US5828580A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Connectivity-based approach for extracting parasitic layout in an integrated circuit
Assignee: Synopsys Inc
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Filing: 1994-11-08
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Granted: 1998-10-27
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Expires: 2014-11-08
Abstract
Abstract A layout parasitic extraction system. The present invention is a connectivity-based approach for extracting layout parasitics. The present invention creates a connectivity-based database, where geometries of a layout are organized by net. The present invention allows net-by-net extraction of layout parasitics using a connectivity-based database. Furthermore, a user can select a net or nets for extraction. The present invention outputs a database containing nets and their extracted layout parasitics. The present invention can create a netlist format file from a database containing nets and their extracted parasitics to allow back annotation of layout parasitics into a circuit schematic or for use for other software (possibly from a third-party).
Inventors
- 👤 William Wai Yan Ho
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 19:24
CPC Classifications
G; G06; G06F; G06F30/00; G06F30/30; G06F30/39; G06F30/398
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
109 words
A computer-implemented method for extracting parasitic capacitance data from a layout of an integrated circuit, the integrated circuit being described by a layout database, containing geometries of the integrated circuit, comprising the steps of: reading a capacitance synthesis table having predefined parasitic capacitance values for predefined capacitance structures for geometries of the integrated circuit, wherein said predefined capacitance structures comprise interconnect capacitances and device capacitances; comparing one of the geometries of the integrated circuit against said predefined capacitance structures in said capacitance synthesis table; and selecting one of said predefined parasitic capacitance values if one of the geometries of the integrated circuit matches one of said predefined capacitance structures.
Claim 2
Dependent Claim
109 words
A computer-implemented method for extracting parasitic capacitance data from a layout of an integrated circuit, the integrated circuit being described by a layout database, containing geometries of the integrated circuit, comprising the steps of: reading a capacitance synthesis table having predefined parasitic capacitance values for predefined capacitance structures for geometries of the integrated circuit, wherein said predefined capacitance structures comprise interconnect capacitances and device capacitances; comparing one of the geometries of the integrated circuit against said predefined capacitance structures in said capacitance synthesis table; and selecting one of said predefined parasitic capacitance values if one of the geometries of the integrated circuit matches one of said predefined capacitance structures.
Claim 3
Dependent Claim
130 words
A computer-implemented method for extracting parasitic capacitance data from a layout of an integrated circuit, the integrated circuit being described by a layout database, containing geometries of the integrated circuit, comprising the steps of: reading a capacitance synthesis table having predefined parasitic capacitance values for predefined capacitance structures; comparing one of the geometries of the integrated circuit against said predefined capacitance structures in said capacitance synthesis table; selecting one of said predefined parasitic capacitance values if one of the geometries of the integrated circuit matches one of said predefined capacitance structures; and determining a parasitic capacitance value of one of the geometries of the integrated circuit by interpolating from said predefined capacitance values if one of the geometries of the integrated circuit substantially matches one of said predefined capacitance structures.
Claim 4
Dependent Claim
130 words
A computer-implemented method for extracting parasitic capacitance data from a layout of an integrated circuit, the integrated circuit being described by a layout database, containing geometries of the integrated circuit, comprising the steps of: reading a capacitance synthesis table having predefined parasitic capacitance values for predefined capacitance structures; comparing one of the geometries of the integrated circuit against said predefined capacitance structures in said capacitance synthesis table; selecting one of said predefined parasitic capacitance values if one of the geometries of the integrated circuit matches one of said predefined capacitance structures; and determining a parasitic capacitance value of one of the geometries of the integrated circuit by interpolating from said predefined capacitance values if one of the geometries of the integrated circuit substantially matches one of said predefined capacitance structures.
Claim 5
Dependent Claim
194 words
A computer-implemented method for extracting parasitic capacitance data from a layout of an integrated circuit, the integrated circuit being described by a layout database, containing geometries of the integrated circuit, comprising the steps of: reading a capacitance synthesis table having predefined parasitic capacitance values for predefined capacitance structures; comparing one of the geometries of the integrated circuit against said predefined capacitance structures in said capacitance synthesis table; selecting one of said predefined parasitic capacitance values if one of the geometries of the integrated circuit matches one of said predefined capacitance structures; comparing said one of the geometries of the integrated circuit against said predefined capacitance structures in a capacitance geometry structure library when said one of the geometries of the integrated circuit neither matches nor substantially matches one of said predefined capacitance structures; determining a calculated parasitic capacitance value of one of the geometries of the integrated circuit by direct simulation if one of the geometries of the integrated circuit neither matches nor substantially matches one of said predefined capacitance structures; and adding said calculated parasitic capacitance value for said one of the geometries of the integrated circuit to said capacitance geometry structure library.
Claim 6
Dependent Claim
194 words
A computer-implemented method for extracting parasitic capacitance data from a layout of an integrated circuit, the integrated circuit being described by a layout database, containing geometries of the integrated circuit, comprising the steps of: reading a capacitance synthesis table having predefined parasitic capacitance values for predefined capacitance structures; comparing one of the geometries of the integrated circuit against said predefined capacitance structures in said capacitance synthesis table; selecting one of said predefined parasitic capacitance values if one of the geometries of the integrated circuit matches one of said predefined capacitance structures; comparing said one of the geometries of the integrated circuit against said predefined capacitance structures in a capacitance geometry structure library when said one of the geometries of the integrated circuit neither matches nor substantially matches one of said predefined capacitance structures; determining a calculated parasitic capacitance value of one of the geometries of the integrated circuit by direct simulation if one of the geometries of the integrated circuit neither matches nor substantially matches one of said predefined capacitance structures; and adding said calculated parasitic capacitance value for said one of the geometries of the integrated circuit to said capacitance geometry structure library.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2001-10-26 | 2002-04-27 | 2002-10-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2005-10-26 | 2006-04-27 | 2006-10-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2009-10-26 | 2010-04-27 | 2010-10-27 | $7700.00 | Window Closed / Lapsed |