US5317385A — Portable extended life metrology system for measu…

Claim 1

Independent Claim 271 words

In a metrology system of the kind comprising: (a) a radiation source for directing a beam of radiation on a component whose parameter is to be measured, structure for producing two separate beams of radiation from portions of radiation modified by said component, optical structure for causing said two beams to interact and form an interference fringe pattern as a function of said parameter to be measured; (b) transducer apparatus responsive to said interference fringe pattern for simultaneously generating three intensity-modulated optical signals, I R , I S and I T , that are related to said interference fringe pattern, signal processing apparatus for accurately determining an aspect of said interference fringe pattern from said three signals; (c) means for accumulating phase information proportional to said aspect of said interference fringe pattern; and (d) means for converting said accumulated phase and aspect information to desired outputs indicative of said parameter to be measured; the improvement comprising: (e) a pulsed drive circuit designed to minimize power drain on said metrology system without affecting its measurement accuracy, said pulse drive circuit comprising: (f) a variable frequency pulse generator circuit coupled between the output of said signal processing apparatus and said radiation source to drive said source in a pulsed mode; (g) a comparator circuit coupled between said means for accumulating phase information and said variable frequency pulse generator circuit to control the energy per pulse and the pulse rate of said source in said pulsed mode; and (h) an energy source connected to said source to power said radiation source in said pulsed mode, including means to return residual energy to said system.

Claim 2

Dependent Claim 271 words

In a metrology system of the kind comprising: (a) a radiation source for directing a beam of radiation on a component whose parameter is to be measured, structure for producing two separate beams of radiation from portions of radiation modified by said component, optical structure for causing said two beams to interact and form an interference fringe pattern as a function of said parameter to be measured; (b) transducer apparatus responsive to said interference fringe pattern for simultaneously generating three intensity-modulated optical signals, I R , I S and I T , that are related to said interference fringe pattern, signal processing apparatus for accurately determining an aspect of said interference fringe pattern from said three signals; (c) means for accumulating phase information proportional to said aspect of said interference fringe pattern; and (d) means for converting said accumulated phase and aspect information to desired outputs indicative of said parameter to be measured; the improvement comprising: (e) a pulsed drive circuit designed to minimize power drain on said metrology system without affecting its measurement accuracy, said pulse drive circuit comprising: (f) a variable frequency pulse generator circuit coupled between the output of said signal processing apparatus and said radiation source to drive said source in a pulsed mode; (g) a comparator circuit coupled between said means for accumulating phase information and said variable frequency pulse generator circuit to control the energy per pulse and the pulse rate of said source in said pulsed mode; and (h) an energy source connected to said source to power said radiation source in said pulsed mode, including means to return residual energy to said system.

Claim 3

Dependent Claim 40 words

In the metrology system of claim 1 wherein said variable frequency pulse generator circuit includes logic elements and said comparator circuit includes a timing control unit connected to said logic elements to power said radiation source in said pulsed mode.

Claim 4

Dependent Claim 37 words

In the metrology system of claim 1, wherein said pulsed mode of said radiation source has two operative states: a low standby update rate and an operational update rate, with the change between the states being self-adaptive.

Claim 5

Dependent Claim 55 words

In the metrology system of claim 2 wherein said variable frequency pulse generator circuit further includes summing resistors connected to said transducer apparatus to sum the electrical signals R, S, T corresponding to said three intensity-modulated optical signals and coupling their sum to said logic elements, where said sum is compared against a reference voltage.

Claim 6

Dependent Claim 30 words

In the metrology system of claim 1, wherein said means to return said residual energy to said system comprises an inductor coupled between said energy source and said radiation source.

Claim 7

Dependent Claim 32 words

In the metrology system of claim 1 wherein said system is operated in class B mode such that with no beam of radiation being detected, no current is drawn from said battery.

Claim 8

Dependent Claim 21 words

In the metrology system of claim 1 wherein said means for accumulating phase information includes CMOS electronics for processing and storage.

Claim 9

Dependent Claim 86 words

In the metrology system of claim 5 wherein said logic elements include an FET whose drain-source circuit is connected between said radiation source and said energy source, a comparator and an AND-gate sequentially coupled to the base of said FET, the output of said comparator circuit forming a second input to said AND-gate, said comparator summing said there electrical signals R, S, T corresponding to said intensity-modulated optical signal, I R , I S and I T , and comparing their sum to a voltage reference.

Claim 10

Dependent Claim 256 words

In a metrology system of the kind comprising: (a) means for generating an interference fringe pattern as a function of a parameter to be measured, said interference fringe pattern generating means including a laser diode that has a narrow collimated output beam of radiation that is normally incident on the component whose parameter is to be sensed and produces two diffracted beams, and optical means for collecting and bringing said two diffracted beams together again form interference fringes; (b) transducer apparatus for simultaneously generating three intensity-modulated optical signals, I R , I S and I T , that are related to said interference fringe pattern; (c) signal processing apparatus for accurately determining an aspect of said interference fringe pattern from said three signals; (d) means for accumulating phase information proportional to said aspect of said interference fringe pattern; and (e) means for converting said accumulated phase and aspect information to desired outputs indicative of said parameter to be measured; the improvement comprising: (f) a pulsed drive circuit comprising: (g) a variable frequency pulse generator circuit coupled between the output of said signal processing apparatus and said laser diode to drive said diode in a pulsed mode; (h) a comparator circuit coupled to said means for accumulating phase information and to said variable frequency pulse generator circuit; and (i) said variable frequency pulse generator circuit including an energy source and an inductor coupled between said energy source and said laser diode to charge said diode and to return energy stored in said inductor to said energy source.

Claim 11

Dependent Claim 256 words

In a metrology system of the kind comprising: (a) means for generating an interference fringe pattern as a function of a parameter to be measured, said interference fringe pattern generating means including a laser diode that has a narrow collimated output beam of radiation that is normally incident on the component whose parameter is to be sensed and produces two diffracted beams, and optical means for collecting and bringing said two diffracted beams together again form interference fringes; (b) transducer apparatus for simultaneously generating three intensity-modulated optical signals, I R , I S and I T , that are related to said interference fringe pattern; (c) signal processing apparatus for accurately determining an aspect of said interference fringe pattern from said three signals; (d) means for accumulating phase information proportional to said aspect of said interference fringe pattern; and (e) means for converting said accumulated phase and aspect information to desired outputs indicative of said parameter to be measured; the improvement comprising: (f) a pulsed drive circuit comprising: (g) a variable frequency pulse generator circuit coupled between the output of said signal processing apparatus and said laser diode to drive said diode in a pulsed mode; (h) a comparator circuit coupled to said means for accumulating phase information and to said variable frequency pulse generator circuit; and (i) said variable frequency pulse generator circuit including an energy source and an inductor coupled between said energy source and said laser diode to charge said diode and to return energy stored in said inductor to said energy source.

Claim 12

Dependent Claim 45 words

In the metrology system of claim 9 including logic elements and a timing control unit to power said laser diode in said a pulsed mode, said mode having two operative states: a low rate and an operational rate, with switching therebetween being incremental and self-adaptive.

Claim 13

Dependent Claim 43 words

In the metrology system of claim 10 further including summing resistors coupled to said signal processing apparatus to sum the balanced electrical signals R. S, T corresponding to said three intensity-modulated optical signals to said logic elements for comparison against a reference voltage.

Claim 14

Dependent Claim 31 words

In the metrology system of claim 11 wherein said system is operated in class B mode and wherein said means for accumulating phase information includes CMOS electronics for processing and storage.

Annuity Stage	Window Opens	Payment Deadline	Surcharge Period Until	Estimated Fee	Status
3.5 Years (Year 4)	1997-05-30	1997-11-29	1998-05-31	$2000.00	Window Closed / Lapsed
7.5 Years (Year 8)	2001-05-30	2001-11-29	2002-05-31	$3760.00	Window Closed / Lapsed
11.5 Years (Year 12)	2005-05-30	2005-11-29	2006-05-31	$7700.00	Window Closed / Lapsed

Portable extended life metrology system for measuring scale displacement with three output signals using a pulsed source

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