Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
65 words
A method of preparing a plurality of micro-samples of materials for investigation which comprises: providing a substrate having a plurality of micro-hotplates, wherein each of said plurality of micro-hotplates can be individually temperature controlled; and depositing a material film on said plurality of micro-hotplates while thermally cycling selected ones of said plurality of micro-hotplates to form a micro-sample on each of said plurality of micro-hotplates.
Claim 2
Independent Claim
65 words
A method of preparing a plurality of micro-samples of materials for investigation which comprises: providing a substrate having a plurality of micro-hotplates, wherein each of said plurality of micro-hotplates can be individually temperature controlled; and depositing a material film on said plurality of micro-hotplates while thermally cycling selected ones of said plurality of micro-hotplates to form a micro-sample on each of said plurality of micro-hotplates.
Claim 3
Dependent Claim
39 words
A method of preparing a plurality of micro-samples of materials for investigation according to claim 1, wherein said step of thermally cycling selected ones of said micro-hotplates comprises heating all of said plurality of micro-hotplates to a common temperature.
Claim 4
Dependent Claim
40 words
A method of preparing a plurality of micro-samples of materials for investigation according to claim 1, wherein selected ones of said micro-samples are subjected to a post-deposition annealing treatment by heating selected ones of said micro-hotplates after said deposition step.
Claim 5
Dependent Claim
40 words
A method of preparing a plurality of micro-samples of materials for investigation according to claim 2, wherein selected ones of said micro-samples are subjected to a post-deposition annealing treatment by heating selected ones of said micro-hotplates after said deposition step.
Claim 6
Dependent Claim
34 words
A method of preparing a plurality of micro-samples of materials for investigation according to claim 1, further comprising performing a lithography process for isolating selected ones of said micro-hotplates prior to said deposition step.
Claim 7
Dependent Claim
46 words
A method of preparing a plurality of micro-samples of materials for investigation according to claim 5, wherein said lithography process involves applying a resist material to said substrate, irradiating portions of said resist material utilizing a mask and removing said irradiated portions of said resist material.
Claim 8
Dependent Claim
24 words
A method of preparing a plurality of micro-samples of materials for investigation according to claim 5, wherein said lithography process comprises a maskless-lithography process.
Claim 9
Dependent Claim
47 words
A method of preparing a plurality of micro-samples of materials for investigation according to claim 7, wherein said maskless-lithography process involves applying a resist material to said substrate and heating selected ones of said plurality of micro-hotplates to volatilize and thereby remove portions of said resist material.
Claim 10
Dependent Claim
25 words
A method of preparing a plurality of micro-samples of materials for investigation according to claim 1, wherein said step of depositing involves a sputtering process.
Claim 11
Dependent Claim
27 words
A method of preparing a plurality of micro-samples of materials for investigation according to claim 1, wherein said step of depositing involves a chemical vapor deposition process.
Claim 12
Dependent Claim
25 words
A method of preparing a plurality of micro-samples of materials for investigation according to claim 1, wherein said step of depositing involves an evaporation process.
Claim 13
Dependent Claim
28 words
A method of preparing a plurality of micro-samples of materials for investigation according to claim 1, wherein electrical properties of said material film are measured during said deposition.
Claim 14
Dependent Claim
28 words
A method of preparing a plurality of micro-samples of materials for investigation according to claim 3, wherein electrical properties of said material film are measured during said annealing.
Claim 15
Dependent Claim
28 words
A method of preparing a plurality of micro-samples of materials for investigation according to claim 4, wherein electrical properties of said material film are measured during said annealing.
Claim 16
Independent Claim
64 words
A method of characterizing material properties which comprises: providing a substrate having a plurality of micro-hotplates, wherein each of said plurality of micro-hotplates can be individually temperature controlled; depositing a material film on said plurality of micro-hotplates while thermally cycling selected ones of said plurality of micro-hotplates to form a micro-sample on each of said plurality of micro-hotplates; and characterizing properties of said micro-samples.
Claim 17
Independent Claim
64 words
A method of characterizing material properties which comprises: providing a substrate having a plurality of micro-hotplates, wherein each of said plurality of micro-hotplates can be individually temperature controlled; depositing a material film on said plurality of micro-hotplates while thermally cycling selected ones of said plurality of micro-hotplates to form a micro-sample on each of said plurality of micro-hotplates; and characterizing properties of said micro-samples.
Claim 18
Dependent Claim
35 words
A method of characterizing material properties according to claim 15, wherein said properties of said micro-samples which are characterized are selected from the group consisting of electrical properties, chemical properties, physical properties and combinations thereof.
Claim 19
Dependent Claim
19 words
A method of characterizing material properties according to claim 15, wherein said characterization is performed during said deposition step.
Claim 20
Dependent Claim
28 words
A method of characterizing material properties according to claim 15, wherein said characterization is performed by scanning electron microscopy, scanning tunneling microscopy, atomic force microscopy or x-ray analysis.
Claim 21
Dependent Claim
34 words
A method of characterizing material properties according to claim 15, wherein selected ones of said micro-samples are subjected to a post-deposition annealing treatment by heating selected ones of said micro-hotplates after said deposition step.
Claim 22
Dependent Claim
33 words
A method of characterizing material properties according to claim 15, wherein said step of thermally cycling selected ones of said micro-hotplates comprises heating all of said plurality of micro-hotplates to a common temperature.