Patent US5214002A successfully refreshed from Google Patents.
US5214002A
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Process for depositing a thermal CVD film of Si or Ge using a hydrogen post-treatment step and an optional hydrogen pre-treatment step
Assignee: National Institute of Advanced Industrial Science and Technology
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Filing: 1991-12-03
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Granted: 1993-05-25
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Expires: 2011-12-03
Abstract
Abstract A process for depositing a thin semiconductor film includes the steps of depositing a thin film on a substrate by feeding onto the surface of the substrate being heated a gaseous starting material containing a constituent element of the thin film, and feeding excited hydrogen to the thin film without exposing the thin film to the ambient air. Disilane was fed together with hydrogen carrier gas onto a quartz substrate to deposit thereon a thin amorphous silicon film, to which excited hydrogen from a hydrogen plasma was then fed to modify the deposited thin silicon film. As a result, the photoconductivity of the thin silicon film was improved.
Inventors
- 👤 Yutaka Hayashi
- 👤 Mitsuyuki Yamanaka
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 14:38
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/24; H10F; H10F71/00; H10F71/10; H10F71/103; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/2921; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P95/00; H10P95/90; Y; Y02; Y02E; Y02E10/00; Y02E10/50; Y02P; Y02P70/00; Y02P70/50
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
118 words
In a thermal CVD process for depositing a thin semiconductor film, the improvement comprising, in the order recited, the steps of: a. depositing a thin film comprised of a semiconductive material and having a thickness which does not exceed about 300 Å on a substrate which is heated by feeding to the surface of the substrate a gaseous starting material selected from the group consisting of silane gases, alkyl silane gases and germanium hydride gases; b. stopping the feeding of the gaseous starting material; c. feeding excited hydrogen to the thin film without exposing the thin film to ambient air; d. stopping the feeding of the excited hydrogen; and e. repeating steps (a) through (d) at least once.
Claim 2
Dependent Claim
118 words
In a thermal CVD process for depositing a thin semiconductor film, the improvement comprising, in the order recited, the steps of: a. depositing a thin film comprised of a semiconductive material and having a thickness which does not exceed about 300 Å on a substrate which is heated by feeding to the surface of the substrate a gaseous starting material selected from the group consisting of silane gases, alkyl silane gases and germanium hydride gases; b. stopping the feeding of the gaseous starting material; c. feeding excited hydrogen to the thin film without exposing the thin film to ambient air; d. stopping the feeding of the excited hydrogen; and e. repeating steps (a) through (d) at least once.
Claim 3
Dependent Claim
33 words
The process for depositing a thin semiconductor film as claimed in claim 1, wherein the gaseous starting material is a silane gas and wherein the thin film is a thin amorphous silicon film.
Claim 4
Dependent Claim
32 words
The process for depositing a thin semiconductor film as claimed in claim 2, wherein the gaseous starting material is fed in step (a) together with non-excited hydrogen gas as a carrier gas.
Claim 5
Dependent Claim
33 words
The process for depositing a thin semiconductor film as claimed in claim 1, wherein the gaseous starting material is comprised of at least one alkyl silane and wherein the thin film contains carbon.
Claim 6
Dependent Claim
33 words
The process for depositing a thin semiconductor film as claimed in claim 1, wherein the gaseous starting material is a germanium hydride gas and wherein the thin film is a thin germanium film.
Claim 7
Dependent Claim
29 words
The process for depositing a thin semiconductor film as claimed in claim 5, wherein the germanium hydride gas is fed together with non-excited hydrogen gas as a carrier gas.
Claim 8
Dependent Claim
39 words
The process for depositing a thin semiconductor film as claimed in claim 1, wherein the excited hydrogen of step (c) is supplied from a hydrogen plasma formed by discharge in a reaction chamber in which the substrate is placed.
Claim 9
Dependent Claim
27 words
The process for depositing a thin semiconductor film as claimed in claim 1, wherein the excited hydrogen of step (c) is generated by plasma discharge of hydrogen.
Claim 10
Dependent Claim
28 words
The process for depositing a thin semiconductor film as claimed in claim 1, wherein the excited hydrogen of step (c) is generated by irradiating ultraviolet light onto hydrogen.
Claim 11
Dependent Claim
27 words
The process for depositing a thin semiconductor film as claimed in claim 1, wherein the excited hydrogen of step (c) is generated by irradiating x-rays onto hydrogen.
Claim 12
Dependent Claim
29 words
The process for depositing a thin semiconductor film as claimed in claim 1, wherein the excited hydrogen of step (c) is generated by irradiating an electron beam onto hydrogen.
Claim 13
Dependent Claim
28 words
The process for depositing a thin semiconductor film as claimed in claim 1, wherein the excited hydrogen of step (c) is generated by mixing excited mercury with hydrogen.
Claim 14
Dependent Claim
27 words
The process for depositing a thin semiconductor film as claimed in claim 1, wherein the substrate is heated to a temperature which does not exceed 450° C.
Claim 15
Dependent Claim
46 words
The process for depositing a thin semiconductor film as claimed in claim 1, further comprising the steps of feeding excited hydrogen to the substrate before thin film deposition in step (a) and stopping the feeding of the excited hydrogen before thin film deposition in step (a).
Claim 16
Dependent Claim
117 words
In a thermal CVD process for depositing a thin semiconductor film, the improvement comprising, in the order recited, the steps of: a. feeding excited hydrogen to a substrate which is heated; b. stopping said feeding of the excited hydrogen; c. depositing a thin film comprised of a semiconductive material and having a thickness which does not exceed about 300 Å on a substrate by feeding to the surface of the heated substrate a gaseous starting material selected from the group consisting of silane gases, alkyl silane gases and germanium hydride gases without exposing the substrate to ambient air; d. stopping the feeding of the gaseous starting material; and e. repeating steps (a) through (d) at least once.
Claim 17
Dependent Claim
117 words
In a thermal CVD process for depositing a thin semiconductor film, the improvement comprising, in the order recited, the steps of: a. feeding excited hydrogen to a substrate which is heated; b. stopping said feeding of the excited hydrogen; c. depositing a thin film comprised of a semiconductive material and having a thickness which does not exceed about 300 Å on a substrate by feeding to the surface of the heated substrate a gaseous starting material selected from the group consisting of silane gases, alkyl silane gases and germanium hydride gases without exposing the substrate to ambient air; d. stopping the feeding of the gaseous starting material; and e. repeating steps (a) through (d) at least once.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1996-05-24 | 1996-11-23 | 1997-05-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-05-24 | 2000-11-23 | 2001-05-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-05-24 | 2004-11-23 | 2005-05-25 | $7700.00 | Window Closed / Lapsed |