US4857774A
Expired / Lapsed
US
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Testing apparatus and diagnostic method for use with programmable interconnect architecture
Assignee: Microsemi SoC Corp
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Filing: 1988-09-30
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Granted: 1989-08-15
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Expires: 2008-09-30
Abstract
Abstract A user-programmable interconnect architecture, which may be used for logic arrays for digital and analog system design, is disclosed. In one embodiment, a plurality of logic cells or modules in a matrix are connected by vertical and horizontal wiring channels. The wiring channels may in turn be programmed by the user to interconnect the various logic cells to implement the required logic function. The wiring channels comprise wiring segments connected by normally open programmable elements situated at the intersection of any two segments to be connected. Sensing circuitry and wiring may be included to allow 100% observability of internal circuit nodes, such as module outputs, from an external pad interface.
Inventors
- 👤 Khaled A. El-Ayat
- 👤 Abbas El Gamal
- 👤 Amr M. Mohsen
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 20:18
CPC Classifications
H; H03; H03K; H03K19/00; H03K19/02; H03K19/173; H03K19/177; H03K19/17748; H03K19/17764; G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/3185; G01R31/318516; H03K19/17704; H03K19/17724; H03K19/17728; H03K19/17736
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
57 words
In an integrated circuit having a plurality of function modules each having at least one output, circuitry for testing the output states of said modules in real time, comprising: means for selecting an output of any one of said plurality of function modules, means for selectively connecting said output to an input/output pin on said integrated circuit.
Claim 2
Dependent Claim
57 words
In an integrated circuit having a plurality of function modules each having at least one output, circuitry for testing the output states of said modules in real time, comprising: means for selecting an output of any one of said plurality of function modules, means for selectively connecting said output to an input/output pin on said integrated circuit.
Claim 3
Dependent Claim
71 words
In an integrated circuit having a plurality of function modules each having at least one output, a circuit for testing the output state of a selected one of said function modules in real time, comprising; addressing means for selecting any one of said function modules, means, responsive to said addressing means, for connecting the output of said selected one of said function modules to an input/output pin on said integrated circuit.
Claim 4
Dependent Claim
71 words
In an integrated circuit having a plurality of function modules each having at least one output, a circuit for testing the output state of a selected one of said function modules in real time, comprising; addressing means for selecting any one of said function modules, means, responsive to said addressing means, for connecting the output of said selected one of said function modules to an input/output pin on said integrated circuit.
Claim 5
Dependent Claim
128 words
In an integrated circuit having a plurality of function modules, each of said function modules having at least one output, said integrated circuit being programmable by a user such that interconnections between selected ones of said function modules and selected input/output pins on the integrated circuit may be made, said integrated circuit further have two states, a first, unprogrammed, state wherein none of said interconnections have been made, and a second, programmed state in which selected interconnections have been made, circuitry for testing the output states of said modules in real time in said programmed state, comprising: means for selecting an output of any one of said plurality of function modules, means for temporarily selectively connecting said output to one of said input/output pins on said integrated circuit.
Claim 6
Dependent Claim
128 words
In an integrated circuit having a plurality of function modules, each of said function modules having at least one output, said integrated circuit being programmable by a user such that interconnections between selected ones of said function modules and selected input/output pins on the integrated circuit may be made, said integrated circuit further have two states, a first, unprogrammed, state wherein none of said interconnections have been made, and a second, programmed state in which selected interconnections have been made, circuitry for testing the output states of said modules in real time in said programmed state, comprising: means for selecting an output of any one of said plurality of function modules, means for temporarily selectively connecting said output to one of said input/output pins on said integrated circuit.
Claim 7
Dependent Claim
137 words
In an integrated circuit having a plurality of function modules, each of said function modules having at least one output, said integrated circuit being programmable by a user such that interconnections between selected ones of said function modules and selected input/output pins on the integrated circuit may be made, said integrated circuit further have two states, a first, unprogrammed state wherein none of said interconnections have been made, and a second, programmed state in which selected interconnections have been made, circuitry for testing the output states of said modules in real time in said programmed state comprising: addressing means for selecting any one of said function modules, means, responsive to said addressing means, for temporarily connecting the output of said of selected one of said function modules to one of said input/output pins on said integrated circuit.
Claim 8
Dependent Claim
137 words
In an integrated circuit having a plurality of function modules, each of said function modules having at least one output, said integrated circuit being programmable by a user such that interconnections between selected ones of said function modules and selected input/output pins on the integrated circuit may be made, said integrated circuit further have two states, a first, unprogrammed state wherein none of said interconnections have been made, and a second, programmed state in which selected interconnections have been made, circuitry for testing the output states of said modules in real time in said programmed state comprising: addressing means for selecting any one of said function modules, means, responsive to said addressing means, for temporarily connecting the output of said of selected one of said function modules to one of said input/output pins on said integrated circuit.
Claim 9
Dependent Claim
188 words
In an integrated circuit, electrically programmable by the user to configure plurality of function modules thereon, wherein programming circuitry includes a plurality of wiring segments, selected ones of said wiring segments being connected to one another by an electrically programmable elements, selected ones of said wiring segments being connected together by series-pass transistors having control elements, and wherein selected ones of said wiring segments are connected to the inputs and outputs of said function modules, circuitry for testing the functionality of said function modules prior to the programming by the user of said programmable elements, comprising; selection means, connected to the control elements of said series-pass transistors, for selectively creating connections from input/output pins of said integrated circuit to selected inputs of said function modules and for selectively connecting inputs and outputs of selected ones of said function modules to each other, means for selectively connecting the output of a selected function module to an input/output pin of said integrated circuit, and means for selectively connecting at least one input/output pin of said integrated circuit to at least one input of at least one of said function modules.
Claim 10
Dependent Claim
188 words
In an integrated circuit, electrically programmable by the user to configure plurality of function modules thereon, wherein programming circuitry includes a plurality of wiring segments, selected ones of said wiring segments being connected to one another by an electrically programmable elements, selected ones of said wiring segments being connected together by series-pass transistors having control elements, and wherein selected ones of said wiring segments are connected to the inputs and outputs of said function modules, circuitry for testing the functionality of said function modules prior to the programming by the user of said programmable elements, comprising; selection means, connected to the control elements of said series-pass transistors, for selectively creating connections from input/output pins of said integrated circuit to selected inputs of said function modules and for selectively connecting inputs and outputs of selected ones of said function modules to each other, means for selectively connecting the output of a selected function module to an input/output pin of said integrated circuit, and means for selectively connecting at least one input/output pin of said integrated circuit to at least one input of at least one of said function modules.
Claim 11
Dependent Claim
159 words
In an integrated circuit, electrically programmable by the user to configure a plurality of function modules thereon, wherein programming circuitry includes a plurality of wiring segments, selected ones of said wiring segments being connected to one another by electrically programmable elements, selected ones of said wiring segments being connected together by series pass transistors having control elements, and wherein selected ones of said wiring segments are connected to the inputs and outputs of said function modules, circuitry for testing the functionality of said function modules prior to the programming by the user of said programmable elements, comprising: selection means, connected to the control elements of said series-pass transistors, for selectively creating connections from input/output pins of said integrated circuit to selected inputs of said function modules and for selectively connecting inputs and outputs of function modules to each other, and means for selectively connecting the output of a selected function module to an input/output pin of said integrated circuit.
Claim 12
Dependent Claim
159 words
In an integrated circuit, electrically programmable by the user to configure a plurality of function modules thereon, wherein programming circuitry includes a plurality of wiring segments, selected ones of said wiring segments being connected to one another by electrically programmable elements, selected ones of said wiring segments being connected together by series pass transistors having control elements, and wherein selected ones of said wiring segments are connected to the inputs and outputs of said function modules, circuitry for testing the functionality of said function modules prior to the programming by the user of said programmable elements, comprising: selection means, connected to the control elements of said series-pass transistors, for selectively creating connections from input/output pins of said integrated circuit to selected inputs of said function modules and for selectively connecting inputs and outputs of function modules to each other, and means for selectively connecting the output of a selected function module to an input/output pin of said integrated circuit.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-08-14 | 1993-02-13 | 1993-08-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-08-14 | 1997-02-13 | 1997-08-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-08-14 | 2001-02-13 | 2001-08-15 | $7700.00 | Window Closed / Lapsed |