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US5200805A Expired / Lapsed US ⏱️ 0.0 years remaining

Silicon carbide:metal carbide alloy semiconductor and method of making the same

Assignee: Raytheon Co
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Filing: 1987-12-28
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Granted: 1993-04-06
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Expires: 2007-12-28
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Abstract

Abstract A new type of semiconductor material is disclosed which consists of a β-SiC:metal carbide alloy having the general formula Si w (metal 1) x (metal 2) y (metal 3) z C, where w+x+y+z=1 and 1>w>0. The metals are selected from the group consisting of Ti, Hf, Zr, V, Ta, Mo, W and Nb, with Ti, Hf, and Zr preferred. By selecting appropriate proportions of metal carbide and SiC, the alloy's bandgap may be tailored to any desired level between the bandgaps of the metal carbide and SiC. Semiconductor devices are preferably formed by epitaxially growing a layer of the new alloy upon a substrate having a β-SiC or TiC type crystal structure. In addition to retaining the benefits of single-bandgap β-SiC with certain advantages, the new alloys make it possible to implement various electrical devices that cannot be achieved with β-SiC, and also have a potential for bandfolded superlattices for infrared detectors and lasers.

Inventors

  • 👤 James D. Parsons
  • 👤 Oscar Stafsudd

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 15:24
CPC Classifications
H; H10; H10H; H10H20/00; H10H20/80; H10H20/81; H10H20/822; H10H20/826; H10D; H10D62/00; H10D62/80; H10D62/83; H10D62/832; H10D62/8325; H10F; H10F77/00; H10F77/10; H10F77/12; H10F77/122; H10F77/1226; H10P; H10P14/00; H10P14/20; H10P14/29; H10P14/2901; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3408

Claims Analysis

Total Claims: 21
Claim 1
Independent Claim 49 words
A semiconductor material comprising a metal carbide: β-SiC alloy with a homogeneous single phase cubic crystal structure and having the formula Si w (metal 1) x (metal 2) y (metal 3) z C, where w+x+y+z=1, 1>w>0 and said metals have lattice parameters within about 5% of that of β-SiC.
Claim 2
Dependent Claim 49 words
A semiconductor material comprising a metal carbide: β-SiC alloy with a homogeneous single phase cubic crystal structure and having the formula Si w (metal 1) x (metal 2) y (metal 3) z C, where w+x+y+z=1, 1>w>0 and said metals have lattice parameters within about 5% of that of β-SiC.
Claim 3
Dependent Claim 29 words
The semiconductor material of claim 1, in which metals 1, 2 and 3 are each selected from the following metals: Ti, Hf, Zr, V, Ta, Mo, W and Nb.
Claim 4
Dependent Claim 24 words
The semiconductor material of claim 2, in which metals 1, 2 and 3 are each selected from the following metals: Ti, Hf and Zr.
Claim 5
Dependent Claim 8 words
The semiconductor material of claim 1, wherein y=z=0.
Claim 6
Dependent Claim 25 words
The semiconductor material of claim 4, in which metal 1 is selected from the following metals: Ti, Hf, Zr, V, Ta, Mo, W and Nb.
Claim 7
Dependent Claim 20 words
The semiconductor material of claim 5, in which metal 1 is selected from the following metals: Ti, Hf and Zr.
Claim 8
Dependent Claim 17 words
The semiconductor material of claim 1, wherein said material has a β-SiC or TiC type crystal structure.
Claim 9
Dependent Claim 40 words
The semiconductor material of claim 1, wherein the relative proportions of metal carbide and β-SiC in said alloy are selected to yield a bandgap energy level for the alloy between the bandgap energy levels of the metal carbide and SiC.
Claim 10
Dependent Claim 74 words
A semiconductor material comprising an alloy of β-SiC and at least one metal, said alloy having a homogeneous single phase cubic crystal structure, the metal being selected so that the metal-carbon bonds in the alloy are predominantly covalent, only electrons in the outermost orbitals of the outermost electron shell contribute to bonding, only the outermost d orbital electrons are available for conduction, and its lattice parameters are within about 5% of that of β-SiC.
Claim 11
Dependent Claim 74 words
A semiconductor material comprising an alloy of β-SiC and at least one metal, said alloy having a homogeneous single phase cubic crystal structure, the metal being selected so that the metal-carbon bonds in the alloy are predominantly covalent, only electrons in the outermost orbitals of the outermost electron shell contribute to bonding, only the outermost d orbital electrons are available for conduction, and its lattice parameters are within about 5% of that of β-SiC.
Claim 12
Dependent Claim 19 words
The semiconductor material of claim 9, said metal being selected from the group consisting of Ti, Hf and Zr.
Claim 13
Dependent Claim 90 words
An electrical semiconductor device, comprising: a chemically stable, lattice matching substrate, an epitaxial semiconductor layer on the substrate having a homogeneous single phase β-SiC or TiC type crystal structure, said layer formed from a semiconductor material which comprises a metal-carbide SiC alloy having the formula Si w (metal 1) x (metal 2) y (metal 3) z C, where w+x+y+z=1, 1>w>0 and said metal have lattice parameters within about 5% of that of β-SiC, and an electric circuit device formed upon and incorporating at least a portion of said semiconductor layer.
Claim 14
Dependent Claim 90 words
An electrical semiconductor device, comprising: a chemically stable, lattice matching substrate, an epitaxial semiconductor layer on the substrate having a homogeneous single phase β-SiC or TiC type crystal structure, said layer formed from a semiconductor material which comprises a metal-carbide SiC alloy having the formula Si w (metal 1) x (metal 2) y (metal 3) z C, where w+x+y+z=1, 1>w>0 and said metal have lattice parameters within about 5% of that of β-SiC, and an electric circuit device formed upon and incorporating at least a portion of said semiconductor layer.
Claim 15
Dependent Claim 29 words
The semiconductor device of claim 11, in which metals 1, 2 and 3 are each selected from the following metals: Ti, Hf, Zr, V, Ta, Mo, W and Nb.
Claim 16
Dependent Claim 24 words
The semiconductor device of claim 12, in which metals 1, 2 and 3 are each selected from the following metals: Ti, Hf and Zr.
Claim 17
Dependent Claim 8 words
The semiconductor device of claim 11, wherein y=z=0.
Claim 18
Dependent Claim 25 words
The semiconductor device of claim 14, in which metal 1 is selected from the following metals: Ti, Hf, Zr, V, Ta, Mo, W and Nb.
Claim 19
Dependent Claim 20 words
The semiconductor device of claim 15, in which metal 1 is selected from the following metals: Ti, Hf and Zr.
Claim 20
Dependent Claim 14 words
The semiconductor device of claim 11, wherein said substrate comprises a single crystal TiC.
Claim 21
Dependent Claim 40 words
The semiconductor device of claim 11, wherein the relative proportions of metal carbide and SiC in said alloy are selected to yield a bandgap energy level for the alloy between the bandgap energy levels of the metal carbide and SiC.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-04-05 1996-10-05 1997-04-06 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-04-05 2000-10-05 2001-04-06 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-04-05 2004-10-05 2005-04-06 $7700.00 Window Closed / Lapsed

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