Semiconductor integrated circuit device

Claim 2

A semiconductor device comprising: a semiconductor substrate; a plurality of memory cells of a static random access memory, each of said memory cells including cross-coupled first and second inverter circuits, each of said first and second inverter circuits having an n-channel drive MISFET and a p-channel load MISFET coupled in series with each other, each said drive MISFET comprising a first insulating film formed over a main surface of said semiconductor substrate, a gate electrode formed over said first insulating film, and source and drain regions formed in said semiconductor substrate; a second insulating film formed over said drive MISFETs so as to cover said main surface; a wiring line formed on said second insulating film and electrically connected with source regions of said drive MISFETs; a third insulating film formed over said wiring line and said second insulating film so as to cover said main surface; gate electrodes corresponding to said load MISFETs, wherein said gate electrodes of said load MISFETs of said first and second inverter circuits are formed over said third insulating film and are electrically connected with said drain regions of said drive MISFETs of said second and first inverter circuits, respectively; first semiconductor strips formed over said third insulating film and electrically connected with said drain regions of said drive MISFETs, wherein source and drain regions and a channel region of each of said load MISFETs are formed in respective ones of said first semiconductor strips; and a fourth insulating film formed between said gate electrodes of said load MISFETs and said first semiconductor strips.

Claim 3

A semiconductor device according to claim 1, wherein said first semiconductor strips are formed on said third insulating film, wherein said fourth insulating film is formed on said first semiconductor strips and said third insulating film, and wherein said gate electrodes of said load MISFETs are formed on said fourth insulating film.

Claim 4

A semiconductor device according to claim 2, wherein each of said first semiconductor strips is comprised of a polycrystalline silicon film.

Claim 5

A semiconductor device according to claim 1, wherein said wiring line is extended in an overlapping relationship, with respect to a plan view of a main surface of said semiconductor substrate, with both said source regions and gate electrodes of said load MISFETs in each said memory cell.

Claim 6

A semiconductor device according to claim 1, wherein in each memory cell a part of said gate electrodes of said load MISFETs and a part of said gate electrodes of said drive MISFETs, with respect to a plan view of a main surface of said semiconductor substrate, are in an overlapping relationship with each other.

Claim 7

A semiconductor device according to claim 2, wherein a ground potential is applied to said wiring line.

Claim 8

A semiconductor device according to claim 6, wherein said first semiconductor strips corresponding to said load MISFETs of said first and second inverter circuits are formed over said gate electrodes of said drive MISFETs of said second and first inverter circuits, respectively.

Claim 9

A semiconductor device according to claim 7, wherein said gate electrodes of said load MISFETs of said first and second inverter circuits are formed over said gate electrodes of said drive MISFETs of said second and first inverter circuits, respectively.

Claim 10

A semiconductor device according to claim 1, wherein a ground potential is applied to said wiring line.

Claim 11

A semiconductor device according to claim 1, wherein said wiring line is extended over said gate electrodes of said drive MISFETs.

Claim 12

A semiconductor device according to claim 4, wherein said wiring line is extended over said gate electrodes of said drive MISFETs.

Claim 13

A semiconductor device according to claim 11, wherein a ground potential is applied to said wiring line.

Claim 14

A semiconductor device comprising: a semiconductor substrate; a plurality of memory cells of a static random access memory, each of said memory cells including cross-coupled first and second inverter circuits, and each of said first and second inverter circuits having an n-channel drive MISFET and a p-channel load MISFET coupled in series with each other; first conductive strips extending over said semiconductor substrate, wherein a part of respective ones of said first conductive strips serves as a gate electrode of respective ones of the drive MISFETs; a first insulating film formed between a main surface of said semiconductor substrate and each said part of said first conductive strips serving as said gate electrode of a respective said drive MISFET, wherein said first insulating film serves as a gate insulating film of each said drive MISFET; semiconductor regions formed in said semiconductor substrate and serving as source and drain regions of said drive MISFETs; a second insulating film formed over said drive MISFETs so as to cover said main surface; a wiring line formed on said second insulating film and extending over said first conductive strips, wherein said wiring line is electrically connected with source regions of said drive MISFETS, and wherein a ground potential is applied to said wiring line; a third insulating film formed on said wiring line and said second insulating film so as to cover said main surface; gate electrodes corresponding to said load MISFETs, wherein said gate electrodes of said load MISFETs are formed over said third insulating film, and wherein said gate electrodes of said load MISFETs of said first and second inverter circuits are electrically connected with said drain regions of said drive MISFETs of said second and first inverter circuits, respectively; first semiconductor strips formed over said third insulating film and electrically connected with said drain regions of said drive MISFETs, wherein source and drain regions and a channel region included in each of said load MISFETs are formed in respective ones of said first semiconductor strips; and a fourth insulating film formed between said gate electrodes of said load MISFETs and said first semiconductor strips.

Claim 15

A semiconductor device comprising: a semiconductor substrate; a plurality of memory cells of a static random access memory, each of said memory cells including cross-coupled first and second inverter circuits, and each of said first and second inverter circuits having an n-channel drive MISFET and a p-channel load MISFET coupled in series with each other; first conductive strips extending over said semiconductor substrate, wherein a part of respective ones of said first conductive strips serves as a gate electrode of respective ones of the drive MISFETs; a first insulating film formed between a main surface of said semiconductor substrate and each said part of said first conductive strips serving as said gate electrode of a respective said drive MISFET, wherein said first insulating film serves as a gate insulating film of each said drive MISFET; semiconductor regions formed in said semiconductor substrate and serving as source and drain regions of said drive MISFETs; a second insulating film formed over said drive MISFETs so as to cover said main surface; a wiring line formed on said second insulating film and extending over said first conductive strips, wherein said wiring line is electrically connected with source regions of said drive MISFETS, and wherein a ground potential is applied to said wiring line; a third insulating film formed on said wiring line and said second insulating film so as to cover said main surface; gate electrodes corresponding to said load MISFETs, wherein said gate electrodes of said load MISFETs are formed over said third insulating film, and wherein said gate electrodes of said load MISFETs of said first and second inverter circuits are electrically connected with said drain regions of said drive MISFETs of said second and first inverter circuits, respectively; first semiconductor strips formed over said third insulating film and electrically connected with said drain regions of said drive MISFETs, wherein source and drain regions and a channel region included in each of said load MISFETs are formed in respective ones of said first semiconductor strips; and a fourth insulating film formed between said gate electrodes of said load MISFETs and said first semiconductor strips.

Claim 16

A semiconductor device according to claim 13, wherein said first semiconductor strips are formed on said third insulating film, wherein said fourth insulating film is formed on said first semiconductor strips and said third insulating film, and wherein said gate electrodes of said load MISFETs are formed on said fourth insulating film.

Claim 17

A semiconductor device according to claim 14, wherein each of said first semiconductor strips is comprised of a polycrystalline silicon film.

Claim 18

A semiconductor device according to claim 15, wherein a part of said fourth insulating film serves as a gate insulating film of each said load MISFET.

Claim 19

A semiconductor device according to claim 13, wherein a part of said fourth insulating film serves as a gate insulating film of each said load MISFET.