location selected to allow space for a plurality of future connections; removing said vacuum force with said first die then being held in place by said thin wires, performing an electrical test on said die using selected ones of said test connections; removing said thin wires from said first die; providing a second semiconductor die; applying a vacuum force to said aperture at said exterior; placing said second die on said surface; and connecting thin wires from said second die to a second location, spaced from the first location, on said selected ones of said plurality of bond pads.
Claim 2
Dependent Claim
209 words
Method for testing bare semiconductor die comprising the following steps: providing a first semiconductor die; providing a reusable test substrate having a surface for receiving said semiconductor die, said substrate having a plurality of bond pads having conductive traces extending away from said surface and terminating in test connections said surface having an aperture extending to an exterior; applying a vacuum force to said aperture at said exterior; placing said first die on said surface with said die being held at said surface by said vacuum force; connecting thin wires from said first die to a first location on selected ones of said plurality of bond pads; with said first location selected to allow space for a plurality of future connections; removing said vacuum force with said first die then being held in place by said thin wires, performing an electrical test on said die using selected ones of said test connections; removing said thin wires from said first die; providing a second semiconductor die; applying a vacuum force to said aperture at said exterior; placing said second die on said surface; and connecting thin wires from said second die to a second location, spaced from the first location, on said selected ones of said plurality of bond pads.
Claim 3
Dependent Claim
28 words
Method of claim 1 wherein said step of removing said wires from said die includes the step of applying a vacuum force to said aperture at said exterior.
Claim 4
Dependent Claim
167 words
Method for testing bare semiconductor die comprising the following steps: providing a first semiconductor die; providing a reusable test substrate having a surface for receiving said semiconductor die, said substrate having a plurality of bond pads having conductive traces extending away from said surface and terminating in test connections, said surface having an aperture extending to an exterior; applying a vacuum force to said aperture at said exterior; placing said first die on said surface with said die being held at said surface by said vacuum force; connecting thin wires from said first die to a first location on selected ones of said plurality of bond pads, with said first location selected to allow for a plurality of future connections at other locations spaced from said first location; removing said vacuum force with said first die then being held in place by said thin wires; performing an electrical test on said die using selected ones of said test connections; removing said thin wires from said first die.
Claim 5
Dependent Claim
167 words
Method for testing bare semiconductor die comprising the following steps: providing a first semiconductor die; providing a reusable test substrate having a surface for receiving said semiconductor die, said substrate having a plurality of bond pads having conductive traces extending away from said surface and terminating in test connections, said surface having an aperture extending to an exterior; applying a vacuum force to said aperture at said exterior; placing said first die on said surface with said die being held at said surface by said vacuum force; connecting thin wires from said first die to a first location on selected ones of said plurality of bond pads, with said first location selected to allow for a plurality of future connections at other locations spaced from said first location; removing said vacuum force with said first die then being held in place by said thin wires; performing an electrical test on said die using selected ones of said test connections; removing said thin wires from said first die.
Claim 6
Dependent Claim
29 words
The method of claim 3 wherein said step of removing said wires from said die includes the step of applying a vacuum force to said aperture at said exterior.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2002-02-22 | 2002-08-24 | 2003-02-23 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2006-02-22 | 2006-08-24 | 2007-02-23 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2010-02-22 | 2010-08-24 | 2011-02-23 | $7700.00 | Window Closed / Lapsed |