Semiconductor device having semiconductor elements formed in a retrograde well structure

Claim 2

A semiconductor device comprising: a semiconductor substrate having a plurality of well regions formed in a surface region of the semiconductor substrate, the surface region extending to a surface of said semiconductor substrate, the plurality of well regions extending to the surface of the semiconductor substrate, the plurality of well regions having an impurity concentration profile, in a direction of increasing distance from the surface of the semiconductor substrate, in a shape of a valley, a concentration at a minimum point of said profile being greater than 5×10 14 cm -3 , a position of said minimum point being at least 0.5 μm from the surface of the semiconductor substrate, and a position of maximum point of the profile begin deeper than the position of said minimum point from the surface of the semiconductor substrate and within 1.6 μm of the surface of said semiconductor substrate, a memory including at least one MOSFET formed in at least one of said plurality of well regions, leaving a remainder of the plurality of well regions; and at least one bipolar transistor formed in at least one of the remainder of said plurality of well regions, whereby alpha-ray soft errors in the memory are decreased.

Claim 3

A semiconductor device according to claim 1, wherein the at least one MOSFET is a p-channel MOSFET formed in an n-type well, of said plurality of well regions, and the at least one bipolar transistor is an npn bipolar transistor formed in another n-type well, of said plurality of well regions.

Claim 4

A semiconductor device according to claim 2, further comprising: at least one p-type well region formed in a surface region of said substrate, the at least one p-type well region having an impurity concentration profile, in a direction of increasing distance from the surface of the semiconductor substrate, in a shape of a valley, a concentration at a minimum point of said profile of the at least one p-type well region being greater than 5×10 14 cm -3 , and a position of a maximum point of the profile being deeper than the position of said minimum point of the profile of the at least one p-type well region from the surface of the semiconductor substrate and within 1.6 μm of the surface of the semiconductor substrate; and at least one n-channel MOSFET formed in said p-type well region, whereby a Bi-CMOS structure is formed in said semiconductor substrate.

Claim 5

A semiconductor device comprising a plurality of well regions formed in a surface region of said substrate, the surface region of said substrate extending to a surface of the substrate, the regions extending to the surface of the substrate, the plurality of well regions having a memory provided therein, the memory including at least one MOSFET and a bipolar transistor in respective well regions of said plurality of well regions, each of the plurality of well regions having an impurity concentration profile, in a direction of increasing distance from the surface of the substrate, in a shape of two mountains with a valley between the two mountains, the valley providing a minimum point of impurity concentration in the impurity concentration profile, the minimum point of the impurity concentration profile being at least 0.5 μm from the surface of the semiconductor substrate and having a concentration greater than 5×10 14 cm -3 , and a position of a maximum point of the profile being deeper than a position of said minimum point from the surface of the semiconductor substrate and within 1.6 μm of the surface of the semiconductor substrate, whereby alpha-ray soft errors in the memory are decreased.

Claim 6

A semiconductor device comprising a plurality of well regions formed in a surface region of said substrate, the surface region of said substrate extending to a surface of the substrate, the regions extending to the surface of the substrate, the plurality of well regions having a memory provided therein, the memory including at least one MOSFET and a bipolar transistor in respective well regions of said plurality of well regions, each of the plurality of well regions having an impurity concentration profile, in a direction of increasing distance from the surface of the substrate, in a shape of two mountains with a valley between the two mountains, the valley providing a minimum point of impurity concentration in the impurity concentration profile, the minimum point of the impurity concentration profile being at least 0.5 μm from the surface of the semiconductor substrate and having a concentration greater than 5×10 14 cm -3 , and a position of a maximum point of the profile being deeper than a position of said minimum point from the surface of the semiconductor substrate and within 1.6 μm of the surface of the semiconductor substrate, whereby alpha-ray soft errors in the memory are decreased.

Claim 7

A semiconductor device according to claim 4, wherein the plurality of well regions include at least one well region of a first conductivity type and at least one well region of a second conductivity type opposite the first conductivity type.

Claim 8

A semiconductor device according to claim 5, wherein said at least one MOSFET includes a MOSFET in a well region, of the plurality of well regions, of the first conductivity type, and a MOSFET in a well region, of the plurality of well regions, of the second conductivity type.

Claim 9

A semiconductor device according to claim 4, wherein each of the two mountains has a peak, both peaks being spaced from the surface of the substrate, with the valley being between the two peaks.

Claim 10

A semiconductor device according to claim 4, wherein each of the two mountains has a peak, one peak being at the surface of the substrate, with the valley being between the two peaks.

Claim 11

A semiconductor device according to claim 4, wherein each of the at least one bipolar transistors has a base layer extending from the surface of the semiconductor substrate to a depth in a respective one well region of the remainder of said plurality of well regions, said depth to which the base layer extends being less than a depth of the position of the minimum point of the impurity concentration profile.

Claim 12

A semiconductor device comprising: a semiconductor substrate having a plurality of well regions formed in a surface region of said semiconductor substrate, the plurality of well regions extending to a surface of the semiconductor substrate, the plurality of well regions being adapted to have semiconductor elements formed therein, each of the plurality of well regions having an impurity concentration profile, in a direction of increasing distance from the surface of the semiconductor substrate, in a shape of a valley, a concentration at a minimum point of said profile being greater than 5×10 14 cm -3 , and a position of said minimum point being at least 0.5 μm from the surface of the semiconductor substrate, and a position of a maximum point of the profile being deeper than the position of said minimum point from the surface of the semiconductor substrate and within 1.6 μm of the surface of the semiconductor substrate; and a memory including one MOSFET provided in one of the plurality of well regions, and a bipolar transistor provided in another of the plurality of well regions, the bipolar transistor having a base layer that extends from the surface of the semiconductor substrate to a depth in said another of the plurality of well regions, said depth to which the base layer extends being less than a depth of the position of the minimum point of the impurity concentration profile, whereby alpha-ray soft errors in the memory are decreased.

Claim 13

A semiconductor device comprising: a semiconductor substrate having a plurality of well regions formed in a surface region of said semiconductor substrate, the plurality of well regions extending to a surface of the semiconductor substrate, the plurality of well regions being adapted to have semiconductor elements formed therein, each of the plurality of well regions having an impurity concentration profile, in a direction of increasing distance from the surface of the semiconductor substrate, in a shape of a valley, a concentration at a minimum point of said profile being greater than 5×10 14 cm -3 , and a position of said minimum point being at least 0.5 μm from the surface of the semiconductor substrate, and a position of a maximum point of the profile being deeper than the position of said minimum point from the surface of the semiconductor substrate and within 1.6 μm of the surface of the semiconductor substrate; and a memory including one MOSFET provided in one of the plurality of well regions, and a bipolar transistor provided in another of the plurality of well regions, the bipolar transistor having a base layer that extends from the surface of the semiconductor substrate to a depth in said another of the plurality of well regions, said depth to which the base layer extends being less than a depth of the position of the minimum point of the impurity concentration profile, whereby alpha-ray soft errors in the memory are decreased.

Claim 14

A semiconductor device comprising: a semiconductor substrate having a plurality of well regions formed in a surface region of the semiconductor substrate, the surface region extending to a surface of said semiconductor substrate, the plurality of well regions extending to the surface of the substrate, the plurality of well regions having an impurity concentration profile, in a direction of increasing distance from the surface of the semiconductor substrate, in a shape of a valley, a concentration at a minimum point of said profile being greater than 5×10 14 cm -3 , and a position of said minimum point being at least 0.5 μm from the surface of the semiconductor substrate, and a position of a maximum point of the profile being deeper than the position of said minimum point from the surface of the semiconductor substrate and within 1.6 μm of the surface of the semiconductor substrate, a memory including at least one MOSFET formed in at least one of said plurality of well regions, leaving a remainder of the plurality of well regions; and at least one bipolar transistor formed in at least one of the remainder of said plurality of well regions, wherein each of said at least one bipolar transistor has a base layer that extends from the surface of the semiconductor substrate to a depth in a respective well region of the remainder of said plurality of well regions, and wherein said depth to which the base layer extends is less than a depth of the position of the minimum point of the impurity concentration profile, whereby alpha-ray soft errors in the memory are decreased.

Claim 15

A semiconductor device comprising: a semiconductor substrate having a plurality of well regions formed in a surface region of the semiconductor substrate, the surface region extending to a surface of said semiconductor substrate, the plurality of well regions extending to the surface of the substrate, the plurality of well regions having an impurity concentration profile, in a direction of increasing distance from the surface of the semiconductor substrate, in a shape of a valley, a concentration at a minimum point of said profile being greater than 5×10 14 cm -3 , and a position of said minimum point being at least 0.5 μm from the surface of the semiconductor substrate, and a position of a maximum point of the profile being deeper than the position of said minimum point from the surface of the semiconductor substrate and within 1.6 μm of the surface of the semiconductor substrate, a memory including at least one MOSFET formed in at least one of said plurality of well regions, leaving a remainder of the plurality of well regions; and at least one bipolar transistor formed in at least one of the remainder of said plurality of well regions, wherein each of said at least one bipolar transistor has a base layer that extends from the surface of the semiconductor substrate to a depth in a respective well region of the remainder of said plurality of well regions, and wherein said depth to which the base layer extends is less than a depth of the position of the minimum point of the impurity concentration profile, whereby alpha-ray soft errors in the memory are decreased.