US5568057A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for performing a burn-in test
Assignee: Samsung Electronics Co Ltd
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Filing: 1995-10-12
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Granted: 1996-10-22
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Expires: 2015-10-12
Abstract
Abstract An apparatus for burn-in test comprising, a socket body including an accommodation groove in which an integrated circuit chip is accommodated to be tested, a step sill portion formed around the accommodation groove, a plurality of inner leads formed on the step sill portion, a plurality of outer leads protruded from the socket body and electrically connected to said inner leads through the socket body, and a supporting element attached to opposite inside walls of the accommodation groove to support the integrated circuit chip, and a method for burn-in test comprising the steps of: (a) mounting an integrated circuit chip to be tested in the accommodation groove; (b) bonding pads of the integrated circuit chip with the corresponding inner leads through a plurality of wires; (c) mounting the socket body on a test board by the outer leads and applying test pattern signals to the integrated circuit chip through the inner and outer leads in the condition of high temperature and high voltage; and (d) severing and removing the wires.
Inventors
- 👤 Gu Sung Kim
- 👤 Jae Myung Park
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 06:19
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/04; G01R1/0408; G01R1/0433; G01R1/0441; G01R1/0466; G01R31/00; G01R31/28; G01R31/2851; G01R31/2855; G01R31/286; G01R31/2863; G01R31/26; G01R31/2642; G01R31/2832; G01R31/2836; G01R31/2849; G01R31/2884; H; H05; H05K; H05K7/00; H05K7/02; H05K7/10; H05K7/1015; H05K7/103; H10; H10W; H10W72/00; H10W72/071; H10W72/073; H10W72/075; H10W72/50; H10W72/531; H10W72/536; H10W72/5363; H10W72/851; H10W72/874; H10W72/884
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
220 words
An integrated circuit chip testing method using a test socket comprising: a socket body including an accommodation groove and a sill portion provided around the accommodation groove, the accommodation groove being constructed and arranged to temporarily receive an integrated circuit chip to be tested, the integrated circuit chip having a plurality of pads formed thereon; a plurality of inner leads provided on the sill portion; a plurality of outer leads extending from the socket body and being electrically connected to respective inner leads; and a chip support constructed and arranged to positionally fix the integrated circuit chip within the accommodation groove; the testing method comprising the steps of: positionally fixing an integrated circuit chip in the accommodation groove; electrically connecting each pad on the integrated circuit chip to a respective inner lead with a corresponding wire, including ball bonding each corresponding wire to a respective pad, thereby forming a conductive ball portion on each pad; connecting the outer leads to a test board; applying test signals to the integrated circuit chip via the inner and outer leads while exposing the integrated circuit chip to a test temperature and a test voltage; and after said step of applying test signals, severing each corresponding wire at the ball portion formed on each pad, thereby forming a corresponding connection bump on each pad.
Claim 2
Dependent Claim
220 words
An integrated circuit chip testing method using a test socket comprising: a socket body including an accommodation groove and a sill portion provided around the accommodation groove, the accommodation groove being constructed and arranged to temporarily receive an integrated circuit chip to be tested, the integrated circuit chip having a plurality of pads formed thereon; a plurality of inner leads provided on the sill portion; a plurality of outer leads extending from the socket body and being electrically connected to respective inner leads; and a chip support constructed and arranged to positionally fix the integrated circuit chip within the accommodation groove; the testing method comprising the steps of: positionally fixing an integrated circuit chip in the accommodation groove; electrically connecting each pad on the integrated circuit chip to a respective inner lead with a corresponding wire, including ball bonding each corresponding wire to a respective pad, thereby forming a conductive ball portion on each pad; connecting the outer leads to a test board; applying test signals to the integrated circuit chip via the inner and outer leads while exposing the integrated circuit chip to a test temperature and a test voltage; and after said step of applying test signals, severing each corresponding wire at the ball portion formed on each pad, thereby forming a corresponding connection bump on each pad.
Claim 3
Dependent Claim
28 words
A testing method according to claim 1, wherein said step of electrically connecting is performed by at least one of a thermo-compression process and a supersonic wave process.
Claim 4
Dependent Claim
43 words
A testing method according to claim 1, wherein said step of severing each corresponding wire comprises severing each ball portion formed on each pad with a cutting tool, whereby each connection bump formed by severing each ball portion has a substantially flat surface.
Claim 5
Dependent Claim
34 words
A testing method according to claim 3, wherein said step of severing is performed using a cutting tool comprising a cutting blade mounted on an arm which can move in vertical and horizontal planes.
Claim 6
Dependent Claim
24 words
A testing method according to claim 4, wherein said step of severing is performed using a diamond-coated tungsten carbide blade mounted ion the arm.
Claim 7
Dependent Claim
38 words
A testing method according to claim 3, wherein said step of severing includes adjusting a location above the integrated circuit chip where the corresponding wire is severed, thereby permitting adjustment of the height of the resultant connection bump.
Claim 8
Dependent Claim
38 words
A testing method according to claim 1, wherein said step of severing includes adjusting a location above the integrated circuit chip where the corresponding wire is severed, thereby permitting adjustment of the height of the resultant connection bump.
Claim 9
Dependent Claim
72 words
A testing method according to claim 1, wherein the chip support includes opposing resilient members provided in the accommodation groove, wherein said step of positionally fixing the integrated circuit chip in the accommodation groove includes inserting the integrated circuit chip into the accommodation groove so as to flex the opposing resilient members, thereby creating a resilient force on the integrated circuit chip which fixes the integrated circuit chip within the accommodation groove.
Claim 10
Dependent Claim
19 words
A testing method according to claim 8, wherein the opposing resilient members are steel plate springs coated with polytetrafluoroethylene.
Claim 11
Dependent Claim
23 words
A testing method according to claim 1, wherein the socket body is made from at least one of a ceramic and a plastic.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-10-22 | 2000-04-22 | 2000-10-22 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-10-22 | 2004-04-22 | 2004-10-22 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-10-22 | 2008-04-22 | 2008-10-22 | $7700.00 | Window Closed / Lapsed |