Claims Analysis
Total Claims: 21
Claim 1
Independent Claim
207 words
A method for forming an integrated circuit, comprising the steps of: attaching a first surface of a semiconductor die to a die attach pad of a leadframe; electrically connecting bond pads formed on a second surface of the semiconductor die, the second surface being opposite the first surface, to an inner portion of each of selected package leads of the leadframe; providing a mold having a mold cavity; placing a thermal induction plate inside the mold cavity, the thermal induction plate having a size and shape such that when placed in the mold cavity, a first planar section of the thermal induction plate self-aligns to a desired position in the mold cavity; placing the semiconductor die as attached to the die attach pad, and inner portions of the package leads within the mold cavity such that the second surface of the semiconductor die is proximate to the first planar section of the thermal induction plate and an integral second planar section of the thermal induction plate is proximate to and electrically isolated from said the inner portions of the package leads; and encapsulating the semiconductor die as attached to the die attach pad, the thermal induction plate, and inner portions of the package leads in a package.
Claim 2
Independent Claim
207 words
A method for forming an integrated circuit, comprising the steps of: attaching a first surface of a semiconductor die to a die attach pad of a leadframe; electrically connecting bond pads formed on a second surface of the semiconductor die, the second surface being opposite the first surface, to an inner portion of each of selected package leads of the leadframe; providing a mold having a mold cavity; placing a thermal induction plate inside the mold cavity, the thermal induction plate having a size and shape such that when placed in the mold cavity, a first planar section of the thermal induction plate self-aligns to a desired position in the mold cavity; placing the semiconductor die as attached to the die attach pad, and inner portions of the package leads within the mold cavity such that the second surface of the semiconductor die is proximate to the first planar section of the thermal induction plate and an integral second planar section of the thermal induction plate is proximate to and electrically isolated from said the inner portions of the package leads; and encapsulating the semiconductor die as attached to the die attach pad, the thermal induction plate, and inner portions of the package leads in a package.
Claim 3
Dependent Claim
21 words
A method as in claim 1, wherein the first planar section of the thermal induction plate is exposed outside the package.
Claim 4
Dependent Claim
28 words
A method as in claim 1, further comprising the step of positioning a generally conductive layer adjacent to and electrically isolated from a surface of the package leads.
Claim 5
Dependent Claim
22 words
A method as in claim 3, wherein the generally conductive layer is positioned between the package leads and the thermal induction plate.
Claim 6
Dependent Claim
27 words
A method as in claim 4, further comprising the step of positioning a second generally conductive layer between the package leads and the first generally conductive layer.
Claim 7
Dependent Claim
22 words
A method as in claim 3, wherein the generally conductive layer is positioned opposite the package leads from the thermal induction plate.
Claim 8
Dependent Claim
27 words
A method as in claim 6, further comprising the step of positioning a second generally conductive layer between the package leads and the first generally conductive layer.
Claim 9
Dependent Claim
26 words
A method as in claim 6, further comprising the step of positioning a second generally conductive layer between the package leads and the thermal induction plate.
Claim 10
Dependent Claim
52 words
A method as in claim 1, further comprising the step of forming a plurality of holes through the thermal induction plate such that the encapsulant flows through said holes around the semiconductor die and the inner portions of the leads, and upon hardening, locks the encapsulant to the semiconductor die and leadframe.
Claim 11
Independent Claim
206 words
A method for forming an integrated circuit, comprising the steps of: attaching a first surface of a semiconductor die to a first surface of a heat sink; attaching a plurality of electrically conductive package leads to the first surface of the heat sink; electrically connecting bond pads formed on a second surface of the semiconductor die, the second surface of the die being opposite to the first surface of the die, to an inner portion of each of selected package leads; providing a mold having a mold cavity; placing a thermal induction plate inside the mold, cavity, said thermal induction plate having a first planar section proximate to a mold inner surface; aligning the thermal induction plate to a desired position in said mold cavity; placing the semiconductor die, heat sink, and inner portions of the package leads within the mold cavity such that the second surface of the semiconductor die is proximate to a surface of the thermal induction plate, said thermal induction plate having a second integral offset planar section proximate to and electrically isolated from said inner portions of said package leads; and encapsulating the semiconductor die, heat sink, thermal induction plate, and inner portions of the package leads to form a package.
Claim 12
Independent Claim
206 words
A method for forming an integrated circuit, comprising the steps of: attaching a first surface of a semiconductor die to a first surface of a heat sink; attaching a plurality of electrically conductive package leads to the first surface of the heat sink; electrically connecting bond pads formed on a second surface of the semiconductor die, the second surface of the die being opposite to the first surface of the die, to an inner portion of each of selected package leads; providing a mold having a mold cavity; placing a thermal induction plate inside the mold, cavity, said thermal induction plate having a first planar section proximate to a mold inner surface; aligning the thermal induction plate to a desired position in said mold cavity; placing the semiconductor die, heat sink, and inner portions of the package leads within the mold cavity such that the second surface of the semiconductor die is proximate to a surface of the thermal induction plate, said thermal induction plate having a second integral offset planar section proximate to and electrically isolated from said inner portions of said package leads; and encapsulating the semiconductor die, heat sink, thermal induction plate, and inner portions of the package leads to form a package.
Claim 13
Dependent Claim
35 words
A method as in claim 10, wherein a second surface of the heat sink, the second surface of the heat sink being opposite the first surface of the heat sink, is exposed outside the package.
Claim 14
Dependent Claim
21 words
A method as in claim 10, wherein the first planar section of the thermal induction plate is exposed outside the package.
Claim 15
Dependent Claim
23 words
A method as in claim 10, further comprising the step of positioning a generally conductive layer adjacent a surface of the package leads.
Claim 16
Dependent Claim
22 words
A method as in claim 13, wherein the generally conductive layer is positioned between the package leads and the thermal induction plate.
Claim 17
Dependent Claim
27 words
A method as in claim 14, further comprising the step of positioning a second generally conductive layer between the package leads and the first generally conductive layer.
Claim 18
Dependent Claim
21 words
A method as in claim 13, wherein the generally conductive layer is positioned between the package leads and the heat sink.
Claim 19
Dependent Claim
27 words
A method as in claim 16, further comprising the step of positioning a second generally conductive layer between the package leads and the first generally conductive layer.
Claim 20
Dependent Claim
26 words
A method as in claim 16, further comprising the step of positioning a second generally conductive layer between the package leads and the thermal induction plate.
Claim 21
Dependent Claim
52 words
A method as in claim 10, further comprising the step of forming a plurality of holes through the thermal induction plate such that the encapsulant flows through said holes around the semiconductor die and the inner portions of the leads, and upon hardening locks the encapsulant to the semiconductor die and leads.