Programmable input/output buffer circuit with test capability

Claim 2

In an integrated circuit having system logic with programmable elements, decoding logic coupled to said programming elements for addressing said programming elements, a plurality of input/output buffer circuits for passing signals between said system logic and the exterior of said integrated circuit through input/output terminals, each input/output buffer circuit comprising an output driver stage having an input terminal, and an output terminal connected to an input/output terminal; a plurality of cells, each cell having a first multiplexer, a first means connected to an output terminal of said first multiplexer for storing a signal from said first multiplexer, a second means connected to an output terminal of said first storing means for storing a signal from said first storing means, and a second multiplexer connected to an output terminal of said second storing means, at least one of said multiplexers of said plurality of said cells connected to said system logic and to said output driver stage input terminal for signals from said system logic to said output driver stage, and at least one of said multiplexers of said plurality of said cells connected to said input/output terminal and to said system logic for signals from said input/output terminal to said system logic, said cells connected to each other and cells of other input/output buffer circuits from an output terminal of a first storing means of one cell to a first input terminal of a first multiplexer of another cell for serial scanning of signals through said cells to test said system logic; control lines connected to said output terminals of said second storing means of said cells and to said decoding logic coupled to said programming elements; whereby said programming elements can be addressed for programming by serially scanning control signals through said cells.

Claim 3

The input/output buffer circuit as in claim 1 wherein said system logic comprises a field programmable logic array.

Claim 4

The input/output buffer circuit as in claim 2 wherein said programmable elements comprise antifuses.

Claim 5

The input/output buffer circuit as in claim 1 wherein a first one of said cells has said at least one of said multiplexers of said plurality of said cells connected to said system logic and to said output driver stage input terminal for signals from said system logic to said output driver stage, and a second one of said cells has said at least one of said multiplexers of said plurality of said cells connected to said input/output terminal and to said system logic for signals from said input/output terminal to said system logic.

Claim 6

In an integrated circuit having system logic, a plurality of input/output buffer circuits for passing signals between said system logic and the exterior of said integrated circuit through input/output terminals, each input/output buffer circuit comprising an output driver stage having an input terminal, and an output terminal connected to an input/output terminal; a plurality of cells, each cell having a first multiplexer, a first means connected to an output terminal of said first multiplexer for storing a signal from said first multiplexer, a second means connected to an output terminal of said first storing means for storing a signal from said first storing means and a second multiplexer connected to an output terminal of said second storing means, at least one of said multiplexers of said plurality of said cells connected to said system logic and to said output driver stage input terminal for signals from said system logic to said output driver stage, and at least one of said multiplexers of said plurality of said cells connected to said input/output terminal and to said system logic for signals from said input/output terminal to said system logic, said cells connected to each other and cells of other input/output buffer circuits from an output terminal of a first storing means of one cell to a first input of a first multiplexer of another cell for serial scanning of signals through said cells to test said system logic; at least one signal storage element connected to said output driver stage for controlling the drive characteristics of said output driver stage responsive to a logic signal stored in said storage element; a decoder for addressing said signal storage element for storing a logic signal in said storage element; control lines connected to said output terminals of said second storing means of said cells and to said decoder; whereby said programming elements can be addressed for storing a logic signal therein to control the drive characteristics of said output driver stage by serially scanning control signals through said cells.

Claim 7

In an integrated circuit having system logic, a plurality of input/output buffer circuits for passing signals between said system logic and the exterior of said integrated circuit through input/output terminals, each input/output buffer circuit comprising an output driver stage having an input terminal, and an output terminal connected to an input/output terminal; a plurality of cells, each cell having a first multiplexer, a first means connected to an output terminal of said first multiplexer for storing a signal from said first multiplexer, a second means connected to an output terminal of said first storing means for storing a signal from said first storing means and a second multiplexer connected to an output terminal of said second storing means, at least one of said multiplexers of said plurality of said cells connected to said system logic and to said output driver stage input terminal for signals from said system logic to said output driver stage, and at least one of said multiplexers of said plurality of said cells connected to said input/output terminal and to said system logic for signals from said input/output terminal to said system logic, said cells connected to each other and cells of other input/output buffer circuits from an output terminal of a first storing means of one cell to a first input of a first multiplexer of another cell for serial scanning of signals through said cells to test said system logic; at least one signal storage element connected to said output driver stage for controlling the drive characteristics of said output driver stage responsive to a logic signal stored in said storage element; a decoder for addressing said signal storage element for storing a logic signal in said storage element; control lines connected to said output terminals of said second storing means of said cells and to said decoder; whereby said programming elements can be addressed for storing a logic signal therein to control the drive characteristics of said output driver stage by serially scanning control signals through said cells.

Claim 8

The input-output buffer circuit as in claim 5 wherein said output driver stage has means for controlling the amount of drive current responsive to said at least one signal storage element.

Claim 9

The input-output buffer circuit as in claim 5 wherein said output driver stage has means for controlling the slew rate responsive to at least one signal storage element.

Claim 10

The input/output buffer circuit as in claim 5 wherein at least one signal storage element comprises a field programmable element.

Claim 11

The input/output buffer circuit as in claim 5 wherein said storage element comprises a programmable element and a logic signal is stored in said element by programming said element.

Claim 12

The input/output buffer circuit as in claim 5 wherein said storage element comprises a memory circuit and a logic signal is stored in said circuit by reading in said logic signal into said circuit.

Claim 13

The input/output buffer circuit as in claim 5 wherein a first one of said cells has said at least one of said multiplexers of said plurality of said cells connected to said system logic and to said output driver stage input terminal for signals from said system logic to said output driver stage, and a second one of said cells has said at least one of said multiplexers of said plurality of said cells connected to said input/output terminal and to said system logic for signals from said input/output terminal to said system logic.

Claim 14

In an integrated circuit having system logic, a plurality if input/output buffer circuits for passing signals between said system logic and the exterior of said integrated circuit through input/output terminals, each input/output buffer circuit comprising an output driver stage having an input terminal, and an output terminal connected to an input/output terminal; a plurality of cells, each cell having a first multiplexer, a first means connected to an output terminal of said first multiplexer for storing a signal from said first multiplexer, a second means connected to an output terminal of said first storing means for storing a signal from said first storing means and a second multiplexer connected to an output terminal of said second storing means, one of said multiplexers of said plurality of cells connected to said system logic and to said output driver stage input terminal for signals from said system logic to said output driver stage, said cells connected to each other and cells of other input/output buffer circuits from an output terminal of first storing means of one cell to a first input of a first multiplexer of another cell for serial scanning of signals through said cells to test said system logic; one of said cells having an input terminal of a multiplexer connected to said input/output terminal, an output terminal of said multiplexer connected to the system logic of said integrated circuit for signals from said input/output terminal to said system logic, said multiplexer having means for selecting an operating range of signals from said input/output terminal; at least one signal storage element connected to said selecting means so that said selecting means selects an operating range of signals from said input/output terminal responsive to a logic signal stored in said storage element; decoding logic for addressing said signal storage element for storing a logic signal in said storage element; control lines connected to said output terminals of said second storing means of said cells and to said decoding logic; whereby said programming elements can be addressed for storing a logic signal therein to control said operating range of signals from said input/output terminal by serially scanning control signals through said cells.

Claim 15

In an integrated circuit having system logic, a plurality if input/output buffer circuits for passing signals between said system logic and the exterior of said integrated circuit through input/output terminals, each input/output buffer circuit comprising an output driver stage having an input terminal, and an output terminal connected to an input/output terminal; a plurality of cells, each cell having a first multiplexer, a first means connected to an output terminal of said first multiplexer for storing a signal from said first multiplexer, a second means connected to an output terminal of said first storing means for storing a signal from said first storing means and a second multiplexer connected to an output terminal of said second storing means, one of said multiplexers of said plurality of cells connected to said system logic and to said output driver stage input terminal for signals from said system logic to said output driver stage, said cells connected to each other and cells of other input/output buffer circuits from an output terminal of first storing means of one cell to a first input of a first multiplexer of another cell for serial scanning of signals through said cells to test said system logic; one of said cells having an input terminal of a multiplexer connected to said input/output terminal, an output terminal of said multiplexer connected to the system logic of said integrated circuit for signals from said input/output terminal to said system logic, said multiplexer having means for selecting an operating range of signals from said input/output terminal; at least one signal storage element connected to said selecting means so that said selecting means selects an operating range of signals from said input/output terminal responsive to a logic signal stored in said storage element; decoding logic for addressing said signal storage element for storing a logic signal in said storage element; control lines connected to said output terminals of said second storing means of said cells and to said decoding logic; whereby said programming elements can be addressed for storing a logic signal therein to control said operating range of signals from said input/output terminal by serially scanning control signals through said cells.

Claim 16

The input/output buffer circuit as in claim 12 wherein said operating range of signals is a voltage range of input signals on said input/output terminal.

Claim 17

The input/output buffer circuit as in claim 12 wherein said storage element comprises a programmable element and a logic signal is stored in said element by programming said element.

Claim 18

The input/output buffer circuit as in claim 12 wherein said storage element comprises a memory circuit and a logic signal is stored in said circuit by reading in said logic signal into said circuit.

Claim 19

The input/output buffer circuit as in claim 12 wherein a first one of said cells has said one of said multiplexers of said plurality of said cells connected to said system logic and to said output driver stage input terminal for signals from said system logic to said output driver stage, and a second one of said cells has said input terminal of a multiplexer connected to said input/output terminal, an output terminal of said multiplexer connected to the system logic of said integrated circuit for signals from said input/output terminal to said system logic.

Claim 20

The input/output buffer circuit as in claim 16 wherein said multiplexer of said one of said cells comprises said second multiplexer of said cell.

Claim 21

In an integrated circuit having system logic, a plurality of input/output buffer circuits for passing signals between said system logic and the exterior of said integrated circuit through input/output terminals, each input/output buffer circuit comprising an output driver stage having an input terminal, and an output terminal connected to an input/output terminal, and means for selecting drive characteristics of said stage; a plurality of cells, each cell having a first multiplexer, a first means connected to an output terminal of said first multiplexer for storing a signal from said first multiplexer, a second means connected to an output terminal of said first storing means for storing a signal from said first storing means, and a second multiplexer connected to an output terminal of said second storing means, one of said multiplexers of said plurality of cells connected to said system logic and to said output driver stage input terminal for signals from said system logic to said output driver stage, said cells connected to each other and cells of other input/output buffer circuits from an output terminal of first storing means of one cell to a first input terminal of a first multiplexer of another cell for serial scanning of signals through said cells to test said system logic; one of said cells having an input terminal of a multiplexer connected to said input/output terminal, an output terminal of said multiplexer connected to said system logic of said integrated circuit for signals from said input/output terminal to said system logic; a plurality of signal storage elements connected to said multiplexer of said one cell for selecting an operating range of signals from said input/output terminal and to said output driver stage for selecting the drive characteristics of said output driver stage responsive to logic signals stored in said signal storage elements; decoding logic for addressing said signal storage element for storing logic signals in said storage elements; and control lines connected to said output terminals of said second storing means of said cells and to said decoding logic coupled to said signal storage elements; whereby said signal storage elements can be addressed for storing logic signals therein to select said operating range for signals from said input/output terminal and said drive characteristics of said output driver stage by serially scanning control signals through said cells.

Claim 22

In an integrated circuit having system logic, a plurality of input/output buffer circuits for passing signals between said system logic and the exterior of said integrated circuit through input/output terminals, each input/output buffer circuit comprising an output driver stage having an input terminal, and an output terminal connected to an input/output terminal, and means for selecting drive characteristics of said stage; a plurality of cells, each cell having a first multiplexer, a first means connected to an output terminal of said first multiplexer for storing a signal from said first multiplexer, a second means connected to an output terminal of said first storing means for storing a signal from said first storing means, and a second multiplexer connected to an output terminal of said second storing means, one of said multiplexers of said plurality of cells connected to said system logic and to said output driver stage input terminal for signals from said system logic to said output driver stage, said cells connected to each other and cells of other input/output buffer circuits from an output terminal of first storing means of one cell to a first input terminal of a first multiplexer of another cell for serial scanning of signals through said cells to test said system logic; one of said cells having an input terminal of a multiplexer connected to said input/output terminal, an output terminal of said multiplexer connected to said system logic of said integrated circuit for signals from said input/output terminal to said system logic; a plurality of signal storage elements connected to said multiplexer of said one cell for selecting an operating range of signals from said input/output terminal and to said output driver stage for selecting the drive characteristics of said output driver stage responsive to logic signals stored in said signal storage elements; decoding logic for addressing said signal storage element for storing logic signals in said storage elements; and control lines connected to said output terminals of said second storing means of said cells and to said decoding logic coupled to said signal storage elements; whereby said signal storage elements can be addressed for storing logic signals therein to select said operating range for signals from said input/output terminal and said drive characteristics of said output driver stage by serially scanning control signals through said cells.

Claim 23

The input-output buffer circuit as in claim 18 wherein said output driver stage selecting means includes means for controlling the amount of drive current responsive to said at least one signal storage element.

Claim 24

The input-output buffer circuit as in claim 18 wherein said output driver stage selecting means includes means for controlling the slew rate responsive to at least one signal storage element.

Claim 25

The input-output buffer circuit as in claim 18 wherein said output driver stage has means for controlling the logic state of said output driver stage responsive to at least one signal storage element whereby said output driver stage can operate as an open source or open drain.

Claim 26

The input/output buffer circuit as in claim 18 wherein said operating range of signals is a voltage range of input signals on said input/output terminal.

Claim 27

The input/output buffer circuit as in claim 18 wherein said signal storage elements comprises field programmable elements.

Claim 28

The input/output buffer circuit as in claim 18 wherein said storage elements comprise a programmable element and a logic signal is stored in said element by programming said element.

Claim 29

The input/output buffer circuit as in claim 18 wherein said storage element comprises a memory circuit and a logic signal is stored in said circuit by reading in said logic signal into said circuit.

Claim 30

The input/output buffer circuit as in claim 18 wherein a first one of said cells has said one of said multiplexers of said plurality of said cells connected to said system logic and to said output driver stage input terminal for signals from said system logic to said output driver stage, and a second one of said cells has said input terminal of a multiplexer connected to said input/output terminal, an output terminal of said multiplexer connected to said system logic of said integrated circuit for signals from said input/output terminal to said system logic.

Claim 31

The input/output buffer circuit as in claim 26 wherein said multiplexer of said one of said cells comprises said second multiplexer of said cell.

Claim 32

In an integrated circuit having system logic, a plurality of input/output buffer circuits for passing signals between said system logic and the exterior of said integrated circuit through input/output terminals, each input/output buffer circuit comprising an output driver stage having an input terminal, and an output terminal connected to an input/output terminal; a plurality of cells, each cell having a first multiplexer, a first means connected to an output terminal of said first multiplexer for storing a signal from said first multiplexer, a second means connected to an output terminal of said first storing means for storing a signal from said first storing means and a second multiplexer connected to an output terminal of said second storing means, said cells connected to each other and cells of other input/output buffer circuits from an output terminal of a first storing means of one cell to a first input terminal of a first multiplexer of another cell for serial scanning of signals through said cells to test said system logic; a first one of said cells having an input terminal of a second multiplexer connected to the system logic of said integrated circuit, and an output terminal of said second multiplexer connected to said input terminal of said output driver stage for signals from said system logic to said output driver stage, and a second input terminal of a first multiplexer connected to a first node of said integrated circuit; and a second one of said cells having an input terminal of a second multiplexer connected to said input/output terminal, an output terminal of said second multiplexer connected to said system logic for signals from said input/output terminal to said system logic, a second input terminal of a first multiplexer connected to said output terminal of said second multiplexer, and a third input terminal of said first multiplexer connected to a second node of said integrated circuit; whereby signals can be introduced into said cells through said second input terminal of said first multiplexer of said first cell and said third input terminal of said first multiplexer of said second cell.

Claim 33

In an integrated circuit having system logic, a plurality of input/output buffer circuits for passing signals between said system logic and the exterior of said integrated circuit through input/output terminals, each input/output buffer circuit comprising an output driver stage having an input terminal, and an output terminal connected to an input/output terminal; a plurality of cells, each cell having a first multiplexer, a first means connected to an output terminal of said first multiplexer for storing a signal from said first multiplexer, a second means connected to an output terminal of said first storing means for storing a signal from said first storing means and a second multiplexer connected to an output terminal of said second storing means, said cells connected to each other and cells of other input/output buffer circuits from an output terminal of a first storing means of one cell to a first input terminal of a first multiplexer of another cell for serial scanning of signals through said cells to test said system logic; a first one of said cells having an input terminal of a second multiplexer connected to the system logic of said integrated circuit, and an output terminal of said second multiplexer connected to said input terminal of said output driver stage for signals from said system logic to said output driver stage, and a second input terminal of a first multiplexer connected to a first node of said integrated circuit; and a second one of said cells having an input terminal of a second multiplexer connected to said input/output terminal, an output terminal of said second multiplexer connected to said system logic for signals from said input/output terminal to said system logic, a second input terminal of a first multiplexer connected to said output terminal of said second multiplexer, and a third input terminal of said first multiplexer connected to a second node of said integrated circuit; whereby signals can be introduced into said cells through said second input terminal of said first multiplexer of said first cell and said third input terminal of said first multiplexer of said second cell.

Claim 34

The input/output buffer circuits as in claim 28 wherein said first and second nodes are in said system logic of said integrated circuit.

Claim 35

The input/output buffer circuits as in claim 29 wherein system logic comprises a field programmable logic array and said first and second nodes have logic states responsive to the programming of said field programmable logic array.

Claim 36

The input/output buffer circuits as in claim 28 further comprising a third input terminals of said first multiplexer of said first cell and a fourth input of said first multiplexer of said second cell, said third and fourth input terminals connected to said system logic of said integrated circuit whereby signals can be introduced into said cells through said third and fourth terminals.

Claim 37

The input/output buffer circuits as in claim 31 further comprising a fourth input terminal of said first multiplexer of said first cell connected to said input terminal of said second multiplexer.

Claim 38

The input/output buffer circuits as in claim 28 further comprising signal lines connected from each output terminal of second storing means of said first and second cells to said system logic of said integrated circuit whereby signals in said second storing means in said first and second cells may be passed into said system logic.

Claim 39

The input/output buffer circuits as in claim 33 wherein said system logic comprises elements programmable by said signals in said second storing means in said first and second cells.

Claim 40

The input/output buffer circuits as in claim 33 further comprising a programming unit, said programming unit connected to said output driver stage for controlling the drive characteristics of said output driver stage.

Claim 41

The input/output buffer circuits as in claim 35 wherein said output driver stage has means for controlling the amount of drive current responsive to said programming unit.

Claim 42

The input/output buffer circuits as in claim 35 wherein said output driver stage has means for controlling the slew rate responsive to said programming unit.

Claim 43

The input/output buffer circuits as in claim 35 wherein said output driver stage has means for controlling the logic state of said output driver stage responsive to said programming unit whereby said output driver stage can operate as an open source or open drain.

Claim 44

The input/output buffer circuits as in claim 35 wherein said signal lines from each output terminal of second storing means are coupled to said programming unit for programming said unit.

Claim 45

The input/output buffer circuits as in claim 39 further comprising a decoding unit connected between said signal lines and said programming unit, said decoding unit generating control signals responsive to signals upon said signal lines for programming said unit.

Claim 46

The input/output buffer circuits as in claim 39 wherein said system logic comprises elements programmable by said signals in said second storing means in said first and second cells.

Claim 47

The input/output buffer circuits as in claim 39 wherein said first and second nodes are in said system logic of said integrated circuit.

Claim 48

The input/output buffer circuits as in claim 42 wherein system logic comprises a field programmable logic array and said first and second nodes have logic states responsive to the programming of said field programmable logic array.