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US5873154A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for fabricating a resonator having an acoustic mirror

Assignee: Avago Technologies International Sales Pte Ltd
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Filing: 1996-10-17
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Granted: 1999-02-23
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Expires: 2016-10-17
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Abstract

Abstract A Thin Film Bulk Acoustic Wave Resonator (FBAR), comprising a top electrode layer, a substrate, an acoustic mirror that is formed atop the substrate, and a piezoelectric layer that is formed between the top electrode layer and the acoustic mirror. The acoustic mirror is comprised of a plurality of stacked layers. One of the stacked layers forms a bottom electrode layer. At least another one of the stacked layers comprises a polymer material. The piezoelectric produces vibrations in response to a voltage being applied between the top electrode and the bottom electrode. The acoustic mirror acoustically isolates these vibrations from the substrate. The polymer material is preferably an electronic grade polymer and has a capability of withstanding a deposition of the piezoelectric layer at an elevated temperature. The layers forming the acoustic mirror which do not comprise the polymer material comprise a high acoustic impedance material such as, by example, tungsten (W). The polymer material can be spun on the substrate during fabrication of the FBAR.

Inventors

  • 👤 Markku Antero Ylilammi
  • 👤 Meeri Talvilelei Partanen

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 10:34
CPC Classifications
H; H03; H03H; H03H9/00; H03H9/15; H03H9/17; H03H9/171; H03H9/172; H03H9/175; H03H3/00; H03H3/007; H03H3/02; Y; Y10; Y10T; Y10T29/00; Y10T29/42

Claims Analysis

Total Claims: 24
Claim 1
Independent Claim 133 words
A method for fabricating a Thin Film Bulk Acoustic Wave Resonator (FBAR), comprising the steps of: STEP A1: forming a first layer on a substrate, the first layer being comprised of a polymer; STEP A2: forming a second, lower electrode layer on an upper surface of the first layer, wherein the first and second layers form an acoustic isolator and wherein STEP A1 includes forming the first layer so as to have a thickness which is an odd multiple of one-fourth of an acoustic wavelength, and wherein STEP A2 includes forming the second layer so as to have a thickness which is an odd multiple of one-fourth of the acoustic wavelength; STEP B: forming a piezoelectric layer on the acoustic isolator; and STEP C: forming an upper electrode layer on the piezoelectric layer.
Claim 2
Independent Claim 133 words
A method for fabricating a Thin Film Bulk Acoustic Wave Resonator (FBAR), comprising the steps of: STEP A1: forming a first layer on a substrate, the first layer being comprised of a polymer; STEP A2: forming a second, lower electrode layer on an upper surface of the first layer, wherein the first and second layers form an acoustic isolator and wherein STEP A1 includes forming the first layer so as to have a thickness which is an odd multiple of one-fourth of an acoustic wavelength, and wherein STEP A2 includes forming the second layer so as to have a thickness which is an odd multiple of one-fourth of the acoustic wavelength; STEP B: forming a piezoelectric layer on the acoustic isolator; and STEP C: forming an upper electrode layer on the piezoelectric layer.
Claim 3
Dependent Claim 37 words
A method as set forth in claim 1, wherein STEP B includes a step of depositing a piezoelectric material at an elevated temperature on at least a portion of the acoustic isolator to form the piezoelectric layer.
Claim 4
Dependent Claim 26 words
A method as set forth in claim 1, wherein STEP A1 includes a step of spinning the polymer on the substrate to form the first layer.
Claim 5
Dependent Claim 26 words
A method as set forth in claim 1, wherein the polymer can withstand a temperature reached during the performance of STEP B without being detrimentally effected.
Claim 6
Dependent Claim 22 words
An FBAR as set forth in claim 1, wherein the second, electrode layer comprises a material having a high characteristic acoustic impedance.
Claim 7
Dependent Claim 21 words
A method as set forth in claim 5, wherein the material having the high characteristic acoustic impedance is comprised of tungsten.
Claim 8
Dependent Claim 16 words
A method as set forth in claim 1, wherein the polymer is an electronic grade polymer.
Claim 9
Dependent Claim 13 words
A method as set forth claim 1, wherein the polymer comprises a polyimide.
Claim 10
Dependent Claim 22 words
A method as set forth claim 1, wherein the polymer comprises one of cyclotene, a silicon-based polymer material, and a carbon-based material.
Claim 11
Dependent Claim 30 words
A method as set forth claim 1, wherein STEP A1 includes forming the first layer so as to have a thickness that is a function of a desired operating frequency.
Claim 12
Dependent Claim 18 words
A method as set forth claim 1, wherein the substrate comprises one of glass, silicon, and gallium arsenide.
Claim 13
Dependent Claim 28 words
A method as set forth claim 1, wherein the first layer has an acoustic impedance which is substantially less than an acoustic impedance of the second, electrode layer.
Claim 14
Dependent Claim 21 words
A method as set forth claim 1, wherein the acoustic isolator isolates vibrations produced by said piezoelectric layer from said substrate.
Claim 15
Dependent Claim 29 words
A method as set forth claim 1, wherein the acoustic isolator transforms an acoustic impedance of said substrate from a first acoustic impedance to a second, lesser acoustic impedance.
Claim 16
Independent Claim 142 words
A method for fabricating a Thin Film Bulk Acoustic Wave Resonator (FBAR), comprising the steps of: forming a multi-layered acoustic isolator on a surface of a substrate, wherein a first plurality of layers of the acoustic isolator are comprised of a polymer having a first acoustic impedance, wherein a second plurality of layers of the acoustic isolator have a second acoustic impedance, wherein individual ones of the first plurality of layers and individual ones of the second plurality of layers are alternately disposed within the acoustic isolator, wherein one of the first plurality of layers is disposed on the substrate, and wherein one of second plurality of layers forms a lower electrode layer and is disposed on one of the first plurality of layers; forming a piezoelectric layer on the acoustic isolator; and forming an upper electrode layer on the piezoelectric layer.
Claim 17
Independent Claim 142 words
A method for fabricating a Thin Film Bulk Acoustic Wave Resonator (FBAR), comprising the steps of: forming a multi-layered acoustic isolator on a surface of a substrate, wherein a first plurality of layers of the acoustic isolator are comprised of a polymer having a first acoustic impedance, wherein a second plurality of layers of the acoustic isolator have a second acoustic impedance, wherein individual ones of the first plurality of layers and individual ones of the second plurality of layers are alternately disposed within the acoustic isolator, wherein one of the first plurality of layers is disposed on the substrate, and wherein one of second plurality of layers forms a lower electrode layer and is disposed on one of the first plurality of layers; forming a piezoelectric layer on the acoustic isolator; and forming an upper electrode layer on the piezoelectric layer.
Claim 18
Dependent Claim 20 words
A method as set forth in claim 15, wherein the first acoustic impedance is less than the second acoustic impedance.
Claim 19
Dependent Claim 20 words
A method as set forth in claim 15, wherein at least one of the second plurality of layers comprises tungsten.
Claim 20
Dependent Claim 18 words
A method as set forth in claim 15, wherein the polymer is comprised of an electronic grade polymer.
Claim 21
Dependent Claim 24 words
A method as set forth claim 15, wherein the polymer comprises one of a polyimide, cyclotene, a silicon-based polymer material, and a carbon-based material.
Claim 22
Dependent Claim 21 words
A method as set forth claim 15, wherein the acoustic isolator isolates the substrate from vibrations produced by said piezoelectric layer.
Claim 23
Dependent Claim 29 words
A method as set forth claim 15, wherein the acoustic isolator transforms an acoustic impedance of said substrate from a first acoustic impedance to a second, lesser acoustic impedance.
Claim 24
Dependent Claim 20 words
A method as set forth in claim 15, wherein individual ones of the first plurality of layers are spun on.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2002-02-22 2002-08-24 2003-02-23 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2006-02-22 2006-08-24 2007-02-23 $3760.00 Window Closed / Lapsed
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