US5728625A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Process for device fabrication in which a thin layer of cobalt silicide is formed
Assignee: Bell Semiconductor LLC
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Filing: 1996-04-04
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Granted: 1998-03-17
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Expires: 2016-04-04
Abstract
Abstract The present invention is directed to a process for device fabrication in which a layer of cobalt silicide is formed as a low resistance contact layer over the source and drain regions of a device. The silicon substrate is first subjected to conditions that fore a thin layer of oxide on the surface thereof. It is advantageous if the oxide thickness is about 0.5 nm to about 1.5 nm. At least one layer of cobalt is then formed on at least the oxidized surfaces of the silicon substrate. The cobalt layer(s) is formed using conventional expedients such as e-beam evaporation. The cobalt layer(s) is formed on the substrate in an essentially oxygen free environment. Each cobalt layer has a thickness of about 1 nm to about 5 nm. While maintaining the substrate in the essentially oxygen-free environment, the substrate is annealed to form a layer of cobalt silicide. It is advantageous if the substrate is annealed at a temperature in the range of about 450° C. to about 800° C. The cobalt silicide that results has a low resistance and high uniformity that makes it advantageous for use as a contact material.
Inventors
- 👤 Raymond Tzutse Tung
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 15:41
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/021; H10D30/0223; H10D30/0227; H10D64/00; H10D64/01; H10D64/011; H10D64/0111; H10D64/0112; H10D64/20; H10D64/23; H10D64/251; H10D64/258; H10D64/259; H10P; H10P32/00; H10P32/10; H10P32/14; H10P32/1408; H10P32/1414; H10P32/17; H10P32/171
Claims Analysis
Total Claims: 19
Claim 1
Independent Claim
85 words
A process for device fabrication comprising: forming a layer of oxide with a thickness of about 0.5 nm to about 1.5 nm on the surface of a silicon substrate; placing the substrate in an essentially oxygen-free environment; forming at least one layer of cobalt with a thickness of about 5 nm or less on the substrate while maintaining the substrate in an essentially oxygen free environment; and heating the substrate under conditions sufficient to form an epitaxial layer of cobalt silicide on the silicon substrate.
Claim 2
Dependent Claim
85 words
A process for device fabrication comprising: forming a layer of oxide with a thickness of about 0.5 nm to about 1.5 nm on the surface of a silicon substrate; placing the substrate in an essentially oxygen-free environment; forming at least one layer of cobalt with a thickness of about 5 nm or less on the substrate while maintaining the substrate in an essentially oxygen free environment; and heating the substrate under conditions sufficient to form an epitaxial layer of cobalt silicide on the silicon substrate.
Claim 3
Dependent Claim
17 words
The process of claim 1 wherein the substrate is heated to a temperature greater than 450° C.
Claim 4
Dependent Claim
21 words
The process of claim 2 wherein the substrate is heated to a temperature of about 450° C. to about 800° C.
Claim 5
Dependent Claim
25 words
The process of claim 1 wherein the oxide is formed by contacting a surface of the substrate with a solution comprising hydrogen peroxide and water.
Claim 6
Dependent Claim
26 words
The process of claim 4 wherein the solution further comprises a third component selected from the group consisting of a strong acid and a weak base.
Claim 7
Dependent Claim
19 words
The process of claim 5 wherein the strong acid is hydrochloric acid and the weak base is ammonium hydroxide.
Claim 8
Dependent Claim
13 words
The process of claim 1 wherein the oxide is deposited on the substrate.
Claim 9
Dependent Claim
13 words
The process of claim 1 wherein the oxide is formed by thermal oxidation.
Claim 10
Dependent Claim
46 words
The process of claim 1 further comprising forming an additional thickness of cobalt silicide by forming at least one additional layer of cobalt on the substrate with the cobalt silicide formed thereon and annealing the substrate while maintaining the substrate in an essentially oxygen free environment.
Claim 11
Dependent Claim
31 words
The process of claim 9 wherein the thickness of the additional layer of cobalt does not exceed about one-third of the thickness of the cobalt silicide formed on the silicon substrate.
Claim 12
Dependent Claim
19 words
The process of claim 1 wherein the thickness of the cobalt is about 1 nm to about 4 nm.
Claim 13
Dependent Claim
12 words
The process of claim 1 wherein the cobalt is formed by sputtering.
Claim 14
Dependent Claim
14 words
The process of claim 1 wherein the cobalt is formed by electron beam evaporation.
Claim 15
Dependent Claim
14 words
The process of claim 11 wherein the cobalt is formed by chemical vapor deposition.
Claim 16
Dependent Claim
60 words
The process of claim 1 wherein the silicon substrate has at least one source region, at least one drain region, at least one gate region and at least one field oxide region formed thereon prior to the formation of the cobalt layer over the substrate, the process further comprising removing the cobalt remaining on the substrate after the heating step.
Claim 17
Dependent Claim
68 words
The process of claim 15 wherein the gate region of the substrate has a gate electrode formed thereover comprising layers of silicon dioxide, doped polysilicon, metal silicide, and a silicon dioxide film formed thereover, wherein the process further comprises introducing a dopant into the cobalt silicide layer and subjecting the substrate to conditions that promote the diffusion of the dopant from the cobalt silicide into the surrounding silicon.
Claim 18
Dependent Claim
15 words
The process of claim 16 wherein the dopant introduced into the cobalt silicide is arsenic.
Claim 19
Dependent Claim
32 words
The process of claim 17 wherein the substrate is subjected to temperature in excess of about 800° C. to cause the dopant to diffuse from the cobalt silicide into the surrounding silicon.
References Cited (Backward Citations)
US5194405A
Cited
US5047367A
Cited
US5397744A
Cited
US5290731A
Cited
US5399526A
Cited
US5308793A
Cited
US5266156A
Cited
US5563100A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2001-03-16 | 2001-09-15 | 2002-03-17 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2005-03-16 | 2005-09-15 | 2006-03-17 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2009-03-16 | 2009-09-15 | 2010-03-17 | $7700.00 | Window Closed / Lapsed |