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US5366852A Expired / Lapsed US ⏱️ 0.0 years remaining

Methods for treating photoresists

Assignee: MCNC Research and Development Institute
•
Filing: 1992-09-21
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Granted: 1994-11-22
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Expires: 2012-09-21
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Abstract

Abstract The present invention comprises methods for treating photoresists and forming photoresist relief images, including a method comprising providing a photoresist coating having a crosslinked surface layer, treating the photoresist coating with an organometallic material, and developing the photoresist coating to provide a relief image comprising an etch resistant effective amount of organometallic material.

Inventors

  • 👤 Edward K. Pavelchek
  • 👤 Peter W. Freeman
  • 👤 John F. Bohland
  • 👤 Susan K. Jones
  • 👤 Bruce W. Dudley

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 15:59
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/26; G03F7/40; G03F7/36

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 102 words
A method of dry developing a photoresist coating using an organometallic material comprising: (a) applying a coating of a negative-acting photoresist composition on a substrate; (b) exposing the photoresist to patterned activating radiation to crosslink the photoresist coating where exposed; (c) partially developing the photoresist coating to form depressions in the photoresist coating by removal of a portion only of unexposed areas of the photoresist coating; (d) filling the depressions within the partially developed photoresist coating with organometallic material; and (e) dry developing the photoresist coating to provide a relief image comprising organometallic material overlying the unexposed portions of the photoresist coating.
Claim 2
Independent Claim 102 words
A method of dry developing a photoresist coating using an organometallic material comprising: (a) applying a coating of a negative-acting photoresist composition on a substrate; (b) exposing the photoresist to patterned activating radiation to crosslink the photoresist coating where exposed; (c) partially developing the photoresist coating to form depressions in the photoresist coating by removal of a portion only of unexposed areas of the photoresist coating; (d) filling the depressions within the partially developed photoresist coating with organometallic material; and (e) dry developing the photoresist coating to provide a relief image comprising organometallic material overlying the unexposed portions of the photoresist coating.
Claim 3
Dependent Claim 15 words
The method of claim 1 where photoresist coating is partially developed with a developer solution.
Claim 4
Dependent Claim 31 words
The method of claim 1 where areas of the photoresist coating that are not partially developed are essentially free of organometallic material after treatment of the photoresist coating with the same.

References Cited (Backward Citations)

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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-11-21 1998-05-23 1998-11-22 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-11-21 2002-05-23 2002-11-22 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-11-21 2006-05-23 2006-11-22 $7700.00 Window Closed / Lapsed

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