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US5346853A Expired / Lapsed US ⏱️ 0.0 years remaining

Microwave energized deposition process with substrate temperature control for the fabrication of P-I-N photovoltaic devices

Assignee: United Solar Systems Corp
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Filing: 1994-01-21
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Granted: 1994-09-13
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Expires: 2014-01-21
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Abstract

Abstract Substrate temperatures are maintained above 400 DEG C. During the microwave energized glow discharge deposition of Group IV semiconductor materials. The substrate temperature range provides for the preparation of materials having improved electrical properties. Cell efficiency of a photovoltaic device of the p-i-n type is significantly improved by depositing the intrinsic layer using a microwave generated plasma and a substrate temperature in excess of 400 DEG C. Maximum cell efficiency occurs for depositions carried out in the range of 400 DEG -500 DEG C.

Inventors

  • 👤 Subhendu Guha
  • 👤 Chi C. Yang
  • 👤 XiXiang Xu

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 04:00
CPC Classifications
H; H10; H10F; H10F71/00; H10F71/10; H10F71/103; H10F71/1035; H10F71/107; H10P; H10P14/00; H10P14/20; H10P14/24; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/3438; H10P14/3441; H10P14/3444; Y; Y02; Y02E; Y02E10/00; Y02E10/50; Y02P; Y02P70/00; Y02P70/50

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 289 words
A method for the manufacture of an p-i-n type photovoltaic device of the type comprising a body of substantially intrinsic Group IV semiconductor alloy interposed between two oppositely doped semiconductor layers, said method including the steps of: I. Depositing a body of semiconductor material of a first conductivity type upon a substrate; II. Depositing a body of a substantially intrinsic Group IV semiconductor alloy upon said body of semiconductor :material of a first conductivity type, by a microwave energized glow discharge deposition process comprising: a. providing a deposition system having a plasma region defined therein, said system including a conduit for introducing a process gas there into and a source of of microwave energy for activating said process gas in said plasma region so as to decompose said gas and form a plasma therefrom; b. supporting said substrate, with said body of semiconductor material of a first conductivity type thereupon, in said plasma region; c. maintaining said substrate at a temperature in excess of 400° C.; d. introducing a process gas having a Group IV semiconductor element therein into said system; e. maintaining the process gas at a process pressure which is less than atmospheric; f. inputting microwave energy into said system at a power level at least sufficient to sustain a plasma of said process gas at said process pressure in said plasma region, whereby said microwave energy creates a plasma from, and decomposes, the process gas so as to deposit a layer of said Group IV semiconductor alloy material on the body of semiconductor material of a first conductivity type; and III. Depositing a body of semiconductor material of a second conductivity type, opposite said first conductivity type, upon said layer of Group IV semiconductor alloy material.
Claim 2
Independent Claim 289 words
A method for the manufacture of an p-i-n type photovoltaic device of the type comprising a body of substantially intrinsic Group IV semiconductor alloy interposed between two oppositely doped semiconductor layers, said method including the steps of: I. Depositing a body of semiconductor material of a first conductivity type upon a substrate; II. Depositing a body of a substantially intrinsic Group IV semiconductor alloy upon said body of semiconductor :material of a first conductivity type, by a microwave energized glow discharge deposition process comprising: a. providing a deposition system having a plasma region defined therein, said system including a conduit for introducing a process gas there into and a source of of microwave energy for activating said process gas in said plasma region so as to decompose said gas and form a plasma therefrom; b. supporting said substrate, with said body of semiconductor material of a first conductivity type thereupon, in said plasma region; c. maintaining said substrate at a temperature in excess of 400° C.; d. introducing a process gas having a Group IV semiconductor element therein into said system; e. maintaining the process gas at a process pressure which is less than atmospheric; f. inputting microwave energy into said system at a power level at least sufficient to sustain a plasma of said process gas at said process pressure in said plasma region, whereby said microwave energy creates a plasma from, and decomposes, the process gas so as to deposit a layer of said Group IV semiconductor alloy material on the body of semiconductor material of a first conductivity type; and III. Depositing a body of semiconductor material of a second conductivity type, opposite said first conductivity type, upon said layer of Group IV semiconductor alloy material.
Claim 3
Dependent Claim 124 words
In a method for the manufacture of a p-i-n type photovoltaic device by a process which includes the steps of: depositing a first, doped layer of a semiconductor material of a first conductivity type on a substrate; depositing a substantially intrinsic layer of a Group IV semiconductor alloy material upon said first doped layer by a microwave energized glow discharge deposition process; and depositing a second doped layer of a semiconductor material of a second conductivity type, opposite said first conductivity type, upon said substantially intrinsic layer, wherein the improvement comprises in combination: maintaining said substrate, with said first doped layer thereupon, at a temperature which is greater than 400° C., but less than 500° C. during the deposition of said substantially intrinsic layer.
Claim 4
Dependent Claim 124 words
In a method for the manufacture of a p-i-n type photovoltaic device by a process which includes the steps of: depositing a first, doped layer of a semiconductor material of a first conductivity type on a substrate; depositing a substantially intrinsic layer of a Group IV semiconductor alloy material upon said first doped layer by a microwave energized glow discharge deposition process; and depositing a second doped layer of a semiconductor material of a second conductivity type, opposite said first conductivity type, upon said substantially intrinsic layer, wherein the improvement comprises in combination: maintaining said substrate, with said first doped layer thereupon, at a temperature which is greater than 400° C., but less than 500° C. during the deposition of said substantially intrinsic layer.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-09-12 1998-03-14 1998-09-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-09-12 2002-03-14 2002-09-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-09-12 2006-03-14 2006-09-13 $7700.00 Window Closed / Lapsed

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