Nonvolatile memory with write data latch

Claim 2

A memory device comprising: a memory cell array having a plurality of word lines, a plurality of bit lines, and memory cells each arranged at an intersection between each word line and each bit line; a memory cell transistor having a floating gate for holding nonvolatile information, and a control gate, connected to the word line, for controlling writing, erasing, or reading of information held in the floating gate, said memory cell transistor constituting said memory cell; means for latching potential of said bit line which is determined in correspondence with data stored in said memory cell transistor; and drive signal means for supplying a drive signal to the control gate of said memory cell transistor, the drive signal alternately and repeatedly having a first potential and a second potential different from the first potential.

Claim 3

The memory device of claim 1, further comprising: supply means for supplying a current to said bit line at a predetermined timing in accordance with the potential latched by said latch means.

Claim 4

The memory device of claim 1, wherein said latch means includes a 1-bit memory for storing binary information corresponding to the potential of said bit line.

Claim 5

The memory device of claim 2, wherein said latch means includes a memory for storing information corresponding to the current supplied to said bit line.

Claim 6

The memory device of claim 1, further comprising: supply means for supplying a current to said bit line at a predetermined timing in accordance with the potential latched by said latch means.

Claim 7

The memory device of claim 1, wherein said latch means includes a 1-bit memory for storing binary information corresponding to the potential of said bit line.

Claim 8

The memory device of claim 5, wherein said latch means includes a memory for storing information corresponding to the current supplied to said bit line.

Claim 9

A nonvolatile semiconductor memory comprising: main bit line; sub bit line; a bit line selection transistor for selectively connecting said sub bit line to said main bit line; a memory cell transistor having a floating gate for holding nonvolatile information, and a control gate for controlling writing, erasing, or reading of information held in the floating gate, said memory cell transistor being connected to said sub bit drive signal means for supplying a drive signal to the control gate of said memory cell transistor, the drive signal alternately and repeatedly having a first potential and a second potential different from the first potential; and means for latching a potential of said sub bit line which is determined in correspondence with data stored in said memory cell transistor, when said sub bit line selection transistor disconnects said bit line from said main bit line.

Claim 10

A nonvolatile semiconductor memory comprising: main bit line; sub bit line; a bit line selection transistor for selectively connecting said sub bit line to said main bit line; a memory cell transistor having a floating gate for holding nonvolatile information, and a control gate for controlling writing, erasing, or reading of information held in the floating gate, said memory cell transistor being connected to said sub bit drive signal means for supplying a drive signal to the control gate of said memory cell transistor, the drive signal alternately and repeatedly having a first potential and a second potential different from the first potential; and means for latching a potential of said sub bit line which is determined in correspondence with data stored in said memory cell transistor, when said sub bit line selection transistor disconnects said bit line from said main bit line.

Claim 11

A nonvolatile semiconductor memory comprising: a main bit line; a sub bit line; a bit line selection transistor for selectively connecting said sub bit line to said main bit line; a memory cell transistor having a floating gate for holding nonvolatile information, and a control gate for controlling writing, erasing, or reading of information held in the floating gate, said memory cell transistor being connected to said sub bit line; drive signal means for supplying a drive signal to the control gate of said memory cell transistor, the drive signal alternately and repeatedly having a first potential and a second potential different from the first potential; and means for latching a potential of said sub bit line which is set after predetermined information is written in said memory cell transistor, while said bit line selection transistor keeps disconnecting said sub bit line from said main bit line.

Claim 12

A nonvolatile semiconductor memory comprising: a main bit line; a sub bit line; a bit line selection transistor for selectively connecting said sub bit line to said main bit line; a memory cell transistor having a floating gate for holding nonvolatile information, and a control gate for controlling writing, erasing, or reading of information held in the floating gate, said memory cell transistor being connected to said sub bit line; drive signal means for supplying a drive signal to the control gate of said memory cell transistor, the drive signal alternately and repeatedly having a first potential and a second potential different from the first potential; and means for latching a potential of said sub bit line which is set after predetermined information is written in said memory cell transistor, while said bit line selection transistor keeps disconnecting said sub bit line from said main bit line.

Claim 13

The memory according to claim 1, further comprising said memory cell transistor having a source and a drain, and means for setting either one of the source and drain of said memory cell transistor in a floating state higher in potential than the other before applying said drive signal to the control gate of said memory cell transistor.

Claim 14

The memory according to claim 8, further comprising said memory cell transistor having a source and a drain, and means for setting either one of the source and drain of said memory cell transistor in a floating state higher in potential than the other before applying said drive signal to the control gate of said memory cell transistor.

Claim 15

The memory according to claim 9, further comprising said memory cell transistor having a source and a drain, and means for setting either one of the source and drain of said memory cell transistor in a floating state higher in potential than the other before applying said drive signal to the control gate of said memory cell transistor.

Claim 16

The memory according to claim 10 wherein one of the source and drain of said memory cell transistor, being set to the floating state, is coupled to one of said bit lines which is also set at the floating state.

Claim 17

The memory according to claim 11 wherein one of the source and drain of said memory cell transistor, being set to the floating state, is coupled to said sub bit line which is also set at the floating state.

Claim 18

The memory according to claim 12 wherein one of the source and drain of said memory cell transistor, being set to the floating state, is couple to said sub bit line which is also set at the floating state.