← Back to Patent Explorer
US5202841A Expired / Lapsed US ⏱️ 0.0 years remaining

Layout pattern verification system

Assignee: Mitsubishi Electric Corp
•
Filing: 1990-06-28
•
Granted: 1993-04-13
•
Expires: 2010-06-28
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract In the inventive layout pattern verification system, verification data employed by a verification data judging part for judging effectiveness/defectiveness of the electrical property of a logic circuit formed by a layout pattern are data calculated by a verification data calculation part on the basis of reference circuit constants extracted from layout pattern data by a second data extraction part and process parameters supplied by a process parameter supply part, i.e., data obtained with no circuit simulation. Thus, the electrical property of the layout pattern of a large-scale logic circuit can also be easily verified by judging effectiveness/defectiveness of the electrical property of the logic circuit formed by a layout pattern through a verification data judging part on the basis of the verification data.

Inventors

  • 👤 Takahiro Tani

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 14:16
CPC Classifications
G; G06; G06F; G06F30/00; G06F30/30; G06F30/39; G06F30/398

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 203 words
A layout pattern verification system for verifying the electrical property of a layout pattern forming a prescribed logic circuit, said layout pattern verification system comprising: circuit connection data supply means for supplying circuit connection data defining a connection relationship among elements forming said logic circuit and a large-small charge supplying capability relationship of specific ones of said elements; layout pattern data supply means for supplying layout pattern data defining said layout pattern of said logic circuit; process parameter supply means for supplying various process parameters required for fabricating said logic circuit; first data extraction means for extracting said specific ones of said elements whose large-small charge supplying capability relationship is defined form said circuit connection data as verification elements; second data extraction means for extracting circuit constants relating to charge supplying capability of said verification elements from said layout pattern data as reference circuit constants; verification data calculation means for calculating verification data expressing a charge supplying capability ratio of said verification elements on the basis of said reference circuit constants and said process parameters; and verification data judging means for judging effectiveness/defectiveness of the electrical property of said logic circuit formed by said layout pattern on the basis of said verification data.
Claim 2
Dependent Claim 203 words
A layout pattern verification system for verifying the electrical property of a layout pattern forming a prescribed logic circuit, said layout pattern verification system comprising: circuit connection data supply means for supplying circuit connection data defining a connection relationship among elements forming said logic circuit and a large-small charge supplying capability relationship of specific ones of said elements; layout pattern data supply means for supplying layout pattern data defining said layout pattern of said logic circuit; process parameter supply means for supplying various process parameters required for fabricating said logic circuit; first data extraction means for extracting said specific ones of said elements whose large-small charge supplying capability relationship is defined form said circuit connection data as verification elements; second data extraction means for extracting circuit constants relating to charge supplying capability of said verification elements from said layout pattern data as reference circuit constants; verification data calculation means for calculating verification data expressing a charge supplying capability ratio of said verification elements on the basis of said reference circuit constants and said process parameters; and verification data judging means for judging effectiveness/defectiveness of the electrical property of said logic circuit formed by said layout pattern on the basis of said verification data.
Claim 3
Dependent Claim 35 words
A layout pattern verification system in accordance with claim 1, wherein said verification data judging means judges the effectiveness/defectiveness of the electrical property of said logic circuit by comparing said verification data with reference data.
Claim 4
Dependent Claim 50 words
A layout pattern verification system in accordance with claim 2, further comprising verification result output means for outputting a judgment result on the basis of the judgment result of said verification data judging means while outputting said specific elements and said verification data upon the defectiveness of said judgment result.
Claim 5
Dependent Claim 41 words
A layout pattern verification system in accordance with claim 3, wherein said circuit connection data supply means includes logical operation verification means for performing logic simulation of a logic circuit defined by said circuit connection data to verify logical operation thereof.
Claim 6
Dependent Claim 37 words
A layout pattern verification system in accordance with claim 4, wherein said specific elements include transistors forming a β ratio circuit, and said verification data includes a gain coefficient ratio of transistors forming said β ratio circuit.
Claim 7
Dependent Claim 18 words
A layout pattern verification system in accordance with claim 5, wherein said β ratio circuit includes an inverter.
Claim 8
Dependent Claim 42 words
A layout pattern verification system in accordance with claim 4, wherein said specific elements include elements forming a resistance ratio circuit, and said verification data include a value on the basis of a resistance ratio of elements forming said resistance ratio circuit.
Claim 9
Dependent Claim 24 words
A layout pattern verification system in accordance with claim 7, wherein said elements forming said resistance ratio circuit include a transistor and a resistor.
Claim 10
Dependent Claim 18 words
A layout pattern verification system in accordance with claim 8, wherein said resistance ratio circuit includes an inverter.
Claim 11
Dependent Claim 48 words
A layout pattern verification system in accordance with claim 4, wherein said specific elements include capacitors forming a charge sharing effect circuit which performs predetermined operation by utilizing a capacitance ratio, and said verification data includes a capacitance ratio of said capacitors forming said charge sharing effect circuit.
Claim 12
Dependent Claim 26 words
A layout pattern verification system in accordance with claim 10, wherein said capacitors forming said charge sharing effect circuit includes a capacitor accompanying a signal line.

References Cited (Backward Citations)

US4584653A Cited
US4651284A Cited
US4939681A Cited
US5062054A Cited
US5046012A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-04-12 1996-10-12 1997-04-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-04-12 2000-10-12 2001-04-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-04-12 2004-10-12 2005-04-13 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag