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US5367482A Expired / Lapsed US ⏱️ 0.0 years remaining

High voltage random-access memory cell incorporation level shifter

Assignee: Mentor Graphics Corp
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Filing: 1993-08-23
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Granted: 1994-11-22
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Expires: 2013-08-23
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Abstract

Abstract A level-shifting static random access memory cell includes a first stage having a first P-Channel MOS transistor having its source connected to a high voltage supply rail, and its drain connected to the drain of a first N-Channel MOS transistor. The source of the first N-Channel MOS transistor is connected to the drain of a second N-Channel MOS transistor. The source of the second N-channel MOS transistor is connected to a VSS power supply rail. A second stage comprises a second P-Channel MOS transistor having its source connected to the high voltage supply rail V HS , and its drain connected to the drain of a third N-Channel MOS transistor. The source of the third N-Channel MOS transistor is connected to the drain of a fourth N-Channel MOS transistor. The source of the fourth N-channel MOS transistor is connected to VSS. The gates of the first and second P-Channel MOS transistors are cross coupled and the gates of the second and fourth N-Channel MOS transistors are cross coupled. The gates of the first and third N-channel MOS transistors are connected together to power supply rail V DD , usually 5 volts. The first and second P-channel MOS transistors are formed in an n-well biased at power supply voltage V HS . A bit line coupled to the drain of the second N-Channel MOS transistor through a fifth N-Channel MOS transistor, having its gate connected to a word line.

Inventors

  • 👤 Ta-Pen Guo
  • 👤 Adi Srinivasan

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 21:15
CPC Classifications
H; H03; H03K; H03K3/00; H03K3/02; H03K3/353; H03K3/356; H03K3/356104; H03K3/356113; H03K3/356147; H03K3/356156; G; G11; G11C; G11C11/00; G11C11/21; G11C11/34; G11C11/40; G11C11/41; G11C11/412

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 298 words
A level-shifting static random access memory cell which may be coupled to a bit line and a word line operating at a first set of high and low logic-state voltages substantially equal to a first power-supply rail potential and a second power-supply rail potential, respectively, said level-shifting static random access memory cell having at least one output node operating at a second set of high and low logic state voltages substantially equal to a third high-voltage power-supply rail potential and said second power-supply rail potential, respectively, said cell comprising: a first P-Channel MOS transistor having a source connected to said third high-voltage power-supply rail potential, and further having a drain and a gate; a first N-Channel MOS transistor having a drain connected to the drain of said first P-Channel MOS transistor, a gate connected to said first power-supply rail potential, and a source; a second N-Channel MOS transistor having a drain connected to the source of said first N-Channel MOS transistor, a source connected to said second power-supply rail potential, and a gate; a second P-Channel MOS transistor having a source connected to said third high-voltage power-supply rail potential, and further having a drain connected to the gate of said first P-Channel MOS transistor and a gate connected to to the drain of said first P-Channel MOS transistor; a third N-Channel MOS transistor having a drain connected to the drain of said second P-Channel MOS transistor, a gate connected to said first power-supply rail potential, and a source connected to the gate of said second N-Channel MOS transistor; a fourth N-Channel MOS transistor having a drain connected to the source of said third N-Channel MOS transistor, a source connected to said second power-supply rail potential, and a gate connected to the source of said first N-Channel MOS transistor.
Claim 2
Dependent Claim 298 words
A level-shifting static random access memory cell which may be coupled to a bit line and a word line operating at a first set of high and low logic-state voltages substantially equal to a first power-supply rail potential and a second power-supply rail potential, respectively, said level-shifting static random access memory cell having at least one output node operating at a second set of high and low logic state voltages substantially equal to a third high-voltage power-supply rail potential and said second power-supply rail potential, respectively, said cell comprising: a first P-Channel MOS transistor having a source connected to said third high-voltage power-supply rail potential, and further having a drain and a gate; a first N-Channel MOS transistor having a drain connected to the drain of said first P-Channel MOS transistor, a gate connected to said first power-supply rail potential, and a source; a second N-Channel MOS transistor having a drain connected to the source of said first N-Channel MOS transistor, a source connected to said second power-supply rail potential, and a gate; a second P-Channel MOS transistor having a source connected to said third high-voltage power-supply rail potential, and further having a drain connected to the gate of said first P-Channel MOS transistor and a gate connected to to the drain of said first P-Channel MOS transistor; a third N-Channel MOS transistor having a drain connected to the drain of said second P-Channel MOS transistor, a gate connected to said first power-supply rail potential, and a source connected to the gate of said second N-Channel MOS transistor; a fourth N-Channel MOS transistor having a drain connected to the source of said third N-Channel MOS transistor, a source connected to said second power-supply rail potential, and a gate connected to the source of said first N-Channel MOS transistor.
Claim 3
Dependent Claim 45 words
The level-shifting static random access memory cell of claim 1, further including a fifth N-Channel MOS transistor having a source connected to said bit line, a drain connected to the drain of said second N-Channel MOS transistor and a gate connected to said word line.
Claim 4
Dependent Claim 41 words
The level-shifting static random access memory cell of claim 1 wherein said first power-supply rail potential is about 5 volts, said second power-supply rail potential is about zero volts, and said third power-supply rail potential is between 8 and 20 volts.

References Cited (Backward Citations)

US4287574A Cited
US4403306A Cited
US4536859A Cited
US4541073A Cited
US4779226A Cited
US4816706A Cited
US5239503A Cited
US5315545A Cited
US5301147A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-11-21 1998-05-23 1998-11-22 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-11-21 2002-05-23 2002-11-22 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-11-21 2006-05-23 2006-11-22 $7700.00 Window Closed / Lapsed

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