US5872740A
Expired / Lapsed
US
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System and method for an antifuse bank
Assignee: Micron Technology Inc
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Filing: 1997-08-22
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Granted: 1999-02-16
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Expires: 2017-08-22
Abstract
Abstract An antifuse bank (200) for an integrated circuit. The antifuse bank (200) includes a plurality of word lines (246) and digit lines (244) disposed to form an array. The antifuse bank (200) also includes a plurality of antifuse cells (230). Each antifuse cell (230) includes an antifuse (242) that is programmable to one of two fixed states. Each antifuse cell (230) also includes an access device (240) coupled to one of the word lines (246) and one of the digit lines (244) and coupled to the antifuse (242) of the antifuse cell (230). The antifuse bank (200) further includes an addressing circuit (248, 250) coupled to the array that selects an antifuse (242) of the array to be accessed. The antifuse bank (200) also includes a sensing circuit (228) coupled to the array that senses the state of the selected antifuse (242).
Inventors
- 👤 Daniel R. Loughmiller
- 👤 Kevin G. Duesman
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 18:08
CPC Classifications
G; G11; G11C; G11C17/00; G11C17/14; G11C17/16
Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
103 words
An antifuse bank for an integrated circuit, the antifuse bank comprising: a plurality of word and digit lines disposed to form an array; a plurality of antifuse cells, each antifuse cell including: an antifuse that is programmable from a first state to a second state; an access device coupled to one of the word lines and one of the digit lines and coupled to the antifuse; an addressing circuit coupled to the array that selects an antifuse of the array to be accessed; and a sensing circuit coupled to the array that senses a voltage that indicates the state of the selected antifuse.
Claim 2
Dependent Claim
103 words
An antifuse bank for an integrated circuit, the antifuse bank comprising: a plurality of word and digit lines disposed to form an array; a plurality of antifuse cells, each antifuse cell including: an antifuse that is programmable from a first state to a second state; an access device coupled to one of the word lines and one of the digit lines and coupled to the antifuse; an addressing circuit coupled to the array that selects an antifuse of the array to be accessed; and a sensing circuit coupled to the array that senses a voltage that indicates the state of the selected antifuse.
Claim 3
Dependent Claim
19 words
The antifuse bank of claim 1, wherein the antifuse of each antifuse cell is coupled to a common node.
Claim 4
Dependent Claim
16 words
The antifuse bank of claim 1, wherein a sensing circuit is coupled to each digit line.
Claim 5
Dependent Claim
21 words
The antifuse bank of claim 1, wherein each antifuse associated with a common digit line is programmed to the same state.
Claim 6
Dependent Claim
25 words
The antifuse bank of claim 1, wherein the antifuse of each antifuse cell comprises a capacitive element, wherein the capacitance does not exceed 25 nanofarads.
Claim 7
Independent Claim
79 words
A method for reading data from a cell of an antifuse array, comprising the steps of: establishing a first voltage on a digit line that is coupled to the cell of the antifuse array; setting a common node of each cell to a second voltage; activating an access device of the cell; and monitoring the voltage on the digit line with a sensing circuit coupled to the digit line to determine the state of an antifuse of the cell.
Claim 8
Independent Claim
79 words
A method for reading data from a cell of an antifuse array, comprising the steps of: establishing a first voltage on a digit line that is coupled to the cell of the antifuse array; setting a common node of each cell to a second voltage; activating an access device of the cell; and monitoring the voltage on the digit line with a sensing circuit coupled to the digit line to determine the state of an antifuse of the cell.
Claim 9
Dependent Claim
35 words
The method of claim 6, wherein the step of establishing a first voltage on a digit line comprises the step of establishing a high voltage level on the digit line with a long L device.
Claim 10
Independent Claim
60 words
A method for shorting an antifuse of a cell of an antifuse array, comprising the steps of: activating an access transistor of the cell; establishing a first voltage on a digit line coupled to the cell to provide a voltage level to a first node of the antifuse; and applying a voltage pulse to a second node of the antifuse.
Claim 11
Independent Claim
60 words
A method for shorting an antifuse of a cell of an antifuse array, comprising the steps of: activating an access transistor of the cell; establishing a first voltage on a digit line coupled to the cell to provide a voltage level to a first node of the antifuse; and applying a voltage pulse to a second node of the antifuse.
Claim 12
Independent Claim
56 words
A method of determining an operational margin of a programmed array of antifuses, comprising the steps of: establishing a first voltage on a cell plate node which is common to each antifuse of the array within normal operating range; varying the voltage on the common node; and monitoring the operation of the antifuses of the array.
Claim 13
Independent Claim
56 words
A method of determining an operational margin of a programmed array of antifuses, comprising the steps of: establishing a first voltage on a cell plate node which is common to each antifuse of the array within normal operating range; varying the voltage on the common node; and monitoring the operation of the antifuses of the array.
Claim 14
Independent Claim
20 words
The method of step 9, wherein the step of varying the voltage on the cell plate node is performed incrementally.
Claim 15
Independent Claim
20 words
The method of step 9, wherein the step of varying the voltage on the cell plate node is performed incrementally.
Claim 16
Independent Claim
63 words
A method for testing a plurality of unprogrammed cells of an antifuse array, comprising the steps of: establishing a first voltage on a cell plate which is a common node to each of the unprogrammed cells of the antifuse array; activating a plurality of access transistors of the cells; and monitoring the voltage on a plurality of digit lines coupled to the cells.
Claim 17
Independent Claim
63 words
A method for testing a plurality of unprogrammed cells of an antifuse array, comprising the steps of: establishing a first voltage on a cell plate which is a common node to each of the unprogrammed cells of the antifuse array; activating a plurality of access transistors of the cells; and monitoring the voltage on a plurality of digit lines coupled to the cells.
Claim 18
Dependent Claim
34 words
The method of claim 11, wherein the step of activating a plurality of access transistors comprises the step of sequentially establishing a second voltage on a plurality of word lines coupled to the cells.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2002-02-15 | 2002-08-17 | 2003-02-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2006-02-15 | 2006-08-17 | 2007-02-16 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2010-02-15 | 2010-08-17 | 2011-02-16 | $7700.00 | Window Closed / Lapsed |