US5021359A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Radiation hardened complementary transistor integrated circuits
Assignee: Intersil Corp
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Filing: 1989-10-03
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Granted: 1991-06-04
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Expires: 2009-10-03
Abstract
Abstract Integrated circuits with vertical isolated trenches are radiation hardened by providing vertical gate segments, preferably, of doped polycrystalline silicon, in the trenches and connected at the bottom of the trenches to a region of the same conductivity type. The surface devices may be complementary and the vertical gates may also be complementarily doped. A method of fabrication is described for a single crystal wafer, as well as SOI.
Inventors
- 👤 William R. Young
- 👤 Anthony L. Rivoli
- 👤 William W. Wiles, Jr.
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 08:40
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/80; H10D84/82; H10D84/83; H10D84/85; H10D86/00; H10D86/201; H10W; H10W10/00; H10W10/01; H10W10/051; H10W10/50; Y; Y10; Y10S; Y10S438/00; Y10S438/953
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
200 words
A method of fabricating an integrated circuit comprising: forming a plurality of trenches in a substrate to form at least first and second laterally separated islands in said substrate; forming a first insulative layer along the lateral walls of said trenches; forming a semiconductor layer on said first insulative layer, said semiconductor layer being in contact with said substrate at the bottom of said trench; filling said trenches with insulative material; selectively introducing impurities of a first conductivity type into said first island and an adjacent first portion of said semiconductor layer to form a first region intersecting and underlying a portion of said trench and said first semiconductor layer portion; selectively introducing impurities of a second conductivity type into said second island and an adjacent second portion of said semiconductor layer to form a second region intersecting and underlying a portion of said trench and said second semiconductor layer portion; selectively introducing second conductivity type impurities into said first region to form a third and a fourth region laterally spaced and intersecting a trench; and selectively introducing first conductivity type impurities into said second region to form a fifth and a sixth region laterally spaced and intersecting a trench.
Claim 2
Independent Claim
200 words
A method of fabricating an integrated circuit comprising: forming a plurality of trenches in a substrate to form at least first and second laterally separated islands in said substrate; forming a first insulative layer along the lateral walls of said trenches; forming a semiconductor layer on said first insulative layer, said semiconductor layer being in contact with said substrate at the bottom of said trench; filling said trenches with insulative material; selectively introducing impurities of a first conductivity type into said first island and an adjacent first portion of said semiconductor layer to form a first region intersecting and underlying a portion of said trench and said first semiconductor layer portion; selectively introducing impurities of a second conductivity type into said second island and an adjacent second portion of said semiconductor layer to form a second region intersecting and underlying a portion of said trench and said second semiconductor layer portion; selectively introducing second conductivity type impurities into said first region to form a third and a fourth region laterally spaced and intersecting a trench; and selectively introducing first conductivity type impurities into said second region to form a fifth and a sixth region laterally spaced and intersecting a trench.
Claim 3
Dependent Claim
33 words
A method according to claim 1, wherein forming said first insulative layer includes covering said substrate with said first insulative layer and removing said first insulative layer from the bottom of said trenches.
Claim 4
Dependent Claim
12 words
A method according to claim 2, wherein removing comprises reactive ion etching.
Claim 5
Dependent Claim
36 words
A method according to claim 1, wherein forming said first insulative layer includes covering said substrate with said first insulative layer and removing selective portions of said first insulative layer from the bottom of said trenches.
Claim 6
Dependent Claim
30 words
A method according to claim 4, wherein removing portions of said first insulative layer includes making said first insulative layer and etching exposed selective portions of said first insulative layer.
Claim 7
Dependent Claim
50 words
A method according to claim 1, including forming a base insulative layer on said substrate and a top polycrystalline semiconductor material layer on said base insulative layer prior to forming said trenches; and planarizing said substrate to remove said top polycrystalline semiconductor layer after filling said trenches with insulative material.
Claim 8
Dependent Claim
41 words
A method according to claim 1, wherein forming said semiconductor layer includes forming a semiconductor layer on said substrate and removing said semiconductor layer from the top of said substrate and from a substantial portion of the bottom of said trenches.
Claim 9
Dependent Claim
22 words
A method according to claim 7, wherein said semiconductor layer material is removed and said trenches are formed by reactive ion etching.
Claim 10
Dependent Claim
49 words
A method according to claim 1, wherein: said substrate includes a buried insulative layer; and forming said trenches includes initially forming a trench terminating prior to said buried insulative layer and subsequently extending said trenches down to said buried insulative layer prior to filling said trenches with insulative material.
Claim 11
Dependent Claim
43 words
A method according to claim 1, wherein said semiconductor layer extends vertically at least the depth of the substrate defining said third, fourth, fifth and sixth regions and extends laterally at least the width of the substrate defining the first and second regions.
Claim 12
Dependent Claim
39 words
A method according to claim 9, wherein: forming of said semiconductor layer includes applying a semiconductor layer and simultaneously removing a portion of said semiconductor layer and extending said trenches; and said trenches are formed by reactive ion etching.
Claim 13
Dependent Claim
71 words
A method according to claim 1, wherein forming said trenches includes: initially forming first trench segments in said substrate defining portions of said first and second regions, which separate third, fourth regions and fifth, sixth regions, respectively; forming said first insulative layer and said semiconductor layer in said first trench segments; and subsequently forming second segment trench segments to form said trenches which form said laterally separated first and second islands.
References Cited (Backward Citations)
US4786960A
Cited
JPS62165356A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-06-03 | 1994-12-03 | 1995-06-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-06-03 | 1998-12-03 | 1999-06-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-06-03 | 2002-12-03 | 2003-06-04 | $7700.00 | Window Closed / Lapsed |