Abstract A semiconductor device memory array formed on a semiconductor substrate comprising a multiplicity of field effect transistor DRAM devices disposed in array is disclosed. Each of the DRAM devices is paired with a non-volatile EEPROM cell and the EEPROM cells are disposed in a shallow trench in the semiconductor substrate running between the DRAM devices such that each DRAM-EEPROM pair shares a common drain diffusion. The EEPROM cells are arranged in the trench such that there are discontinuous laterally disposed floating gate polysilicon electrodes and continuous horizontally disposed program and recall gate polysilicon electrodes. The floating gate is separated from the program and recall gates by a silicon rich nitride. The array of the invention provides high density shadow RAMs. Also disclosed are methods for the fabrication of devices of the invention.
A method for oxidizing a top surface of a pair of polysilicon structures in a trench comprising: (a) conformally depositing polysilicon in said trench and RIE directionally etching said polysilicon to provide said pair of polysilicon structures vertically aligned along sidewalls in said trench; said polysilicon structures having exposed top and side surfaces; (b) filling said trench with a fill, planarizing and etching back said fill to expose said top surfaces of said polysilicon structures; (c) oxidizing said top surfaces of said polysilicon structures; and then (d) removing said fill.
Claim 2
Independent Claim
90 words
A method for oxidizing a top surface of a pair of polysilicon structures in a trench comprising: (a) conformally depositing polysilicon in said trench and RIE directionally etching said polysilicon to provide said pair of polysilicon structures vertically aligned along sidewalls in said trench; said polysilicon structures having exposed top and side surfaces; (b) filling said trench with a fill, planarizing and etching back said fill to expose said top surfaces of said polysilicon structures; (c) oxidizing said top surfaces of said polysilicon structures; and then (d) removing said fill.
Claim 3
Dependent Claim
17 words
A method according to claim 1 wherein said fill is a conformal, nitride covered with a resist.