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Arsenic passivation for epitaxial deposition of ternary chalcogenide semiconductor films onto silicon substrates

Assignee: The AT&T MVPD Group LLC
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Filing: 1993-04-06
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Granted: 1994-04-26
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Expires: 2013-04-06
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Abstract

Abstract Ternary II-VI semiconductor films (16) are formed on a silicon substrate (12) by first depositing a monolayer of arsenic (14) or other Group V metal on a cleaned surface of the substrate. The ternary II-VI semiconductor film is then formed over the arsenic monolayer, either directly thereon or on top of an intermediate II-VI semiconductor buffer layer (18). The use of an arsenic passivating layer facilitates the epitaxial deposition of technologically important II-VI semiconductors such as ZnTe, CdTe, and HgCdTe on silicon substrates of arbitrary crystallographic orientation.

Inventors

  • 👤 Terence J. de Lyon

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-28 15:06
CPC Classifications
C; C30; C30B; C30B23/00; C30B23/02; C30B25/00; C30B25/02; C30B29/00; C30B29/10; C30B29/46; C30B29/48; H; H10; H10P; H10P14/00; H10P14/20; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/2926; H10P14/32; H10P14/3202; H10P14/3242; H10P14/3244; H10P14/3246; H10P14/34; H10P14/3402; H10P14/3424; H10P14/3432; H10P14/3466; Y; Y10; Y10S; Y10S148/00; Y10S148/064; Y10S438/00; Y10S438/93; Y10S438/933

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 67 words
A method of growing a ternary or quaternary II-VI semiconductor layer on a silicon substrate, comprising: (a) providing said silicon substrate having a major surface; (b) depositing a monolayer of a Group V element selected from the group consisting of arsenic, phosphorus, and antimony on said major surface of said silicon substrate; and (c) depositing said ternary or quaternary II-VI semiconductor layer over said Group V monolayer.
Claim 2
Independent Claim 67 words
A method of growing a ternary or quaternary II-VI semiconductor layer on a silicon substrate, comprising: (a) providing said silicon substrate having a major surface; (b) depositing a monolayer of a Group V element selected from the group consisting of arsenic, phosphorus, and antimony on said major surface of said silicon substrate; and (c) depositing said ternary or quaternary II-VI semiconductor layer over said Group V monolayer.
Claim 3
Dependent Claim 12 words
The method of claim 1 wherein said monolayer consists essentially of arsenic.
Claim 4
Dependent Claim 35 words
The method of claim 1 further including, subsequent to step (b), depositing a II-VI buffer layer on said Group V monolayer and then depositing said ternary or quaternary II-VI semiconductor compound on said buffer layer.
Claim 5
Dependent Claim 17 words
The method of claim 3 wherein said buffer layer comprises a binary or ternary II-VI buffer layer.

References Cited (Backward Citations)

US3729341A Cited
US4931132A Cited
US4910154A Cited
US5028561A Cited
US5021360A Cited
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US5136347A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-04-25 1997-10-25 1998-04-26 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-04-25 2001-10-25 2002-04-26 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-04-25 2005-10-25 2006-04-26 $7700.00 Window Closed / Lapsed

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