US5236866A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Metal interconnection layer having reduced hillock formation in semi-conductor device and manufacturing method therefor
Assignee: Mitsubishi Electric Corp
•
Filing: 1992-10-13
•
Granted: 1993-08-17
•
Expires: 2012-10-13
Abstract
Abstract A semiconductor device having multilayer interconnections with reduced formation of hillocks is provided. An Al wiring layer formed on a substrate is patterned for Al wirings. Impurity ions such as Al, Ar, As, P and Sb or the like are implanted on the entire surface including sidewalls of the provided Al wirings. Such impurity ions are implanted to entire surface including sidewalls of the Al wirings, the grain size of granular material at sidewalls of the Al wirings can be made smaller than that of the granular material at inner portions of the metal wirings. As the grain size is reduced, the size of the generated hillocks is reduced. Consequently, short circuits between Al wirings in the same layer can be prevented, enabling provision of highly reliable and highly integrated semiconductor devices.
Inventors
- 👤 Takao Yasue
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 21:15
CPC Classifications
H; H10; H10P; H10P95/00; Y; Y10; Y10S; Y10S438/00; Y10S438/937
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
138 words
For a semiconductor device formed of a semiconductor substrate having at least one element thereon and at least one conducting strip on said substrate for connecting to at least one said element, wherein said conducting strip is made of a granular metallic material, said strip having inner, upper and sidewall portions, and wherein hillocks tend to form on said conducting strip as a result of temperature variations imparted thereto, a method of prevent formation of said hillocks on said wiring strip, comprising the step of: implanting impurities to form the grain size of said metallic material in the upper and sidewall portions of said conducting strip to be less than that in said inner portion of said strip, wherein said impurities are ions of an element selected from the group consisting of Al, Ar, As, P and Sb.
Claim 2
Dependent Claim
138 words
For a semiconductor device formed of a semiconductor substrate having at least one element thereon and at least one conducting strip on said substrate for connecting to at least one said element, wherein said conducting strip is made of a granular metallic material, said strip having inner, upper and sidewall portions, and wherein hillocks tend to form on said conducting strip as a result of temperature variations imparted thereto, a method of prevent formation of said hillocks on said wiring strip, comprising the step of: implanting impurities to form the grain size of said metallic material in the upper and sidewall portions of said conducting strip to be less than that in said inner portion of said strip, wherein said impurities are ions of an element selected from the group consisting of Al, Ar, As, P and Sb.
Claim 3
Dependent Claim
24 words
The method of claim 1, wherein said step of implanting includes imparting rotary ion implantation to both upper and sidewall surfaces of said strip.
Claim 4
Dependent Claim
35 words
The method of claim 7, wherein said step of rotary implantating includes the steps of generating a beam of said impurity ions; aligning said substrate to be non-orthogonal to said beam and rotating said substrate.
Claim 5
Dependent Claim
27 words
The method of claim 1, wherein said impurity ions are implanted to the depths of about 800 to 2000 Å from the surface of said metal wiring.
Claim 6
Dependent Claim
19 words
The method of claim 1, wherein said impurity ions have a concentration higher than 2.9×10 20 /cm 3 .
Claim 7
Dependent Claim
128 words
For a semiconductor device formed on a semiconductor substrate having at least one element thereon and at least one conducting strip on said substrate for connecting to at least one said element, wherein said conducting strip is made of a granular metallic material, said strip having inner, upper and sidewall portions, and wherein hillocks tend to form on said conducting strip as a result of temperature variations imparted thereto, a method of preventing formation of said hillocks on said wiring strip, comprising the step of: implanting impurities to form the upper and sidewall portions of said strip to have a grain size of less than approximately one micrometer, wherein said impurities are ions of an element selected from the group consisting of Al, Ar, As, P and Sb.
Claim 8
Dependent Claim
128 words
For a semiconductor device formed on a semiconductor substrate having at least one element thereon and at least one conducting strip on said substrate for connecting to at least one said element, wherein said conducting strip is made of a granular metallic material, said strip having inner, upper and sidewall portions, and wherein hillocks tend to form on said conducting strip as a result of temperature variations imparted thereto, a method of preventing formation of said hillocks on said wiring strip, comprising the step of: implanting impurities to form the upper and sidewall portions of said strip to have a grain size of less than approximately one micrometer, wherein said impurities are ions of an element selected from the group consisting of Al, Ar, As, P and Sb.
Claim 9
Dependent Claim
24 words
The method of claim 6, wherein said step of implanting includes imparting rotary ion implantation to both upper and sidewall surfaces of said strip.
Claim 10
Dependent Claim
19 words
The method of claim 6, wherein said impurity ions have a concentration higher than 2.9×10 20 /cm 3 .
References Cited (Backward Citations)
JPS594058A
Cited
US4918027A
Cited
US5047359A
Cited
US4704367A
Cited
JPS63122245A
Cited
US4942138A
Cited
US5040048A
Cited
US5018001A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1996-08-16 | 1997-02-15 | 1997-08-17 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-08-16 | 2001-02-15 | 2001-08-17 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-08-16 | 2005-02-15 | 2005-08-17 | $7700.00 | Window Closed / Lapsed |